KING YUAN ELECTRONICS CO., LTD.

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Hsin-Chu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Image test system, test assembly and image capture card
- Patent number 11,693,042
- Issue date Jul 4, 2023
- KING YUAN ELECTRONICS CO, LTD.
- Pin-Yan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor component burn-in test module and burn-in test equipment
- Patent number 11,500,012
- Issue date Nov 15, 2022
- King Yuan Electronics Co., Ltd.
- Chia-Hung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Image test system and test assembly thereof
- Patent number 11,300,611
- Issue date Apr 12, 2022
- KING YUAN ELECTRONICS CO, LTD.
- Pin-Yan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Titration module of biochip and tiration test apparatus thereof
- Patent number 10,247,747
- Issue date Apr 2, 2019
- King Yuan Electronics Co., Ltd.
- Kuang-Hsiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Comparison device and method for comparing test pattern files of a...
- Patent number 9,921,269
- Issue date Mar 20, 2018
- King Yuan Electronics Co., Ltd.
- Fu-Tai Chen
- G01 - MEASURING TESTING
Information Patent Grant
Structure of built-in self-test for pressure tester and method thereof
- Patent number 9,116,064
- Issue date Aug 25, 2015
- King Yuan Electronics Co., Ltd.
- Wei-Jen Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining disposition of via hole on pri...
- Patent number 8,751,178
- Issue date Jun 10, 2014
- King Yuan Electronics Co., Ltd.
- Ming-Chin Tsai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor test system with self-inspection of electrical channel
- Patent number 8,275,568
- Issue date Sep 25, 2012
- King Yuan Electronics Co., Ltd.
- Chung Lung Chang
- G01 - MEASURING TESTING
Information Patent Grant
ZIF connectors and semiconductor testing device and system using th...
- Patent number 8,248,090
- Issue date Aug 21, 2012
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for improving yield ratio of testing
- Patent number 8,193,819
- Issue date Jun 5, 2012
- King Yuan Electronics Co., Ltd.
- Wei-Ping Wang
- G01 - MEASURING TESTING
Information Patent Grant
RF chip test method
- Patent number 8,085,059
- Issue date Dec 27, 2011
- King Yuan Electronics Co., Ltd.
- Hsuan-Chung Ko
- G01 - MEASURING TESTING
Information Patent Grant
Segregating apparatus
- Patent number 8,066,113
- Issue date Nov 29, 2011
- King Yuan Electronics Co., Ltd.
- Yuan-Chi Lin
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method for continuity test of integrated circuit
- Patent number 8,030,944
- Issue date Oct 4, 2011
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Coplanarity inspection device for printed circuit boards
- Patent number 8,009,896
- Issue date Aug 30, 2011
- King Yuan Electronics Co., Ltd.
- Chiu-Fang Chang
- G01 - MEASURING TESTING
Information Patent Grant
Testing system module
- Patent number 8,008,938
- Issue date Aug 30, 2011
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Method for wafer analysis with artificial neural network and system...
- Patent number 8,010,468
- Issue date Aug 30, 2011
- King Yuan Electronics Co., Ltd.
- Ming-Chin Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test equipment with concentric pogo towers
- Patent number 7,973,548
- Issue date Jul 5, 2011
- King Yuan Electronics Co., Ltd.
- Fong Jay Chen
- G01 - MEASURING TESTING
Information Patent Grant
Feeding apparatus of test equipment
- Patent number 7,938,611
- Issue date May 10, 2011
- King Yuan Electronics Co., Ltd.
- Yuan-Chi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Self-cleaning package testing socket
- Patent number 7,924,039
- Issue date Apr 12, 2011
- King Yuan Electronics Co., Ltd.
- Te Wei Chen
- B08 - CLEANING
Information Patent Grant
Semiconductor test system with self-inspection of memory repair ana...
- Patent number 7,890,820
- Issue date Feb 15, 2011
- King Yuan Electronics Co., Ltd.
- Chia-Ching Peng
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for stacked pattern design of printed circuit board and syst...
- Patent number 7,870,527
- Issue date Jan 11, 2011
- King Yuan Electronics Co., Ltd.
