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INSPEX INCORPORATED
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WALTHAM, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
Patent number
6,774,991
Issue date
Aug 10, 2004
Inspex Incorporated
Joseph J. Danko
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for reviewing a semiconductor wafer using at leas...
Patent number
6,643,006
Issue date
Nov 4, 2003
Inspex, Inc.
Chin-Jung Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
Patent number
6,621,570
Issue date
Sep 16, 2003
Inspex Incorporated
Joseph J. Danko
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting a semiconductor wafer using a d...
Patent number
6,097,428
Issue date
Aug 1, 2000
Inspex, Inc.
Wo-Tak Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for establishing a common reference point on a se...
Patent number
6,028,664
Issue date
Feb 22, 2000
Inspex, Inc.
Arnold Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
5,805,278
Issue date
Sep 8, 1998
Inspex, Inc.
Joseph J. Danko
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Adjustable fourier mask
Patent number
5,742,422
Issue date
Apr 21, 1998
Inspex, Inc.
Steven R. Drake
G02 - OPTICS
Information
Patent Grant
Robot system
Patent number
5,667,353
Issue date
Sep 16, 1997
Inspex Inc.
Steven R. Drake
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Method and apparatus for detecting particles on a surface of a semi...
Patent number
5,659,390
Issue date
Aug 19, 1997
Inspex, Inc.
Joseph J. Danko
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Particle detection method and apparatus
Patent number
5,317,380
Issue date
May 31, 1994
Inspex, Inc.
Charly D. Allemand
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
4,895,446
Issue date
Jan 23, 1990
Inspex Incorporated
Mario A. Maldari
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection method and apparatus
Patent number
4,772,126
Issue date
Sep 20, 1988
Inspex Incorporated
Charly D. Allemand
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Trademark
last 30 trademarks
Information
Trademark
78794136 - FA-IMS
Serial number
78794136
Filing date
Jan 18, 2006
Inspex Inc.
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
76013739 - DMSVISION
Serial number
76013739
Filing date
Mar 30, 2000
Inspex, Incorporated
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
76013516 - YIELDSTAR
Serial number
76013516
Filing date
Mar 30, 2000
Inspex, Incorporated
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
74395379 - DMS
Serial number
74395379
Registration number
2004604
Filing date
May 27, 1993
INSPEX INCORPORATED
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information
Trademark
73576692 - INSPEX
Serial number
73576692
Registration number
1452968
Filing date
Jan 7, 1986
INSPEX INCORPORATED
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments