Inficon, LLC

Organization

East Syracuse, NY, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Wide range electron impact ion source for a mass spectrometer
- Patent number 12,106,953
- Issue date Oct 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer assembly with a secondary flange
- Patent number 11,875,984
- Issue date Jan 16, 2024
- Inficon, Inc.
- Mario Weder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for displaying concentration data of a substance and an asso...
- Patent number 11,841,354
- Issue date Dec 12, 2023
- Inficon, Inc.
- Elliot Gerard
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting radicals using mass spectrometry
- Patent number 11,784,031
- Issue date Oct 10, 2023
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source assembly with multiple ionization volumes for use in a m...
- Patent number 11,658,020
- Issue date May 23, 2023
- Inficon, Inc.
- Michael F. Vollero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor package
- Patent number D978662
- Issue date Feb 21, 2023
- Inficon, Inc.
- Joel Plasencia
- D09 - Packages and containers for goods
Information Patent Grant
Gas analyzer and membranes therefor
- Patent number 11,569,079
- Issue date Jan 31, 2023
- Inficon, Inc.
- Shawn M. Briglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unconsumed precursor monitoring
- Patent number 11,335,575
- Issue date May 17, 2022
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical analysis device and method
- Patent number 11,282,687
- Issue date Mar 22, 2022
- Inficon, Inc.
- Kenneth C. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process monitoring using crystal with reactance sensor
- Patent number 11,175,323
- Issue date Nov 16, 2021
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical analyzer with membrane
- Patent number 10,985,000
- Issue date Apr 20, 2021
- Inficon, Inc.
- Kenneth Charles Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical analysis device and method
- Patent number 10,755,909
- Issue date Aug 25, 2020
- Inficon, Inc.
- Kenneth C. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring thin film deposition
- Patent number 10,704,150
- Issue date Jul 7, 2020
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Creating a mini environment for gas analysis
- Patent number 10,502,651
- Issue date Dec 10, 2019
- Inficon, Inc.
- Chenglong Yang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for optimal chemical analysis
- Patent number 10,175,198
- Issue date Jan 8, 2019
- Inficon, Inc.
- Shawn Michael Briglin
- G01 - MEASURING TESTING
Information Patent Grant
Process gas management system and photoionization detector
- Patent number 10,047,437
- Issue date Aug 14, 2018
- Inficon, Inc.
- Michael F. Vollero
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Vacuum chamber measurement using residual gas analyzer
- Patent number 9,645,125
- Issue date May 9, 2017
- Inficon, Inc.
- Chenglong Yang
- G01 - MEASURING TESTING
Information Patent Grant
Combined crystal retainer and contact system for deposition monitor...
- Patent number 9,506,895
- Issue date Nov 29, 2016
- Inficon, Inc.
- Carl A. Gogol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-chambered acoustic sensor for determination gas composition
- Patent number 9,217,663
- Issue date Dec 22, 2015
- Inficon, Inc.
- Abdul Wajid
- G01 - MEASURING TESTING
Information Patent Grant
High capacity monitor crystal exchanger utilizing an organized 3-D...
- Patent number 9,182,378
- Issue date Nov 10, 2015
- Inficon, Inc.
- Carl A. Gogol
- G01 - MEASURING TESTING
Information Patent Grant
Dual-detection residual gas analyzer
- Patent number 8,916,822
- Issue date Dec 23, 2014
- Inficon, Inc.
- Kenneth Charles Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining multilayer thin film deposition on a piezoele...
- Patent number 8,438,924
- Issue date May 14, 2013
- Inficon, Inc.
- Abdul Wajid
- G01 - MEASURING TESTING
Information Patent Grant
Portable light emitting sampling probe
- Patent number 8,193,487
- Issue date Jun 5, 2012
- Inficon, Inc.
- Shawn Briglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF sensor clamp assembly
- Patent number 7,821,250
- Issue date Oct 26, 2010
- Inficon, Inc.
- Terry A. Turner
- G01 - MEASURING TESTING
Information Patent Grant
RF sensor clamp assembly
- Patent number 7,728,250
- Issue date Jun 1, 2010
- Inficon, Inc.
- Terry R. Turner
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring vapor flux density
- Patent number 7,719,681
- Issue date May 18, 2010
- Inficon
- Chih-shun Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High performance miniature RF sensor for use in microelectronics pl...
- Patent number 7,538,562
- Issue date May 26, 2009
- Inficon, Inc.
- Craig Garvin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inter-process sensing of wafer outcome
- Patent number 7,257,494
- Issue date Aug 14, 2007
- Inficon, Inc.
- William T. Conner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Replaceable anode liner for ion source
- Patent number 7,041,984
- Issue date May 9, 2006
- Inficon, Inc.
- Robert E. Ellefson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package for storing sensor crystals and related method of use
- Patent number 6,991,110
- Issue date Jan 31, 2006
- Inficon, Inc.
- Robert F. Flynn
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS
- Publication number 20240363325
- Publication date Oct 31, 2024
- Inficon, Inc.
