Infinitum Solutions, Inc.

Organization

Santa Clara, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Testing magnetoresistive random access memory for low likelihood fa...
- Patent number 11,482,295
- Issue date Oct 25, 2022
- Infinitum Solutions, Inc.
- Wade Ogle
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated optical nanoscale probe
- Patent number 9,978,407
- Issue date May 22, 2018
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated optical nanoscale probe
- Patent number 9,779,769
- Issue date Oct 3, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated optical nanoscale probe measurement of electric fields f...
- Patent number 9,778,329
- Issue date Oct 3, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Read sensor testing using thermal magnetic fluctuation noise spectra
- Patent number 9,548,083
- Issue date Jan 17, 2017
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Grant
Photon emitter characterization using photoluminescence quenching i...
- Patent number 9,482,612
- Issue date Nov 1, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic write head characterization with nano-meter resolution usi...
- Patent number 9,472,217
- Issue date Oct 18, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Spectral noise analysis for read head structures
- Patent number 9,263,069
- Issue date Feb 16, 2016
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Grant
Write head tester using inductance
- Patent number 9,245,550
- Issue date Jan 26, 2016
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Grant
Metrology for contactless measurement of electrical resistance chan...
- Patent number 9,194,908
- Issue date Nov 24, 2015
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Grant
Write head tester using inductance
- Patent number 9,135,934
- Issue date Sep 15, 2015
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic write head characterization with nano-meter resolution usi...
- Patent number 8,885,301
- Issue date Nov 11, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Magneto-optical detection of a field produced by a sub-resolution m...
- Patent number 8,659,291
- Issue date Feb 25, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing flex and APFA assemblies for hard disk drives
- Patent number 8,536,875
- Issue date Sep 17, 2013
- Infinitum Solutions, Inc.
- Wade A. Ogle
- G11 - INFORMATION STORAGE
Information Patent Grant
Sub-optical-resolution kerr signal detection for perpendicular writ...
- Patent number 8,427,929
- Issue date Apr 23, 2013
- Infinitum Solutions, Inc.
- Henry Patland
- G11 - INFORMATION STORAGE
Information Patent Grant
Magneto-optic write-head characterization using the recording mediu...
- Patent number 8,289,818
- Issue date Oct 16, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Write head tester using inductance
- Patent number 8,080,992
- Issue date Dec 20, 2011
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Grant
Closed loop magnet control for magnetic recording head testing appa...
- Patent number 7,550,967
- Issue date Jun 23, 2009
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING
Information Patent Grant
In-plane magnetic field generation and testing of magnetic sensor
- Patent number 7,538,546
- Issue date May 26, 2009
- Infinitum Solutions, Inc.
- Henry Patland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive element lifecycle tester with temperature control
- Patent number 7,230,420
- Issue date Jun 12, 2007
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic head tester
- Patent number 6,943,545
- Issue date Sep 13, 2005
- Infinitum Solutions, Inc.
- Henry Patland
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive element lifecycle tester
- Patent number 6,943,546
- Issue date Sep 13, 2005
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING MAGNETORESISTIVE RANDOM ACCESS MEMORY FOR LOW LIKELIHOOD FA...
- Publication number 20220101937
- Publication date Mar 31, 2022
- Infinitum Solutions, Inc.
- Wade Ogle
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE
- Publication number 20170316795
- Publication date Nov 2, 2017
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE MEASUREMENT OF ELECTRIC FIELDS F...
- Publication number 20160282427
- Publication date Sep 29, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
PHOTON EMITTER CHARACTERIZATION USING PHOTOLUMINESCENCE QUENCHING I...
- Publication number 20160139048
- Publication date May 19, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED OPTICAL NANOSCALE PROBE
- Publication number 20160077167
- Publication date Mar 17, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...
- Publication number 20160071532
- Publication date Mar 10, 2016
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...
- Publication number 20150235661
- Publication date Aug 20, 2015
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTICAL DETECTION OF A FIELD PRODUCED BY A SUB-RESOLUTION M...
- Publication number 20140133284
- Publication date May 15, 2014
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G02 - OPTICS
Information Patent Application
SPECTRAL NOISE ANALYSIS FOR READ HEAD STRUCTURES
- Publication number 20130294210
- Publication date Nov 7, 2013
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Application
METROLOGY FOR CONTACTLESS MEASUREMENT OF ELECTRICAL RESISTANCE CHAN...
- Publication number 20130257461
- Publication date Oct 3, 2013
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
MAGNETO-OPTIC WRITE-HEAD CHARACTERIZATION USING THE RECORDING MEDIU...
- Publication number 20120092972
- Publication date Apr 19, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G02 - OPTICS
Information Patent Application
WRITE HEAD TESTER USING INDUCTANCE
- Publication number 20120056618
- Publication date Mar 8, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Application
WRITE HEAD TESTER USING INDUCTANCE
- Publication number 20120056619
- Publication date Mar 8, 2012
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Application
SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...
- Publication number 20120057446
- Publication date Mar 8, 2012
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING
Information Patent Application
TESTING FLEX AND APFA ASSEMBLIES FOR HARD DISK DRIVES
- Publication number 20110095766
- Publication date Apr 28, 2011
- Infinitum Solutions, Inc.
- Wade A. Ogle.
- G11 - INFORMATION STORAGE
Information Patent Application
Magneto-Optical Detection of a Field Produced by a Sub-Resolution M...
- Publication number 20100170017
- Publication date Jul 1, 2010
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G02 - OPTICS
Information Patent Application
Determining A Magnetic Sample Characteristic Using A Magnetic Field...
- Publication number 20100079908
- Publication date Apr 1, 2010
- Infinitum Solutions, Inc.
- Juergen Heidmann
- G01 - MEASURING TESTING
Information Patent Application
Read sensor testing using thermal magnetic fluctuation noise spectra
- Publication number 20090147389
- Publication date Jun 11, 2009
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Application
Write Head Tester Using Inductance
- Publication number 20090128941
- Publication date May 21, 2009
- Infinitum Solutions, Inc.
- Alexander M. Taratorin
- G11 - INFORMATION STORAGE
Information Patent Application
In-Plane Magnetic Field Generation
- Publication number 20080111544
- Publication date May 15, 2008
- Infinitum Solutions, Inc.
- Henry Patland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetoresistive element lifecycle tester with temperature control
- Publication number 20050258827
- Publication date Nov 24, 2005
- Infinitum Solutions, Inc.
- Henry Patland
- G01 - MEASURING TESTING

Infinitum Solutions, Inc.

Organization

Patents Grantslast 30 patents

Testing magnetoresistive random access memory for low likelihood fa...

Integrated optical nanoscale probe

Integrated optical nanoscale probe

Integrated optical nanoscale probe measurement of electric fields f...

Read sensor testing using thermal magnetic fluctuation noise spectra

Photon emitter characterization using photoluminescence quenching i...

Magnetic write head characterization with nano-meter resolution usi...

Spectral noise analysis for read head structures

Write head tester using inductance

Metrology for contactless measurement of electrical resistance chan...

Write head tester using inductance

Magnetic write head characterization with nano-meter resolution usi...

Magneto-optical detection of a field produced by a sub-resolution m...

Testing flex and APFA assemblies for hard disk drives

Sub-optical-resolution kerr signal detection for perpendicular writ...

Magneto-optic write-head characterization using the recording mediu...

Write head tester using inductance

Closed loop magnet control for magnetic recording head testing appa...

In-plane magnetic field generation and testing of magnetic sensor

Magnetoresistive element lifecycle tester with temperature control

Magnetic head tester

Magnetoresistive element lifecycle tester

Patents Applicationslast 30 patents

TESTING MAGNETORESISTIVE RANDOM ACCESS MEMORY FOR LOW LIKELIHOOD FA...

INTEGRATED OPTICAL NANOSCALE PROBE

INTEGRATED OPTICAL NANOSCALE PROBE MEASUREMENT OF ELECTRIC FIELDS F...

PHOTON EMITTER CHARACTERIZATION USING PHOTOLUMINESCENCE QUENCHING I...

INTEGRATED OPTICAL NANOSCALE PROBE

MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...

MAGNETIC WRITE HEAD CHARACTERIZATION WITH NANO-METER RESOLUTION USI...

MAGNETO-OPTICAL DETECTION OF A FIELD PRODUCED BY A SUB-RESOLUTION M...

SPECTRAL NOISE ANALYSIS FOR READ HEAD STRUCTURES

METROLOGY FOR CONTACTLESS MEASUREMENT OF ELECTRICAL RESISTANCE CHAN...

MAGNETO-OPTIC WRITE-HEAD CHARACTERIZATION USING THE RECORDING MEDIU...

WRITE HEAD TESTER USING INDUCTANCE

WRITE HEAD TESTER USING INDUCTANCE

SUB-OPTICAL-RESOLUTION KERR SIGNAL DETECTION FOR PERPENDICULAR WRIT...

TESTING FLEX AND APFA ASSEMBLIES FOR HARD DISK DRIVES

Magneto-Optical Detection of a Field Produced by a Sub-Resolution M...

Determining A Magnetic Sample Characteristic Using A Magnetic Field...

Read sensor testing using thermal magnetic fluctuation noise spectra

Write Head Tester Using Inductance

In-Plane Magnetic Field Generation

Magnetoresistive element lifecycle tester with temperature control

Trademarklast 30 trademarks