JohnsTech International Corporation

Organization

LAKE LURE, NC, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Contact assembly array and testing system having contact assembly a...
- Patent number 11,906,576
- Issue date Feb 20, 2024
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Spring pin tip
- Patent number D1015282
- Issue date Feb 20, 2024
- Johnstech International Corporation
- Valts Treibergs
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Over the air (OTA) chip testing system
- Patent number 11,879,925
- Issue date Jan 23, 2024
- Johnstech International Corporation
- Mike Andres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact assembly and kelvin testing system having contact assembly
- Patent number 11,867,752
- Issue date Jan 9, 2024
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Compliant ground block and testing system having compliant ground b...
- Patent number 11,821,943
- Issue date Nov 21, 2023
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Compliant ground block and testing system having compliant ground b...
- Patent number 11,802,909
- Issue date Oct 31, 2023
- Johnstech International Corporation
- Max A. Carideo
- G01 - MEASURING TESTING
Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 11,709,183
- Issue date Jul 25, 2023
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Housing with anti-dislodge capability
- Patent number 11,674,998
- Issue date Jun 13, 2023
- Johnstech International Corporation
- Bob Chartrand
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 11,467,183
- Issue date Oct 11, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated circuit testing
- Patent number 11,360,117
- Issue date Jun 14, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated circuit testing
- Patent number 11,307,232
- Issue date Apr 19, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing for integrated circuits with antennas
- Patent number 11,293,968
- Issue date Apr 5, 2022
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tip for integrated circuit test pin
- Patent number D942290
- Issue date Feb 1, 2022
- Johnstech International Corporation
- John Nelson
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 11,209,458
- Issue date Dec 28, 2021
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 11,183,783
- Issue date Nov 23, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectively geometric shaped contact pin for electronic component t...
- Patent number 11,029,335
- Issue date Jun 8, 2021
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
High isolation housing for testing integrated circuits
- Patent number 11,002,760
- Issue date May 11, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 10,877,090
- Issue date Dec 29, 2020
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contact test apparatus with and method of constr...
- Patent number 10,794,933
- Issue date Oct 6, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 10,761,112
- Issue date Sep 1, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 10,725,069
- Issue date Jul 28, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide integrated testing
- Patent number 10,698,000
- Issue date Jun 30, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 10,686,269
- Issue date Jun 16, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Low resistance low wear test pin for test contactor
- Patent number 10,551,412
- Issue date Feb 4, 2020
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Grant
Manual test socket and method of adjustment
- Patent number 10,495,688
- Issue date Dec 3, 2019
- Johnstech International Corporation
- Jose Lopez
- G01 - MEASURING TESTING
Information Patent Grant
Constant pressure pin tip for testing integrated circuit chips
- Patent number 10,436,819
- Issue date Oct 8, 2019
- Johnstech International Corporation
- David A. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 10,401,386
- Issue date Sep 3, 2019
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit probe array and method of construction
- Patent number 10,330,702
- Issue date Jun 25, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins microcircuit tester
- Patent number 10,302,675
- Issue date May 28, 2019
- Johnstech International Corporation
- John E. Nelson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

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Patents Applicationslast 30 patents

