TREA

Leeno Industrial Inc.

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  • Gangseo-Gu, KR
Organizations

Patents Grantslast 30 patents

  • Information Patent Grant

    Method for fabricating test socket
    • Patent number 12,105,133
    • Issue date Oct 1, 2024
    • Leeno Industrial Inc.
    • Seungha Baek
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket
    • Patent number 12,105,138
    • Issue date Oct 1, 2024
    • Leeno Industrial Inc.
    • Young taek Shin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 11,892,472
    • Issue date Feb 6, 2024
    • Leeno Industrial Inc.
    • Chang-hyun Song
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 11,726,111
    • Issue date Aug 15, 2023
    • LEENO INDUSTRIAL INC.
    • Changhyun Song
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test probe assembly and test socket
    • Patent number 11,639,945
    • Issue date May 2, 2023
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 11,609,245
    • Issue date Mar 21, 2023
    • Leeno Industrial Inc.
    • Dong-hoon Park
    • G01 - MEASURING TESTING
  • Information Patent Grant

    MEMS probe and test device using the same
    • Patent number 11,408,914
    • Issue date Aug 9, 2022
    • LEENO INDUSTRIAL INC.
    • Ung-gi Park
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Test device
    • Patent number 11,391,757
    • Issue date Jul 19, 2022
    • LEENO INDUSTRIAL INC.
    • Changhyun Song
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe socket
    • Patent number 11,333,680
    • Issue date May 17, 2022
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 11,150,270
    • Issue date Oct 19, 2021
    • LEENO INDUSTRIAL INC.
    • Geun-su Kim
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Testing device
    • Patent number 11,022,626
    • Issue date Jun 1, 2021
    • LEENO INDUSTRIAL INC.
    • Jung-Chul Shin
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket assembly
    • Patent number 10,976,348
    • Issue date Apr 13, 2021
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe socket
    • Patent number 10,884,047
    • Issue date Jan 5, 2021
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket unit
    • Patent number 10,884,024
    • Issue date Jan 5, 2021
    • LEENO INDUSTRIAL INC.
    • Jang-youl Son
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test probe and test device using the same
    • Patent number 10,670,628
    • Issue date Jun 2, 2020
    • LEENO INDUSTRIAL INC.
    • Ung-gi Park
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 10,656,180
    • Issue date May 19, 2020
    • LEENO INDUSTRIAL INC.
    • Ung-gi Park
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test socket
    • Patent number 10,338,100
    • Issue date Jul 2, 2019
    • LEENO INDUSTRIAL INC.
    • Sang-Duck Park
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Test device
    • Patent number 10,302,674
    • Issue date May 28, 2019
    • LEENO INDUSTRIAL INC.
    • Sang-Duck Park
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Coaxial probe
    • Patent number 9,250,264
    • Issue date Feb 2, 2016
    • Leeno Industrial Inc.
    • Chae-Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inspection apparatus for semiconductor device
    • Patent number 9,201,093
    • Issue date Dec 1, 2015
    • Leeno Industrial Inc.
    • Chae-Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe
    • Patent number 9,128,120
    • Issue date Sep 8, 2015
    • Leeno Industrial Inc.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Air interface apparatus for use in high-frequency probe device
    • Patent number 6,836,129
    • Issue date Dec 28, 2004
    • Leeno Industrial Inc.
    • Chaeyoon Lee
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEST SOCKET AND METHOD FOR FABRICATING THE SAME
    • Publication number 20240248118
    • Publication date Jul 25, 2024
    • LEENO INDUSTRIAL INC.
    • Geunsu KIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR FABRICATING TEST SOCKET
    • Publication number 20240110947
    • Publication date Apr 4, 2024
    • LEENO INDUSTRIAL INC.
    • Seungha BAEK
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20240069066
    • Publication date Feb 29, 2024
    • LEENO INDUSTRIAL INC.
    • Woesuk YANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SOCKET AND METHOD FOR FABRICATING THE SAME
    • Publication number 20220413008
    • Publication date Dec 29, 2022
    • LEENO INDUSTRIAL INC.
    • Geunsu KIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR FABRICATING TEST SOCKET
    • Publication number 20220373576
    • Publication date Nov 24, 2022
    • LEENO INDUSTRIAL INC.
    • Seungha BAEK
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Application