- Ming-Chin Tsai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor test system with self-inspection of electrical channe...
- Patent number 7,847,571
- Issue date Dec 7, 2010
- King Yuan Electronics Co., Ltd.
- Chung Lung Chang
- G01 - MEASURING TESTING
Information Patent Grant
Parallel test fixture for mixed signal integrated circuits
- Patent number 7,821,277
- Issue date Oct 26, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,804,315
- Issue date Sep 28, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and test probes therein
- Patent number 7,786,744
- Issue date Aug 31, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,772,861
- Issue date Aug 10, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having pogo probes for chip scale package
- Patent number 7,737,711
- Issue date Jun 15, 2010
- King Yuan Electronics Co., Ltd.
- Chiu-Fang Chang
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly
- Patent number 7,710,134
- Issue date May 4, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Grant
Heat-resistant lens kit
- Patent number 7,701,233
- Issue date Apr 20, 2010
- King Yuan Electronics Co., Ltd.
- Tai Pi-Hui
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 7,688,087
- Issue date Mar 30, 2010
- King Yuan Electronics Co., Ltd.
- Chen-Chien Chih
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE ASSEMBLY AND SEMICONDUCTOR PACKAGE SUBSTRATE...
- Publication number 20240153890
- Publication date May 9, 2024
- King Yuan Electronics Co., Ltd.
- Chia Fong CHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TITRATION MODULE, TEST APPARATUS AND METHOD FOR MEASURING TITRATION...
- Publication number 20220229031
- Publication date Jul 21, 2022
- King Yuan Electronics Co., Ltd.
- Chieh-Wen LU
- G01 - MEASURING TESTING
Information Patent Application
IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD
- Publication number 20220155361
- Publication date May 19, 2022
- King Yuan Electronics Co., Ltd.
- Pin-Yan TSAI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR COMPONENT BURN-IN TEST MODULE AND BURN-IN TEST EQUIPMENT
- Publication number 20220043052
- Publication date Feb 10, 2022
- King Yuan Electronics Co., Ltd.
- Chia-Hung TSAI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE TEST SYSTEM AND TEST ASSEMBLY THEREOF
- Publication number 20210132146
- Publication date May 6, 2021
- King Yuan Electronics Co., Ltd.
- Pin-Yan TSAI
- G01 - MEASURING TESTING
Information Patent Application
TITRATION MODULE OF BIOCHIP AND TIRATION TEST APPARATUS THEREOF
- Publication number 20180106822
- Publication date Apr 19, 2018
- King Yuan Electronics Co., Ltd.
- Kuang-Hsiang LIU
- G01 - MEASURING TESTING
Information Patent Application
COMPARISON DEVICE AND METHOD FOR COMPARING TEST PATTERN FILES OF A...
- Publication number 20150074094
- Publication date Mar 12, 2015
- King Yuan Electronics Co., Ltd.
- Fu-Tai CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE OF BUILT-IN SELF-TEST FOR PRESSURE TESTER AND METHOD THEREOF
- Publication number 20140083158
- Publication date Mar 27, 2014
- KING YUAN ELECTRONICS CO., LTD.
- Wei-Jen Cheng
- G01 - MEASURING TESTING
Information Patent Application
HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF
- Publication number 20120212249
- Publication date Aug 23, 2012
- KING YUAN ELECTRONICS CO., LTD.
- FONG JAY CHEN
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Semiconductor element testing system having air filter
- Publication number 20120212250
- Publication date Aug 23, 2012
- King Yuan Electronics Co., Ltd.
- Pi Hui Tai
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Structure of burn-in oven
- Publication number 20120206157
- Publication date Aug 16, 2012
- King Yuan Electronics Co., Ltd.
- Yen-Chang Liu
- G01 - MEASURING TESTING
Information Patent Application
Comparison device and method for comparing test pattern files of a...
- Publication number 20120158758
- Publication date Jun 21, 2012
- King Yuan Electronics Co., Ltd.
- Fu-Tai CHEN
- G01 - MEASURING TESTING
Information Patent Application
Wafer inspection system
- Publication number 20120136614
- Publication date May 31, 2012
- King Yuan Electronics Co., Ltd.
- Ta Kang Liu
- G01 - MEASURING TESTING
Information Patent Application
Burn-in oven having inverter fan and heat regulator