Information Patent Application
SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM
- Publication number 20230258688
- Publication date Aug 17, 2023
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
HOUSING WITH VERTICAL BACKSTOP
- Publication number 20230184826
- Publication date Jun 15, 2023
- Johnstech International Corporation
- Melissa Hasskamp
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...
- Publication number 20220229106
- Publication date Jul 21, 2022
- Johnstech International Corporation
- Max A. Carideo
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...
- Publication number 20220107359
- Publication date Apr 7, 2022
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
HOUSING WITH ANTI-DISLODGE CAPABILITY
- Publication number 20220107357
- Publication date Apr 7, 2022
- Johnstech International Corporation
- Bob Chartrand
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING FOR INTEGRATED CIRCUITS WITH ANTENNAS
- Publication number 20210356511
- Publication date Nov 18, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...
- Publication number 20210018533
- Publication date Jan 21, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
Self Flattening Test Socket With Anti-Bowing And Elastomer Retention
- Publication number 20200400718
- Publication date Dec 24, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Contactor For Testing ICs And Method Of Construc...
- Publication number 20200363451
- Publication date Nov 19, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20200313322
- Publication date Oct 1, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20190302145
- Publication date Oct 3, 2019
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20190097333
- Publication date Mar 28, 2019
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20190041429
- Publication date Feb 7, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20190004093
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20190004091
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Low Resistance Low Wear Test Pin For Test Contactor
- Publication number 20180067145
- Publication date Mar 8, 2018
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20170315169
- Publication date Nov 2, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20170276699
- Publication date Sep 28, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20170074926
- Publication date Mar 16, 2017
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20170059616
- Publication date Mar 2, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Low Resistance Low Wear Test Pin For Test Contactor
- Publication number 20170023613
- Publication date Jan 26, 2017
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20160370406
- Publication date Dec 22, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Kelvin Contacts For Microcircuit Tester
- Publication number 20160320429
- Publication date Nov 3, 2016
- Johnstech International Corporation
- Joel N. Erdman
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20160209444
- Publication date Jul 21, 2016
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Contactor and Method of Construction
- Publication number 20160161528
- Publication date Jun 9, 2016
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20150123689
- Publication date May 7, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20150015293
- Publication date Jan 15, 2015
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...
- Publication number 20150015287
- Publication date Jan 15, 2015
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20140266279
- Publication date Sep 18, 2014
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130154678
- Publication date Jun 20, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
98542388 - VROL
- Serial number 98542388
- Filing date May 9, 2024
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98542668 - HERØHF
- Serial number 98542668
- Filing date May 9, 2024
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98542620 - HERØHC
- Serial number 98542620
- Filing date May 9, 2024
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98202818 - KEEP EVOLVING
- Serial number 98202818
- Filing date Sep 28, 2023
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98202826 - KEEP EVOLVING
- Serial number 98202826
- Filing date Sep 28, 2023
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97394644 - RELENTLESS PURSUIT OF YOUR SUCCESS
- Serial number 97394644
- Filing date May 4, 2022
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97359034 - J-TUNED
- Serial number 97359034
- Filing date Apr 12, 2022
- JohnsTech International Corporation
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97359081 - J-TUNED
- Serial number 97359081
- Filing date Apr 12, 2022
- JohnsTech International Corporation
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
97314942 - JOHNSTECH
- Serial number 97314942
- Filing date Mar 16, 2022
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97314894 - J
- Serial number 97314894
- Filing date Mar 16, 2022
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97030751 - DAISHO
- Serial number 97030751
- Registration number 6951463
- Filing date Sep 16, 2021
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97016523 - JOHNSTECH
- Serial number 97016523
- Registration number 6822693
- Filing date Sep 8, 2021
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97015145 - BLADE TOUCH
- Serial number 97015145
- Filing date Sep 7, 2021
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90708797 - J
- Serial number 90708797
- Registration number 7081436
- Filing date May 13, 2021
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90284385 - XL-2
- Serial number 90284385
- Registration number 6648033
- Filing date Oct 28, 2020
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90168545 - ES-P
- Serial number 90168545
- Registration number 6834603
- Filing date Sep 9, 2020
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90077876 - SHOTO
- Serial number 90077876
- Registration number 6487838
- Filing date Jul 28, 2020
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90077549 - YARI
- Serial number 90077549
- Registration number 6487835
- Filing date Jul 28, 2020
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87560007 - VERTICON II
- Serial number 87560007
- Registration number 5493830
- Filing date Aug 8, 2017
- Johnstech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87295626 - MMRF
- Serial number 87295626
- Registration number 5388153
- Filing date Jan 10, 2017
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86048792 - IQTOUCH
- Serial number 86048792
- Registration number 4827589
- Filing date Aug 27, 2013
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85926683 - ROL
- Serial number 85926683
- Registration number 4562451
- Filing date May 8, 2013
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85624087 - JOHNSTECH
- Serial number 85624087
- Registration number 4312036
- Filing date May 14, 2012
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77931355 - VERTICON
- Serial number 77931355
- Registration number 4035681
- Filing date Feb 9, 2010
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77670258 - JOHNSTECH
- Serial number 77670258
- Registration number 3887007
- Filing date Feb 13, 2009
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77670311 - JTI
- Serial number 77670311
- Registration number 3887008
- Filing date Feb 13, 2009
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77670341 - JTI
- Serial number 77670341
- Registration number 3887009
- Filing date Feb 13, 2009
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76672945 - ROL
- Serial number 76672945
- Filing date Feb 21, 2007
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76665294 - SELECTEST
- Serial number 76665294
- Registration number 3289403
- Filing date Aug 29, 2006
- JohnsTech International Corporation
- 35 - Advertising
Information Trademark
76387953 - JOHNSTECH
- Serial number 76387953
- Registration number 2702200
- Filing date Mar 28, 2002
- JohnsTech International Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

JohnsTech International Corporation

Organization

Patents Grantslast 30 patents

Contact assembly array and testing system having contact assembly a...

Spring pin tip

Over the air (OTA) chip testing system

Contact assembly and kelvin testing system having contact assembly

Compliant ground block and testing system having compliant ground b...

Compliant ground block and testing system having compliant ground b...

Self flattening test socket with anti-bowing and elastomer retention

Housing with anti-dislodge capability

Integrated circuit contact test apparatus with and method of constr...

Waveguide integrated circuit testing

Waveguide integrated circuit testing

Integrated circuit testing for integrated circuits with antennas

Tip for integrated circuit test pin

Integrated circuit contactor for testing ICs and method of construc...

High isolation contactor with test pin and housing for integrated c...

Selectively geometric shaped contact pin for electronic component t...

High isolation housing for testing integrated circuits

Testing apparatus and method for microcircuit testing with conical...

Electrically conductive pins for microcircuit tester

Integrated circuit contact test apparatus with and method of constr...

Self flattening test socket with anti-bowing and elastomer retention

Integrated circuit contactor for testing ICs and method of construc...

Waveguide integrated testing

High isolation contactor with test pin and housing for integrated c...

Low resistance low wear test pin for test contactor

Manual test socket and method of adjustment

Constant pressure pin tip for testing integrated circuit chips

On-center electrically conductive pins for integrated testing

Wafer level integrated circuit probe array and method of construction

Electrically conductive pins microcircuit tester

Patents Applicationslast 30 patents

SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM

HOUSING WITH VERTICAL BACKSTOP

COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...

COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...

HOUSING WITH ANTI-DISLODGE CAPABILITY

INTEGRATED CIRCUIT TESTING FOR INTEGRATED CIRCUITS WITH ANTENNAS

INTEGRATED CIRCUIT CONTACT TEST APPARATUS WITH AND METHOD OF CONSTR...

Self Flattening Test Socket With Anti-Bowing And Elastomer Retention

Integrated Circuit Contactor For Testing ICs And Method Of Construc...

High Isolation Contactor with Test Pin and Housing For Integrated C...

Electrically Conductive Kelvin Contacts For Microcircuit Tester

High Isolation Contactor with Test Pin and Housing For Integrated C...

Wafer Level Integrated Circuit Probe Array and Method of Construction

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Electrically Conductive Pins Microcircuit Tester

Low Resistance Low Wear Test Pin For Test Contactor

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

Wafer Level Integrated Circuit Probe Array and Method of Construction

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Low Resistance Low Wear Test Pin For Test Contactor

On-Center Electrically Conductive Pins For Integrated Testing

Electrically Conductive Kelvin Contacts For Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

Wafer Level Integrated Circuit Contactor and Method of Construction

Electrically Conductive Pins For Microcircuit Tester

On-Center Electrically Conductive Pins For Integrated Testing

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Trademarklast 30 trademarks

98542388 - VROL

98542668 - HERØHF

98542620 - HERØHC

98202818 - KEEP EVOLVING

98202826 - KEEP EVOLVING

97394644 - RELENTLESS PURSUIT OF YOUR SUCCESS

97359034 - J-TUNED

97359081 - J-TUNED

97314942 - JOHNSTECH

97314894 - J

97030751 - DAISHO

97016523 - JOHNSTECH

97015145 - BLADE TOUCH

90708797 - J

90284385 - XL-2