- Michael Vollero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUARTZ CRYSTAL MICROBALANCE (QCM) SENSOR HAVING RAPID REGISTRATION...
- Publication number 20240329001
- Publication date Oct 3, 2024
- Inficon, Inc.
- David Y. Lee
- G01 - MEASURING TESTING
Information Patent Application
UPSTREAM PROCESS MONITORING FOR DEPOSITION AND ETCH CHAMBERS
- Publication number 20240312812
- Publication date Sep 19, 2024
- Inficon, Inc.
- Matan Lapidot
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
A SYSTEM AND METHOD FOR MASS FLOW MEASUREMENT AND CONTROL OF PROCES...
- Publication number 20240263313
- Publication date Aug 8, 2024
- Inficon, Inc.
- Steve Lakeman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF OPTIMIZING EQUIPMENT MAINTENANCE AND ASSOCIATED SYSTEM
- Publication number 20240242141
- Publication date Jul 18, 2024
- Inficon, Inc.
- Jeff Chihfeng Chien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DECONVOLUTION OF REAL-TIME MASS FROM THE INFL...
- Publication number 20240241083
- Publication date Jul 18, 2024
- Inficon, Inc.
- Chunhua Song
- G01 - MEASURING TESTING
Information Patent Application
SEALING SYSTEM FOR COMPONENTS OF A GAS ANALYZER
- Publication number 20240183446
- Publication date Jun 6, 2024
- Inficon, Inc.
- Kenneth Charles Wright
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Throttling Element Particle Detector
- Publication number 20240159641
- Publication date May 16, 2024
- Inficon, LLC
- Shawn Briglin
- G01 - MEASURING TESTING
Information Patent Application
ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...
- Publication number 20240153753
- Publication date May 9, 2024
- Inficon Inc.
- Nigel Sousou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISPLAYING CONCENTRATION DATA OF A SUBSTANCE AND AN ASSO...
- Publication number 20240102982
- Publication date Mar 28, 2024
- INFICON, Inc.
- Elliot Gerard
- G01 - MEASURING TESTING
Information Patent Application
HTCC ANTENNA FOR GENERATION OF MICROPLASMA
- Publication number 20240047178
- Publication date Feb 8, 2024
- Inficon, Inc.
- Shawn Briglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER
- Publication number 20240038522
- Publication date Feb 1, 2024
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING RADICALS USING MASS SPECTROMETRY
- Publication number 20230215711
- Publication date Jul 6, 2023
- Inficon, Inc.
- Norbert Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER ASSEMBLY WITH A SECONDARY FLANGE
- Publication number 20230215718
- Publication date Jul 6, 2023
- Inficon, Inc.
- Mario Weder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING SEMICONDUCTOR PROCESSES
- Publication number 20230135167
- Publication date May 4, 2023
- Inficon Inc.
- Matan Lapidot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNCONSUMED PRECURSOR MONITORING
- Publication number 20220285184
- Publication date Sep 8, 2022
- Inficon, Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION SOURCE ASSEMBLY WITH MULTIPLE IONIZATION VOLUMES FOR USE IN A M...
- Publication number 20220165559
- Publication date May 26, 2022
- Inficon, Inc.
- Michael F. Vollero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS ANALYZER AND MEMBRANES THEREFOR
- Publication number 20210319992
- Publication date Oct 14, 2021
- Inficon, Inc.
- Shawn M. Briglin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL ANALYSIS DEVICE AND METHOD
- Publication number 20200381234
- Publication date Dec 3, 2020
- Inficon, Inc.
- Kenneth C. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20200325580
- Publication date Oct 15, 2020
- Inficon, Inc.
- Mohamed B. Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
UNCONSUMED PRECURSOR MONITORING
- Publication number 20200176291
- Publication date Jun 4, 2020
- Inficon Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CHEMICAL ANALYSIS DEVICE AND METHOD
- Publication number 20190348267
- Publication date Nov 14, 2019
- Inficon, Inc.
- Kenneth C. Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS MONITORING USING CRYSTAL WITH REACTANCE SENSOR
- Publication number 20180267086
- Publication date Sep 20, 2018
- Inficon, Inc.
- Mohamed Buhary Rinzan
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYZER WITH MEMBRANE
- Publication number 20180197727
- Publication date Jul 12, 2018
- Inficon, Inc.
- Kenneth Charles Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREATING A MINI ENVIRONMENT FOR GAS ANALYSIS
- Publication number 20170097273
- Publication date Apr 6, 2017
- Inficon, Inc.
- Chenglong Yang
- G01 - MEASURING TESTING
Information Patent Application
PROCESS GAS MANAGEMENT SYSTEM AND PHOTOIONIZATION DETECTOR
- Publication number 20160362787
- Publication date Dec 15, 2016
- Inficon, Inc.
- Michael F. Vollero
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MONITORING OPERATION OF A REACTION CHAMBER
- Publication number 20160258844
- Publication date Sep 8, 2016
- Inficon, Inc.
- William Tuttle Conner
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYZER WITH MEMBRANE
- Publication number 20160225597
- Publication date Aug 4, 2016
- Inficon Inc.
- Kenneth Charles WRIGHT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING THIN FILM DEPOSITION
- Publication number 20160215397
- Publication date Jul 28, 2016
- Inficon Inc.
- Mohamed Buhary Rinzan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMBINED CRYSTAL RETAINER AND CONTACT SYSTEM FOR DEPOSITION MONITOR...
- Publication number 20140340098
- Publication date Nov 20, 2014
- Inficon, Inc.
- Carl A. Gogol
- G01 - MEASURING TESTING

