INSPEX INCORPORATED

Organization

WALTHAM, MA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
- Patent number 6,774,991
- Issue date Aug 10, 2004
- Inspex Incorporated
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for reviewing a semiconductor wafer using at leas...
- Patent number 6,643,006
- Issue date Nov 4, 2003
- Inspex, Inc.
- Chin-Jung Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a patterned semiconductor wafer
- Patent number 6,621,570
- Issue date Sep 16, 2003
- Inspex Incorporated
- Joseph J. Danko
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a semiconductor wafer using a d...
- Patent number 6,097,428
- Issue date Aug 1, 2000
- Inspex, Inc.
- Wo-Tak Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for establishing a common reference point on a se...
- Patent number 6,028,664
- Issue date Feb 22, 2000
- Inspex, Inc.
- Arnold Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection method and apparatus
- Patent number 5,805,278
- Issue date Sep 8, 1998
- Inspex, Inc.
- Joseph J. Danko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Adjustable fourier mask
- Patent number 5,742,422
- Issue date Apr 21, 1998
- Inspex, Inc.
- Steven R. Drake
- G02 - OPTICS
Information Patent Grant
Robot system
- Patent number 5,667,353
- Issue date Sep 16, 1997
- Inspex Inc.
- Steven R. Drake
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for detecting particles on a surface of a semi...
- Patent number 5,659,390
- Issue date Aug 19, 1997
- Inspex, Inc.
- Joseph J. Danko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Particle detection method and apparatus
- Patent number 5,317,380
- Issue date May 31, 1994
- Inspex, Inc.
- Charly D. Allemand
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection method and apparatus
- Patent number 4,895,446
- Issue date Jan 23, 1990
- Inspex Incorporated
- Mario A. Maldari
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection method and apparatus
- Patent number 4,772,126
- Issue date Sep 20, 1988
- Inspex Incorporated
- Charly D. Allemand
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
78794136 - FA-IMS
- Serial number 78794136
- Filing date Jan 18, 2006
- Inspex Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76013739 - DMSVISION
- Serial number 76013739
- Filing date Mar 30, 2000
- Inspex, Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76013516 - YIELDSTAR
- Serial number 76013516
- Filing date Mar 30, 2000
- Inspex, Incorporated
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74395379 - DMS
- Serial number 74395379
- Registration number 2004604
- Filing date May 27, 1993
- INSPEX INCORPORATED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73576692 - INSPEX
- Serial number 73576692
- Registration number 1452968
- Filing date Jan 7, 1986
- INSPEX INCORPORATED
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

INSPEX INCORPORATED

Organization

Patents Grantslast 30 patents

Method and apparatus for inspecting a patterned semiconductor wafer

Method and system for reviewing a semiconductor wafer using at leas...

Method and apparatus for inspecting a patterned semiconductor wafer

Method and apparatus for inspecting a semiconductor wafer using a d...

Method and system for establishing a common reference point on a se...

Particle detection method and apparatus

Adjustable fourier mask

Robot system

Method and apparatus for detecting particles on a surface of a semi...

Particle detection method and apparatus

Particle detection method and apparatus

Particle detection method and apparatus

Trademarklast 30 trademarks

78794136 - FA-IMS

76013739 - DMSVISION

76013516 - YIELDSTAR

74395379 - DMS

73576692 - INSPEX