ION-TOF TECHNOLOGIES GMBH

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MUENSTER, DE

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Patents Grantslast 30 patents

Information Patent Grant
Secondary ion mass spectroscopic method, mass spectrometer and uses...
- Patent number 10,215,719
- Issue date Feb 26, 2019
- Ion-Tof Technologies GmbH
- Sven Kayser
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and liquid-metal ion source for a mass spectromet...
- Patent number 9,378,937
- Issue date Jun 28, 2016
- Ion-Tof Technologies GmbH
- Felix Kollmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and a mass spectrometer and uses thereof for detecting ions...
- Patent number 8,785,844
- Issue date Jul 22, 2014
- Ion-Tof Technologies GmbH
- Ewald Niehuis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Liquid metal ion source and secondary ion mass spectrometric method...
- Patent number 8,525,125
- Issue date Sep 3, 2013
- Ion-Tof Technologies GmbH
- Felix Kollmer
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Liquid metal ion source, secondary ion mass spectrometer, secondary...
- Patent number 8,410,425
- Issue date Apr 2, 2013
- Ion-Tof Technologies GmbH
- Felix Kollmer
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Patents Applicationslast 30 patents

Information Patent Application
SECONDARY ION MASS SPECTROSCOPIC METHOD, MASS SPECTROMETER AND USES...
- Publication number 20180067062
- Publication date Mar 8, 2018
- ION-TOF TECHNOLOGIES GMBH
- Sven Kayser
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMET...
- Publication number 20160254134
- Publication date Sep 1, 2016
- ION-TOF TECHNOLOGIES GMBH
- FELIX KOLLMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID METAL ION SOURCE AND SECONDARY ION MASS SPECTROMETRIC METHO...
- Publication number 20130216427
- Publication date Aug 22, 2013
- ION-TOF TECHNOLOGIES GMBH
- Felix Kollmer
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
METHOD AND A MASS SPECTROMETER AND USES THEREOF FOR DETECTING IONS...
- Publication number 20130119249
- Publication date May 16, 2013
- ION-TOF TECHNOLOGIES GMBH
- Ewald Niehuis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMET...
- Publication number 20120104249
- Publication date May 3, 2012
- ION-TOF TECHNOLOGIES GMBH
- FELIX KOLLMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID METAL ION SOURCE, SECONDARY IION MASS SPECTROMETER,SECONDARY...
- Publication number 20100237234
- Publication date Sep 23, 2010
- ION-TOF TECHNOLOGIES GMBH
- Felix Kollmer
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

ION-TOF TECHNOLOGIES GMBH

Organization

Patents Grantslast 30 patents

Secondary ion mass spectroscopic method, mass spectrometer and uses...

Mass spectrometer and liquid-metal ion source for a mass spectromet...

Method and a mass spectrometer and uses thereof for detecting ions...

Liquid metal ion source and secondary ion mass spectrometric method...

Liquid metal ion source, secondary ion mass spectrometer, secondary...

Patents Applicationslast 30 patents

SECONDARY ION MASS SPECTROSCOPIC METHOD, MASS SPECTROMETER AND USES...

MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMET...

LIQUID METAL ION SOURCE AND SECONDARY ION MASS SPECTROMETRIC METHO...

METHOD AND A MASS SPECTROMETER AND USES THEREOF FOR DETECTING IONS...

MASS SPECTROMETER AND LIQUID-METAL ION SOURCE FOR A MASS SPECTROMET...

LIQUID METAL ION SOURCE, SECONDARY IION MASS SPECTROMETER,SECONDARY...

Trademarklast 30 trademarks