Inficon, LLC

Organization

Patents Grantslast 30 patents

Wide range electron impact ion source for a mass spectrometer

Time-of-flight mass spectrometer assembly with a secondary flange

Method for displaying concentration data of a substance and an asso...

Method of detecting radicals using mass spectrometry

Ion source assembly with multiple ionization volumes for use in a m...

Sensor package

Gas analyzer and membranes therefor

Unconsumed precursor monitoring

Chemical analysis device and method

Process monitoring using crystal with reactance sensor

Chemical analyzer with membrane

Chemical analysis device and method

Monitoring thin film deposition

Creating a mini environment for gas analysis

System and method for optimal chemical analysis

Process gas management system and photoionization detector

Vacuum chamber measurement using residual gas analyzer

Combined crystal retainer and contact system for deposition monitor...

Multi-chambered acoustic sensor for determination gas composition

High capacity monitor crystal exchanger utilizing an organized 3-D...

Dual-detection residual gas analyzer

Method of determining multilayer thin film deposition on a piezoele...

Portable light emitting sampling probe

RF sensor clamp assembly

RF sensor clamp assembly

Apparatus and method for measuring vapor flux density

High performance miniature RF sensor for use in microelectronics pl...

Inter-process sensing of wafer outcome

Replaceable anode liner for ion source

Package for storing sensor crystals and related method of use

Patents Applicationslast 30 patents

ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS

QUARTZ CRYSTAL MICROBALANCE (QCM) SENSOR HAVING RAPID REGISTRATION...

UPSTREAM PROCESS MONITORING FOR DEPOSITION AND ETCH CHAMBERS

A SYSTEM AND METHOD FOR MASS FLOW MEASUREMENT AND CONTROL OF PROCES...

METHOD OF OPTIMIZING EQUIPMENT MAINTENANCE AND ASSOCIATED SYSTEM

SYSTEM AND METHOD FOR DECONVOLUTION OF REAL-TIME MASS FROM THE INFL...

SEALING SYSTEM FOR COMPONENTS OF A GAS ANALYZER

Throttling Element Particle Detector

ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION M...

METHOD FOR DISPLAYING CONCENTRATION DATA OF A SUBSTANCE AND AN ASSO...

HTCC ANTENNA FOR GENERATION OF MICROPLASMA

WIDE RANGE ELECTRON IMPACT ION SOURCE FOR A MASS SPECTROMETER

METHOD OF DETECTING RADICALS USING MASS SPECTROMETRY

TIME-OF-FLIGHT MASS SPECTROMETER ASSEMBLY WITH A SECONDARY FLANGE

SYSTEM AND METHOD FOR MONITORING SEMICONDUCTOR PROCESSES

UNCONSUMED PRECURSOR MONITORING

ION SOURCE ASSEMBLY WITH MULTIPLE IONIZATION VOLUMES FOR USE IN A M...

GAS ANALYZER AND MEMBRANES THEREFOR

CHEMICAL ANALYSIS DEVICE AND METHOD

MONITORING THIN FILM DEPOSITION

UNCONSUMED PRECURSOR MONITORING

CHEMICAL ANALYSIS DEVICE AND METHOD

PROCESS MONITORING USING CRYSTAL WITH REACTANCE SENSOR

CHEMICAL ANALYZER WITH MEMBRANE

CREATING A MINI ENVIRONMENT FOR GAS ANALYSIS

PROCESS GAS MANAGEMENT SYSTEM AND PHOTOIONIZATION DETECTOR

MONITORING OPERATION OF A REACTION CHAMBER

CHEMICAL ANALYZER WITH MEMBRANE

MONITORING THIN FILM DEPOSITION

COMBINED CRYSTAL RETAINER AND CONTACT SYSTEM FOR DEPOSITION MONITOR...