Kratos Analytical Limited

Organization

Manchester, GB

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometry apparatus
- Patent number 12,183,564
- Issue date Dec 31, 2024
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxidized lipid detection
- Patent number 10,948,502
- Issue date Mar 16, 2021
- Kratos Analytical Limited
- Gerald Stubiger
- G01 - MEASURING TESTING
Information Patent Grant
Microbial analysis
- Patent number 10,655,157
- Issue date May 19, 2020
- KRATOS ANALYTICAL LIMITED
- Gerald Stubiger
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Methods and apparatuses relating to cleaning and imaging an ion sou...
- Patent number 10,340,131
- Issue date Jul 2, 2019
- KRATOS ANALYTICAL LIMITED
- John Mark Allison
- B08 - CLEANING
Information Patent Grant
Time of flight mass spectrometer
- Patent number 10,249,482
- Issue date Apr 2, 2019
- KRATOS ANALYTICAL LIMITED
- Diana Kalinina
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus useful for imaging
- Patent number 9,508,540
- Issue date Nov 29, 2016
- Kratos Analytical Limited
- Alan Barnes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for cleaning at least one surface of an ion...
- Patent number 9,468,953
- Issue date Oct 18, 2016
- Kratos Analytical Limited
- John Allison
- B08 - CLEANING
Information Patent Grant
Timing device and method
- Patent number 8,969,796
- Issue date Mar 3, 2015
- Kratos Analytical Limited
- Ian Sherwood
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methods and apparatuses for producing mass spectrum data
- Patent number 8,791,408
- Issue date Jul 29, 2014
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Timing device and method
- Patent number 8,716,674
- Issue date May 6, 2014
- Kratos Analytical Limited
- Ian Sherwood
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electron spectroscopy
- Patent number 8,481,931
- Issue date Jul 9, 2013
- Kratos Analytical Limited
- Simon Page
- G01 - MEASURING TESTING
Information Patent Grant
TOF mass spectrometer for stigmatic imaging and associated method
- Patent number 8,212,209
- Issue date Jul 3, 2012
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for thermalization of ions
- Patent number 8,198,582
- Issue date Jun 12, 2012
- Kratos Analytical Limited
- Emmanuel Raptakis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion axial spatial distribution focusing
- Patent number 7,910,878
- Issue date Mar 22, 2011
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion selector
- Patent number 7,579,586
- Issue date Aug 25, 2009
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle spectrometer and detector therefor
- Patent number 7,470,901
- Issue date Dec 30, 2008
- Kratos Analytical Limited
- Simon Charles Page
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method
- Patent number 7,071,463
- Issue date Jul 4, 2006
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optics system for TOF mass spectrometer
- Patent number 6,888,129
- Issue date May 3, 2005
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method
- Patent number 6,717,134
- Issue date Apr 6, 2004
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron imaging band pass analyser for a photoelectron spectromicr...
- Patent number 5,321,262
- Issue date Jun 14, 1994
- Kratos Analytical Limited
- David W. Turner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzers
- Patent number 5,286,974
- Issue date Feb 15, 1994
- Kratos Analytical Limited
- Andrew R. Walker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle source
- Patent number 5,196,708
- Issue date Mar 23, 1993
- Kratos Analytical Limited
- Stephen J. Mullock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzers
- Patent number 5,185,524
- Issue date Feb 9, 1993
- Kratos Analytical Limited
- Simon C. Page
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry systems
- Patent number 5,180,914
- Issue date Jan 19, 1993
- Kratos Analytical Limited
- Stephen C. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle extraction arrangement
- Patent number 5,164,594
- Issue date Nov 17, 1992
- Kratos Analytical, Limited
- Stephen P. Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer system including an ion source operable under hig...
- Patent number 5,164,593
- Issue date Nov 17, 1992
- Kratos Analytical Limited
- John R. Chapman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for a mass spectrometer
- Patent number 5,160,841
- Issue date Nov 3, 1992
- Kratos Analytical Limited
- John R. Chapman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion storage device
- Patent number 5,120,958
- Issue date Jun 9, 1992
- Kratos Analytical Limited
- Stephen C. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for a time-of-flight mass spectrometer
- Patent number 5,077,472
- Issue date Dec 31, 1991
- Kratos Analytical Limited
- Stephen C. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods of use in the mass analysis of chemical samples
- Patent number 4,908,512
- Issue date Mar 13, 1990
- Kratos Analytical Limited
- Richard M. Caprioli
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240213013
- Publication date Jun 27, 2024
- KRATOS ANALYTICAL LIMITED
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY APPARATUS
- Publication number 20220157590
- Publication date May 19, 2022
- KRATOS ANALYTICAL LIMITED
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20170352527
- Publication date Dec 7, 2017
- KRATOS ANALYTICAL LIMITED
- Diana KALININA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES RELATING TO CLEANING AN ION SOURCE
- Publication number 20170309464
- Publication date Oct 26, 2017
- KRATOS ANALYTICAL LIMITED
- John Mark ALLISON
- B08 - CLEANING
Information Patent Application
OXIDIZED LIPID DETECTION
- Publication number 20160349277
- Publication date Dec 1, 2016
- KRATOS ANALYTICAL LIMITED
- Gerald STUBIGER
- G01 - MEASURING TESTING
Information Patent Application
MICROBIAL ANALYSIS
- Publication number 20160237469
- Publication date Aug 18, 2016
- KRATOS ANALYTICAL LIMITED
- Gerald STUBIGER
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MALDI SAMPLE PREPARATION METHODS AND TARGETS
- Publication number 20150162176
- Publication date Jun 11, 2015
- Kratos Analytical Limited
- Oliver J. Schmitz
- G01 - MEASURING TESTING
Information Patent Application
TIMING DEVICE AND METHOD
- Publication number 20140191121
- Publication date Jul 10, 2014
- Kratos Analytical Limited
- Ian Sherwood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIMING DEVICE AND METHOD
- Publication number 20130221215
- Publication date Aug 29, 2013
- Kratos Analytical Limited
- Ian Sherwood
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUSES FOR PRODUCING MASS SPECTRUM DATA
- Publication number 20130119248
- Publication date May 16, 2013
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES FOR CLEANING AT LEAST ONE SURFACE OF AN ION...
- Publication number 20130118523
- Publication date May 16, 2013
- Kratos Analytical Limited
- John Allison
- B08 - CLEANING
Information Patent Application
TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD
- Publication number 20110139973
- Publication date Jun 16, 2011
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for thermalization of ions
- Publication number 20100270465
- Publication date Oct 28, 2010
- KRATOS ANALYTICAL LIMITED
- Emmanuel Raptakis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS USEFUL FOR IMAGING
- Publication number 20100176288
- Publication date Jul 15, 2010
- Kratos Analytical Limited
- Alan Barnes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ION AXIAL SPATIAL DISTRIBUTION FOCUSING
- Publication number 20100065738
- Publication date Mar 18, 2010
- Kratos Analytical Limited
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SPECTROSCOPY
- Publication number 20090309023
- Publication date Dec 17, 2009
- Kratos Analytical Limited
- Simon Page
- G01 - MEASURING TESTING
Information Patent Application
Electrode for X-ray apparatus
- Publication number 20090129551
- Publication date May 21, 2009
- Kratos Analytical Limited
- Peter Robert Butler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle spectrometer and detector therefor
- Publication number 20060060770
- Publication date Mar 23, 2006
- Kratos Analytical Limited
- Simon Charles Page
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion optics system for TOF mass spectrometer
- Publication number 20040256549
- Publication date Dec 23, 2004
- Kratos Analytical Limited
- Andrew R. Bowdler
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
88017730 - IONVIEW
- Serial number 88017730
- Registration number 5877352
- Filing date Jun 27, 2018
- Kratos Analytical, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88017685 - SAMPLESTATION
- Serial number 88017685
- Registration number 5753636
- Filing date Jun 27, 2018
- Kratos Analytical, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88017717 - AURASOLUTION
- Serial number 88017717
- Registration number 6337560
- Filing date Jun 27, 2018
- Kratos Analytical, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88017748 - MALDI SOLUTIONS
- Serial number 88017748
- Registration number 5837645
- Filing date Jun 27, 2018
- Kratos Analytical, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78835972 - AXIMA TOF2
- Serial number 78835972
- Filing date Mar 13, 2006
- Kratos Analytical Limited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Kratos Analytical Limited