- Publication number 20120103967
- Publication date May 3, 2012
- King Yuan Electronics Co., Ltd.
- Yung-Tsung Hsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING DISPOSITION OF VIA HOLE ON PRI...
- Publication number 20120041710
- Publication date Feb 16, 2012
- King Yuan Electronics Co., Ltd.
- Ming-Chin TSAI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor test equipment with concentric pogo towers
- Publication number 20110018568
- Publication date Jan 27, 2011
- King Yuan Electronics Co., Ltd.
- Fong Jay Chen
- G01 - MEASURING TESTING
Information Patent Application
SELF-CLEANING PACKAGE TESTING SOCKET
- Publication number 20110018570
- Publication date Jan 27, 2011
- King Yuan Electronics Co., Ltd.
- Te Wei Chen
- B08 - CLEANING
Information Patent Application
METHOD AND APPARATUS FOR IMPROVING YIELD RATIO OF TESTING
- Publication number 20100237879
- Publication date Sep 23, 2010
- KING YUAN ELECTRONICS CO., LTD.
- WEI-PING WANG
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system with self-inspection of memory repair ana...
- Publication number 20100211837
- Publication date Aug 19, 2010
- King Yuan Electronics Co., Ltd.
- Chia-Ching Peng
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor test system with self-inspection of electrical channe...
- Publication number 20100201392
- Publication date Aug 12, 2010
- King Yuan Electronics Co., Ltd.
- Chung Lung Chang
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system with self-inspection of electrical channel
- Publication number 20100204949
- Publication date Aug 12, 2010
- King Yuan Electronics Co., Ltd.
- Chung Lung Chang
- G01 - MEASURING TESTING
Information Patent Application
System and equipment for persons with stoma
- Publication number 20100191203
- Publication date Jul 29, 2010
- King Yuan Electronics Co., Ltd.
- Hans H. HARALDSTED
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Probe Card
- Publication number 20100182028
- Publication date Jul 22, 2010
- King Yuan Electronics Co., Ltd.
- Cheng-Chin Ni
- G01 - MEASURING TESTING
Information Patent Application
Position-returning mechanism for a pick-and-place apparatus
- Publication number 20100119345
- Publication date May 13, 2010
- King Yuan Electronics Co., Ltd.
- Chiu-Fang ` Chang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
AUTOMATIC DETECTING DEVICE FOR RADIO FREQUENCY ENVIRONMENT
- Publication number 20090207036
- Publication date Aug 20, 2009
- KING YUAN ELECTRONICS CO., LTD.
- Hsuan-Chung Ko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Sharing conversion board for testing chips
- Publication number 20090153162
- Publication date Jun 18, 2009
- King Yuan Electronics Co., Ltd.
- Hsuan-Chung Ko
- G01 - MEASURING TESTING
Information Patent Application
Testboard with ZIF connectors, method of assembling, integrated cir...
- Publication number 20080290883
- Publication date Nov 27, 2008
- King Yuan Electronics To., Ltd.
- LIN YUAN-CHI
- G01 - MEASURING TESTING
Information Patent Application
Probe card assembly with ZIF connectors, method of assembling, wafe...
- Publication number 20080290884
- Publication date Nov 27, 2008
- King Yuan Electronics Co., Ltd.
- Yuan-Chi Lin
- G01 - MEASURING TESTING
Information Patent Application
Test interface with a mixed signal processing device
- Publication number 20080284454
- Publication date Nov 20, 2008
- King Yuan Electronics Co., Ltd.
- Chen-Chien Chih
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for monitoring overlapped object
- Publication number 20080267488
- Publication date Oct 30, 2008
- King Yuan Electronics Co., Ltd.
- Yuan-Chi Lin
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76396712 - KYEC
- Serial number 76396712
- Registration number 2704248
- Filing date Apr 16, 2002
- King Yuan Electronics Co., Ltd.
- 37 - Building construction
Information Trademark
76396713 - KYEC
- Serial number 76396713
- Registration number 2704249
- Filing date Apr 16, 2002
- King Yuan Electronics Co., Ltd.
- 37 - Building construction
Information Trademark
76094878 - KING YUAN
- Serial number 76094878
- Registration number 2802747
- Filing date Jul 21, 2000
- King Yuan Electronics Co., Ltd.
- 37 - Building construction