    TEST SOCKET AND METHOD OF FABRICATING THE SAME
    • Publication number 20220357361
    • Publication date Nov 10, 2022
    • LEENO INDUSTRIAL INC.
    • Seungha BAEK
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20220214377
    • Publication date Jul 7, 2022
    • LEENO INDUSTRIAL INC.
    • Changhyun Song
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20220155341
    • Publication date May 19, 2022
    • LEENO INDUSTRIAL INC.
    • Chang-hyun SONG
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20210132114
    • Publication date May 6, 2021
    • LEENO INDUSTRIAL INC.
    • Dong-hoon PARK
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20200241044
    • Publication date Jul 30, 2020
    • Leeno Industrial Inc.
    • Changhyun Song
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE ASSEMBLY AND TEST SOCKET
    • Publication number 20200241042
    • Publication date Jul 30, 2020
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20200141980
    • Publication date May 7, 2020
    • LEENO INDUSTRIAL INC.
    • Geun-su Kim
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SOCKET
    • Publication number 20200011895
    • Publication date Jan 9, 2020
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    TESTING DEVICE
    • Publication number 20190187177
    • Publication date Jun 20, 2019
    • Leeno Industrial Inc.
    • Jung-chul Shin
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS PROBE AND TEST DEVICE USING THE SAME
    • Publication number 20190064215
    • Publication date Feb 28, 2019
    • Leeno Industrial Inc.
    • Ung-gi Park
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20190041430
    • Publication date Feb 7, 2019
    • Leeno Industrial Inc.
    • Ung-gi Park
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE AND TEST DEVICE USING THE SAME
    • Publication number 20190041428
    • Publication date Feb 7, 2019
    • LEENO INDUSTRIAL INC.
    • Ung-gi Park
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SOCKET ASSEMBLY
    • Publication number 20190018045
    • Publication date Jan 17, 2019
    • Leeno Industrial Inc.
    • Jae-hwan Jeong
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    TEST SOCKET UNIT
    • Publication number 20180299484
    • Publication date Oct 18, 2018
    • Leeno Industrial Inc.
    • Jang-youl Son
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SOCKET
    • Publication number 20180196096
    • Publication date Jul 12, 2018
    • Leeno Industrial Inc.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20170315150
    • Publication date Nov 2, 2017
    • Leeno Industrial Inc.
    • Sang-Duck Park
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST SOCKET
    • Publication number 20170122977
    • Publication date May 4, 2017
    • Leeno Industrial Inc.
    • Sang-Duck Park
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE AND MACHINING METHOD THEREOF
    • Publication number 20150123687
    • Publication date May 7, 2015
    • LEENO INDUSTRIAL INC.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE
    • Publication number 20130099811
    • Publication date Apr 25, 2013
    • LEENO INDUSTRIAL INC.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE DEVICE FOR TESTING
    • Publication number 20120105090
    • Publication date May 3, 2012
    • LEENO INDUSTRIAL INC.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    Socket For Testing Semiconductor Chip
    • Publication number 20110102008
    • Publication date May 5, 2011
    • Leeno Industrial Inc.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact Probe And Socket For Testing Semiconductor Chips
    • Publication number 20080180125
    • Publication date Jul 31, 2008
    • Leeno Industrial Inc.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    Test probe and manufacturing method thereof
    • Publication number 20080036484
    • Publication date Feb 14, 2008
    • Leeno Industrial Inc.
    • Chae Yoon Lee
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe device with micro-pin inserted in interface board
    • Publication number 20060152240
    • Publication date Jul 13, 2006
    • Leeno Industrial Inc.
    • Chaeyoon Lee
    • G01 - MEASURING TESTING

Trademarklast 30 trademarks

  • Information Trademark

    87776105 - LEENO
    • Serial number 87776105
    • Registration number 5555120
    • Filing date Jan 30, 2018
    • LEENO INDUSTRIAL INC.
    • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments