JASCO CORPORATION

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometer
- Patent number 12,031,864
- Issue date Jul 9, 2024
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Differential refractive index measurement method, measurement devic...
- Patent number 12,000,812
- Issue date Jun 4, 2024
- Jasco Corporation
- Tomohiro Moteki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Real-time spectral analysis through high-speed spectral classification
- Patent number 11,913,877
- Issue date Feb 27, 2024
- Jasco Corporation
- Koshi Nagamori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Attenuated total reflection measuring apparatus capable of Raman sp...
- Patent number 11,898,908
- Issue date Feb 13, 2024
- Jasco Corporation
- Masateru Usuki
- G01 - MEASURING TESTING
Information Patent Grant
Circular dichroism measurement device and circular dichroism measur...
- Patent number 11,879,833
- Issue date Jan 23, 2024
- Jasco Corporation
- Yuichi Miyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Microspectroscope having position correction function
- Patent number 11,635,605
- Issue date Apr 25, 2023
- Jasco Corporation
- Kento Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Raman microscope having fluorescence observation function and filte...
- Patent number 11,579,089
- Issue date Feb 14, 2023
- Jasco Corporation
- Kento Aizawa
- G02 - OPTICS
Information Patent Grant
Phase difference control device
- Patent number 11,402,320
- Issue date Aug 2, 2022
- Jasco Corporation
- Yuichi Miyoshi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Sample injection device
- Patent number 11,391,705
- Issue date Jul 19, 2022
- Jasco Corporation
- Atsushi Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Foreign matter analysis Method, storage medium storing foreign matt...
- Patent number 11,248,962
- Issue date Feb 15, 2022
- Jasco Corporation
- Kento Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Microspectroscope having automatic sample detection function
- Patent number 11,029,208
- Issue date Jun 8, 2021
- Jasco Corporation
- Kento Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for spectrum determination
- Patent number 10,564,035
- Issue date Feb 18, 2020
- Jasco Corporation
- Yoshiro Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection measurement device
- Patent number 10,527,545
- Issue date Jan 7, 2020
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Optical instrument for measuring total reflection absorption spectr...
- Patent number 10,393,656
- Issue date Aug 27, 2019
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measurement method using fourier transform type spectrosco...
- Patent number 10,317,283
- Issue date Jun 11, 2019
- Jasco Corporation
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Grant
Microspectroscope
- Patent number 10,295,470
- Issue date May 21, 2019
- Jasco Corporation
- Kento Aizawa
- G02 - OPTICS
Information Patent Grant
Infrared microscope
- Patent number 10,234,665
- Issue date Mar 19, 2019
- Jasco Corporation
- Kento Aizawa
- G02 - OPTICS
Information Patent Grant
Chromatography system, signal processing apparatus, chromatography...
- Patent number 9,335,308
- Issue date May 10, 2016
- Jasco Corporation
- Takayuki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
High-pressure fluorescence flow cell, flow cell assembly, fluoresce...
- Patent number 9,267,887
- Issue date Feb 23, 2016
- Jasco Corporation
- Takeshi Kanomata
- G01 - MEASURING TESTING
Information Patent Grant
Pressure control apparatus for supercritical fluid
- Patent number 8,915,261
- Issue date Dec 23, 2014
- Jasco Corporation
- Takeshi Kanomata
- G05 - CONTROLLING REGULATING
Information Patent Grant
Very-small-capacity pressure gauge
- Patent number 8,863,578
