LTX CORPORATION, A CORP. OF MASSACHUSETTS

Organization

WESTWOOD, MA, US

Ticker Symbols

NASDAQ:XCRA

INSTRUMENTS FOR MEAS & TESTING OF ELECTRICITY & ELEC SIGNALS
Business Address
825 UNIVERSITY AVENUE NORWOOD MA 02062 781-461-1000
Mailing Address
825 UNIVERSITY AVENUE NORWOOD MA 02062
State Location
MA
State of Incorporation
MA

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Dielectric resonating test contactor and method
- Patent number 12,123,897
- Issue date Oct 22, 2024
- Xcerra Corporation
- James Hattis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration system
- Patent number 12,044,726
- Issue date Jul 23, 2024
- Xcerra Corporation
- William Reid
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly with antenna and related methods
- Patent number 11,662,363
- Issue date May 30, 2023
- Xcerra Corporation
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Grant
System and method for attenuating and/or terminating RF circuit
- Patent number 11,650,227
- Issue date May 16, 2023
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket assembly with waveguide antenna probe
- Patent number 11,391,765
- Issue date Jul 19, 2022
- Xcerra Corporation
- Dongmei Han
- G01 - MEASURING TESTING
Information Patent Grant
Spring-loaded probe having folded portions and probe assembly
- Patent number 11,268,981
- Issue date Mar 8, 2022
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly and related methods
- Patent number 11,088,051
- Issue date Aug 10, 2021
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing device and method for testing a printed circuit board
- Patent number 11,061,065
- Issue date Jul 13, 2021
- Xcerra Corp.
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe head assembly for testing a wafer device under test
- Patent number 11,041,881
- Issue date Jun 22, 2021
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method
- Patent number 10,444,278
- Issue date Oct 15, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method
- Patent number 10,379,154
- Issue date Aug 13, 2019
- Xcerra Corporation
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Grant
Link socket sliding mount with preload
- Patent number 10,101,360
- Issue date Oct 16, 2018
- Xcerra Corporation
- Aaron Magnuson
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly and related methods
- Patent number 10,037,933
- Issue date Jul 31, 2018
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-bar unit for a test apparatus for circuit boards, and test ap...
- Patent number 9,989,583
- Issue date Jun 5, 2018
- Xcerra Corporation
- Victor Romanov
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly and related methods
- Patent number 9,875,954
- Issue date Jan 23, 2018
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe assembly and related methods
- Patent number 9,829,506
- Issue date Nov 28, 2017
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Wiring board for testing loaded printed circuit board
- Patent number 9,753,058
- Issue date Sep 5, 2017
- Xcerra Corporation
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Automated test platform for testing short circuits
- Patent number 9,720,032
- Issue date Aug 1, 2017
- Xcerra Corporation
- Wai-Kong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Heat dissipation system
- Patent number 9,554,486
- Issue date Jan 24, 2017
- Xcerra Corporation
- Anatoly Pikovsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test platform utilizing segmented data sequencers to prov...
- Patent number 9,459,978
- Issue date Oct 4, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable test platform in a PCI express environment with direct mem...
- Patent number 9,430,349
- Issue date Aug 30, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable test platform in a PCI express environment with direct mem...
- Patent number 9,430,348
- Issue date Aug 30, 2016
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit chip tester with an anti-rotation link
- Patent number 9,425,529
- Issue date Aug 23, 2016
- Xcerra Corporation
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit chip tester with embedded micro link
- Patent number 9,343,830
- Issue date May 17, 2016
- Xcerra Corporation
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scalable test platform
- Patent number 9,336,108
- Issue date May 10, 2016
- Xcerra Corporation
- William A. Fritzsche
- G07 - CHECKING-DEVICES
Information Patent Grant
Connector / cable assembly
- Patent number 9,297,830
- Issue date Mar 29, 2016
- Xcerra Corporation
- Richard McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Automated test platform utilizing status register polling with temp...
- Patent number 9,213,616
- Issue date Dec 15, 2015
- Xcerra Corporation
- William A. Fritzsche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit (IC) test socket with Faraday cage
- Patent number 9,188,605
- Issue date Nov 17, 2015
- Xcerra Corporation
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Grant
Distortion measurement and correction system and method
- Patent number 9,152,747
- Issue date Oct 6, 2015
- Xcerra Corporation
- Richard Liggiero
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE AND INTERFERENCE CONTROLLED ABSORPTIVE CONTACTOR
- Publication number 20230024755
- Publication date Jan 26, 2023
- XCERRA CORPORATION
- Yukang Feng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Calibration System