Organization

Patents Grantslast 30 patents

Mass spectrometry apparatus

Oxidized lipid detection

Microbial analysis

Methods and apparatuses relating to cleaning and imaging an ion sou...

Time of flight mass spectrometer

Method and apparatus useful for imaging

Methods and apparatuses for cleaning at least one surface of an ion...

Timing device and method

Methods and apparatuses for producing mass spectrum data

Timing device and method

Electron spectroscopy

TOF mass spectrometer for stigmatic imaging and associated method

Method and apparatus for thermalization of ions

Method and apparatus for ion axial spatial distribution focusing

Ion selector

Charged particle spectrometer and detector therefor

Calibration method

Ion optics system for TOF mass spectrometer

Calibration method

Electron imaging band pass analyser for a photoelectron spectromicr...

Charged particle energy analyzers

Particle source

Charged particle energy analyzers

Mass spectrometry systems

Charged particle extraction arrangement

Mass spectrometer system including an ion source operable under hig...

Ion source for a mass spectrometer

Ion storage device

Ion mirror for a time-of-flight mass spectrometer

Apparatus and methods of use in the mass analysis of chemical samples

Patents Applicationslast 30 patents

TIME OF FLIGHT MASS SPECTROMETER

MASS SPECTROMETRY APPARATUS

TIME OF FLIGHT MASS SPECTROMETER

METHODS AND APPARATUSES RELATING TO CLEANING AN ION SOURCE

OXIDIZED LIPID DETECTION

MICROBIAL ANALYSIS

MALDI SAMPLE PREPARATION METHODS AND TARGETS

TIMING DEVICE AND METHOD

TIMING DEVICE AND METHOD

METHODS AND APPARATUSES FOR PRODUCING MASS SPECTRUM DATA

METHODS AND APPARATUSES FOR CLEANING AT LEAST ONE SURFACE OF AN ION...

TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD

Method and apparatus for thermalization of ions

METHOD AND APPARATUS USEFUL FOR IMAGING

METHOD AND APPARATUS FOR ION AXIAL SPATIAL DISTRIBUTION FOCUSING

ELECTRON SPECTROSCOPY

Electrode for X-ray apparatus

Charged particle spectrometer and detector therefor

Ion optics system for TOF mass spectrometer

Trademarklast 30 trademarks

88017730 - IONVIEW

88017685 - SAMPLESTATION

88017717 - AURASOLUTION

88017748 - MALDI SOLUTIONS

78835972 - AXIMA TOF2