- Issue date Oct 21, 2014
- Jasco Corporation
- Takeshi Kanomata
- G01 - MEASURING TESTING
Information Patent Grant
Depolarizer and circular dichroism spectrometer using the same
- Patent number 8,797,533
- Issue date Aug 5, 2014
- Jasco Corporation
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Grant
Ultraviolet curing resin property measuring apparatus
- Patent number 8,763,447
- Issue date Jul 1, 2014
- Jasco Corporation
- Toshiyuki Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Circular dichroism spectrometer having alignment mechanism
- Patent number 8,749,780
- Issue date Jun 10, 2014
- Jasco Corporation
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic total reflection measuring apparatus
- Patent number 8,531,674
- Issue date Sep 10, 2013
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Sample collection container, sample collection apparatus, and sampl...
- Patent number 8,327,725
- Issue date Dec 11, 2012
- Jasco Corporation
- Takeshi Kanomata
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional base setting method for image data
- Patent number 8,243,290
- Issue date Aug 14, 2012
- Jasco Corporation
- Takeo Soejima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,954,069
- Issue date May 31, 2011
- Jasco Corporation
- Masaaki Yumoto
- G02 - OPTICS
Information Patent Grant
Microscope
- Patent number 7,903,253
- Issue date Mar 8, 2011
- Jasco Corporation
- Jun Koshoubu
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic-measurement apparatus
- Patent number 7,869,039
- Issue date Jan 11, 2011
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL ANALYSIS METHOD, ANALYSIS APPARATUS AND ANALYSIS PROGRAM
- Publication number 20240295491
- Publication date Sep 5, 2024
- JASCO CORPORATION
- Taiji OYAMA
- G01 - MEASURING TESTING
Information Patent Application
INFRARED CIRCULAR DICHROISM MEASUREMENT APPARATUS
- Publication number 20230333006
- Publication date Oct 19, 2023
- JASCO CORPORATION
- Masaru SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
FOURIER TRANSFORM INFRARED SPECTROMETER
- Publication number 20230266242
- Publication date Aug 24, 2023
- JASCO CORPORATION
- Tomohiro KATSUMATA
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SPECTROMETER
- Publication number 20230266240
- Publication date Aug 24, 2023
- JASCO CORPORATION
- Tomohiro KATSUMATA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SPECTROMETER
- Publication number 20230146740
- Publication date May 11, 2023
- JASCO CORPORATION
- Kenichi AKAO
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATED TOTAL REFLECTION MEASURING APPARATUS CAPABLE OF RAMAN SP...
- Publication number 20230145637
- Publication date May 11, 2023
- JASCO CORPORATION
- Masateru USUKI
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE POLARIZED LIGHT SEPARATION AND DIFFRACTION ELEMENT AND O...
- Publication number 20230048604
- Publication date Feb 16, 2023
- JASCO CORPORATION
- Takashi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL
- Publication number 20220260816
- Publication date Aug 18, 2022
- JASCO CORPORATION
- Tomohiro KATSUMATA
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL REFRACTIVE INDEX MEASUREMENT METHOD, MEASUREMENT DEVIC...
- Publication number 20220187257
- Publication date Jun 16, 2022
- JASCO CORPORATION
- Tomohiro MOTEKI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CIRCULAR DICHROISM MEASUREMENT DEVICE AND CIRCULAR DICHROISM MEASUR...
- Publication number 20220155218
- Publication date May 19, 2022
- JASCO CORPORATION
- Yuichi MIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE SUITABLE FOR EVALUATING DIFFERENCE BETWEE...
- Publication number 20220155220
- Publication date May 19, 2022
- JASCO CORPORATION
- Satoko SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN MATTER ANALYSIS METHOD, STORAGE MEDIUM STORING FOREIGN MATT...