KING YUAN ELECTRONICS CO., LTD.

Organization

Patents Grantslast 30 patents

Image test system, test assembly and image capture card

Semiconductor component burn-in test module and burn-in test equipment

Image test system and test assembly thereof

Titration module of biochip and tiration test apparatus thereof

Comparison device and method for comparing test pattern files of a...

Structure of built-in self-test for pressure tester and method thereof

Method and apparatus for determining disposition of via hole on pri...

Semiconductor test system with self-inspection of electrical channel

ZIF connectors and semiconductor testing device and system using th...

Method and apparatus for improving yield ratio of testing

RF chip test method

Segregating apparatus

Method for continuity test of integrated circuit

Coplanarity inspection device for printed circuit boards

Testing system module

Method for wafer analysis with artificial neural network and system...

Semiconductor test equipment with concentric pogo towers

Feeding apparatus of test equipment

Self-cleaning package testing socket

Semiconductor test system with self-inspection of memory repair ana...

Method for stacked pattern design of printed circuit board and syst...

Semiconductor test system with self-inspection of electrical channe...

Parallel test fixture for mixed signal integrated circuits

Probe card

Probe card assembly and test probes therein

Probe card

Test apparatus having pogo probes for chip scale package

Probe card assembly

Heat-resistant lens kit

Test apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR PACKAGE ASSEMBLY AND SEMICONDUCTOR PACKAGE SUBSTRATE...

TITRATION MODULE, TEST APPARATUS AND METHOD FOR MEASURING TITRATION...

IMAGE TEST SYSTEM, TEST ASSEMBLY AND IMAGE CAPTURE CARD

SEMICONDUCTOR COMPONENT BURN-IN TEST MODULE AND BURN-IN TEST EQUIPMENT

IMAGE TEST SYSTEM AND TEST ASSEMBLY THEREOF

TITRATION MODULE OF BIOCHIP AND TIRATION TEST APPARATUS THEREOF

COMPARISON DEVICE AND METHOD FOR COMPARING TEST PATTERN FILES OF A...

STRUCTURE OF BUILT-IN SELF-TEST FOR PRESSURE TESTER AND METHOD THEREOF

HARD AND WEAR-RESISTING PROBE AND MANUFACTURING METHOD THEREOF

Semiconductor element testing system having air filter

Structure of burn-in oven

Comparison device and method for comparing test pattern files of a...

Wafer inspection system

Burn-in oven having inverter fan and heat regulator

METHOD AND APPARATUS FOR DETERMINING DISPOSITION OF VIA HOLE ON PRI...

Semiconductor test equipment with concentric pogo towers

SELF-CLEANING PACKAGE TESTING SOCKET

METHOD AND APPARATUS FOR IMPROVING YIELD RATIO OF TESTING

Semiconductor test system with self-inspection of memory repair ana...

Semiconductor test system with self-inspection of electrical channe...

Semiconductor test system with self-inspection of electrical channel

System and equipment for persons with stoma

Probe Card

Position-returning mechanism for a pick-and-place apparatus

AUTOMATIC DETECTING DEVICE FOR RADIO FREQUENCY ENVIRONMENT

Sharing conversion board for testing chips

Testboard with ZIF connectors, method of assembling, integrated cir...

Probe card assembly with ZIF connectors, method of assembling, wafe...

Test interface with a mixed signal processing device

Apparatus and method for monitoring overlapped object

Trademarklast 30 trademarks

76396712 - KYEC

76396713 - KYEC

76094878 - KING YUAN