- Publication number 20210247233
- Publication date Aug 12, 2021
- JASCO CORPORATION
- Kento AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSCOPE HAVING FLUORESCENCE OBSERVATION FUNCTION AND FILTE...
- Publication number 20210190692
- Publication date Jun 24, 2021
- JASCO CORPORATION
- Kento AIZAWA
- G02 - OPTICS
Information Patent Application
REAL-TIME SPECTRAL ANALYSIS THROUGH HIGH-SPEED SPECTRAL CLASSIFICATION
- Publication number 20210055211
- Publication date Feb 25, 2021
- JASCO CORPORATION
- Koshi NAGAMORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE INJECTION DEVICE
- Publication number 20200408727
- Publication date Dec 31, 2020
- JASCO CORPORATION
- Atsushi TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
PHASE DIFFERENCE CONTROL DEVICE
- Publication number 20200400554
- Publication date Dec 24, 2020
- JASCO CORPORATION
- Yuichi MIYOSHI
- G02 - OPTICS
Information Patent Application
MICROSPECTROSCOPE HAVING POSITION CORRECTION FUNCTION
- Publication number 20200292802
- Publication date Sep 17, 2020
- JASCO CORPORATION
- Kento AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
MICROSPECTROSCOPE HAVING AUTOMATIC SAMPLE DETECTION FUNCTION
- Publication number 20200271522
- Publication date Aug 27, 2020
- JASCO CORPORATION
- Kento AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
TOTAL INTERNAL REFLECTION OPTICAL MEMBER, AND TOTAL INTERNAL REFLEC...
- Publication number 20200041408
- Publication date Feb 6, 2020
- JASCO CORPORATION
- Jun KOSHOBU
- G02 - OPTICS
Information Patent Application
OPTICAL INSTRUMENT FOR MEASURING TOTAL REFLECTION ABSORPTION SPECTR...
- Publication number 20190086332
- Publication date Mar 21, 2019
- JASCO CORPORATION
- Noriaki SOGA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT METHOD USING FOURIER TRANSFORM TYPE SPECTROSCO...
- Publication number 20190041268
- Publication date Feb 7, 2019
- JASCO CORPORATION
- Tetsuji SUNAMI
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION MEASUREMENT DEVICE
- Publication number 20180335382
- Publication date Nov 22, 2018
- JASCO CORPORATION
- Noriaki SOGA
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR SPECTRUM DETERMINATION
- Publication number 20180321086
- Publication date Nov 8, 2018
- JASCO CORPORATION
- Yoshiro KONDO
- G01 - MEASURING TESTING
Information Patent Application
INFRARED MICROSCOPE
- Publication number 20180307018
- Publication date Oct 25, 2018
- JASCO CORPORATION
- Kento AIZAWA
- G02 - OPTICS
Information Patent Application
MICROSPECTROSCOPE
- Publication number 20180067053
- Publication date Mar 8, 2018
- JASCO CORPORATION
- Kento AIZAWA
- G02 - OPTICS
Information Patent Application
CHROMATOGRAPHY SYSTEM, SIGNAL PROCESSING APPARATUS, CHROMATOGRAPHY...
- Publication number 20140268154
- Publication date Sep 18, 2014
- JASCO CORPORATION
- Takayuki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Solution Sample Holding Method, Sample Cell, And Circular Dichroism...
- Publication number 20130293887
- Publication date Nov 7, 2013
- JASCO CORPORATION
- Ettore Castiglioni
- G01 - MEASURING TESTING
Information Patent Application
Circular Dichroism Spectrometer Having Alignment Mechanism
- Publication number 20130258334
- Publication date Oct 3, 2013
- JASCO CORPORATION
- Tetsuji Sunami
- G01 - MEASURING TESTING
Information Patent Application
Depolarizer And Circular Dichroism Spectrometer Using The Same
- Publication number 20130169965
- Publication date Jul 4, 2013
- JASCO CORPORATION
- Tetsuji Sunami
- G02 - OPTICS
Information Patent Application
HIGH-PRESSURE FLUORESCENCE FLOW CELL, FLOW CELL ASSEMBLY, FLUORESCE...
- Publication number 20130161243
- Publication date Jun 27, 2013
- JASCO CORPORATION
- Takeshi Kanomata
- G01 - MEASURING TESTING

JASCO CORPORATION

Organization

Patents Grantslast 30 patents

Spectrometer

Differential refractive index measurement method, measurement devic...

Real-time spectral analysis through high-speed spectral classification

Attenuated total reflection measuring apparatus capable of Raman sp...

Circular dichroism measurement device and circular dichroism measur...

Microspectroscope having position correction function

Raman microscope having fluorescence observation function and filte...

Phase difference control device

Sample injection device

Foreign matter analysis Method, storage medium storing foreign matt...

Microspectroscope having automatic sample detection function

Device and method for spectrum determination

Total reflection measurement device

Optical instrument for measuring total reflection absorption spectr...

Spectrum measurement method using fourier transform type spectrosco...

Microspectroscope

Infrared microscope

Chromatography system, signal processing apparatus, chromatography...

High-pressure fluorescence flow cell, flow cell assembly, fluoresce...

Pressure control apparatus for supercritical fluid

Very-small-capacity pressure gauge

Depolarizer and circular dichroism spectrometer using the same

Ultraviolet curing resin property measuring apparatus

Circular dichroism spectrometer having alignment mechanism

Microscopic total reflection measuring apparatus

Sample collection container, sample collection apparatus, and sampl...

Three-dimensional base setting method for image data

Microscopic-measurement apparatus

Microscope

Microscopic-measurement apparatus

Patents Applicationslast 30 patents

SPECTRAL ANALYSIS METHOD, ANALYSIS APPARATUS AND ANALYSIS PROGRAM

INFRARED CIRCULAR DICHROISM MEASUREMENT APPARATUS

FOURIER TRANSFORM INFRARED SPECTROMETER

INFRARED SPECTROMETER

SPECTROMETER

ATTENUATED TOTAL REFLECTION MEASURING APPARATUS CAPABLE OF RAMAN SP...

REFLECTIVE POLARIZED LIGHT SEPARATION AND DIFFRACTION ELEMENT AND O...

MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL

DIFFERENTIAL REFRACTIVE INDEX MEASUREMENT METHOD, MEASUREMENT DEVIC...

CIRCULAR DICHROISM MEASUREMENT DEVICE AND CIRCULAR DICHROISM MEASUR...

SPECTRUM MEASURING DEVICE SUITABLE FOR EVALUATING DIFFERENCE BETWEE...

FOREIGN MATTER ANALYSIS METHOD, STORAGE MEDIUM STORING FOREIGN MATT...

RAMAN MICROSCOPE HAVING FLUORESCENCE OBSERVATION FUNCTION AND FILTE...

REAL-TIME SPECTRAL ANALYSIS THROUGH HIGH-SPEED SPECTRAL CLASSIFICATION

SAMPLE INJECTION DEVICE

PHASE DIFFERENCE CONTROL DEVICE

MICROSPECTROSCOPE HAVING POSITION CORRECTION FUNCTION

MICROSPECTROSCOPE HAVING AUTOMATIC SAMPLE DETECTION FUNCTION

TOTAL INTERNAL REFLECTION OPTICAL MEMBER, AND TOTAL INTERNAL REFLEC...

OPTICAL INSTRUMENT FOR MEASURING TOTAL REFLECTION ABSORPTION SPECTR...

SPECTRUM MEASUREMENT METHOD USING FOURIER TRANSFORM TYPE SPECTROSCO...

TOTAL REFLECTION MEASUREMENT DEVICE

DEVICE AND METHOD FOR SPECTRUM DETERMINATION

INFRARED MICROSCOPE

MICROSPECTROSCOPE

CHROMATOGRAPHY SYSTEM, SIGNAL PROCESSING APPARATUS, CHROMATOGRAPHY...

Solution Sample Holding Method, Sample Cell, And Circular Dichroism...

Circular Dichroism Spectrometer Having Alignment Mechanism

Depolarizer And Circular Dichroism Spectrometer Using The Same

HIGH-PRESSURE FLUORESCENCE FLOW CELL, FLOW CELL ASSEMBLY, FLUORESCE...

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