- Publication number 20220349937
- Publication date Nov 3, 2022
- XCERRA CORPORATION
- WILLIAM REID
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL PROBE
- Publication number 20220043029
- Publication date Feb 10, 2022
- XCERRA CORPORATION
- Yukang Feng
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY WITH ANTENNA AND RELATED METHODS
- Publication number 20210364547
- Publication date Nov 25, 2021
- XCERRA CORPORATION
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT
- Publication number 20210223285
- Publication date Jul 22, 2021
- XCERRA CORPORATION
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC RESONATING TEST CONTACTOR AND METHOD
- Publication number 20210190821
- Publication date Jun 24, 2021
- XCERRA CORPORATION
- James Hattis
- G01 - MEASURING TESTING
Information Patent Application
Capacitive Test Needle for Measuring Electrically Conductive Layers...
- Publication number 20200348359
- Publication date Nov 5, 2020
- XCERRA CORPORATION
- Stefan Weiss
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY WITH WAVEGUIDE ANTENNA PROBE
- Publication number 20200256908
- Publication date Aug 13, 2020
- XCERRA CORPORATION
- Dongmei Han
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
- Publication number 20200116759
- Publication date Apr 16, 2020
- XCERRA CORPORATION
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Application
HIGH FREQUENCY CIRCUIT WITH RADAR ABSORBING MATERIAL TERMINATION CO...
- Publication number 20200083582
- Publication date Mar 12, 2020
- XCERRA CORPORATION
- Jason Mroczkowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPRING-LOADED PROBE HAVING FOLDED PORTIONS AND PROBE ASSEMBLY
- Publication number 20200064373
- Publication date Feb 27, 2020
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
Testing device and method for testing a printed circuit board
- Publication number 20200011924
- Publication date Jan 9, 2020
- Xcerra Corp.
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Application
HYBRID PROBE HEAD ASSEMBLY FOR TESTING A WAFER DEVICE UNDER TEST
- Publication number 20190369142
- Publication date Dec 5, 2019
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
MULTI-NODE TESTING SYSTEM AND METHOD
- Publication number 20180128873
- Publication date May 10, 2018
- XCERRA CORPORATION
- Todor K. Petrov
- G01 - MEASURING TESTING
Information Patent Application
MULTI-NODE TESTING SYSTEM AND METHOD
- Publication number 20180128872
- Publication date May 10, 2018
- XCERRA CORPORATION
- Todor K. Petrov
- G01 - MEASURING TESTING
Information Patent Application
LINK SOCKET SLIDING MOUNT WITH PRELOAD
- Publication number 20180120348
- Publication date May 3, 2018
- XCERRA CORPORATION
- Aaron Magnuson
- G01 - MEASURING TESTING
Information Patent Application
COMPACT TESTING SYSTEM
- Publication number 20180095110
- Publication date Apr 5, 2018
- XCERRA CORPORATION
- BENJAMIN BROWN
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
- Publication number 20180096917
- Publication date Apr 5, 2018
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20180080978
- Publication date Mar 22, 2018
- XCERRA CORPORATION
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Application
TESTING SYSTEM AND METHOD
- Publication number 20180080979
- Publication date Mar 22, 2018
- XCERRA CORPORATION
- Benjamin Brown
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST PLATFORM
- Publication number 20160291057
- Publication date Oct 6, 2016
- XCERRA CORPORATION
- Wai-Kong Chen
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
- Publication number 20150369840
- Publication date Dec 24, 2015
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM AND METHOD
- Publication number 20150316614
- Publication date Nov 5, 2015
- XCERRA CORPORATION
- TODOR K. PETROV
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM AND METHOD
- Publication number 20150316608
- Publication date Nov 5, 2015
- XCERRA CORPORATION
- TODOR K. PETROV
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM AND METHOD
- Publication number 20150316610
- Publication date Nov 5, 2015
- XCERRA CORPORATION
- TODOR K. PETROV
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM AND METHOD
- Publication number 20150316611
- Publication date Nov 5, 2015
- XCERRA CORPORATION
- TODOR K. PETROV
- G01 - MEASURING TESTING
Information Patent Application
DEBUGGING SYSTEM AND METHOD
- Publication number 20150316609
- Publication date Nov 5, 2015
- XCERRA CORPORATION
- TODOR K. PETROV
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE ASSEMBLY AND RELATED METHODS
- Publication number 20150070040
- Publication date Mar 12, 2015
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD
- Publication number 20150054539
- Publication date Feb 26, 2015
- XCERRA CORPORATION
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
DISTORTION MEASUREMENT AND CORRECTION SYSTEM AND METHOD
- Publication number 20150042402
- Publication date Feb 12, 2015
- LTX-Credence Corporation
- RICHARD LIGGIERO
- G06 - COMPUTING CALCULATING COUNTING

Trademarklast 30 trademarks

Information Trademark
86947425 - XCERRA
- Serial number 86947425
- Registration number 5541458
- Filing date Mar 21, 2016
- XCERRA CORPORATION
- 7 - Machines and machine tools
Information Trademark
86789699 - ACCORDION
- Serial number 86789699
- Registration number 5277017
- Filing date Oct 15, 2015
- XCERRA CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86225658 - XCERRA
- Serial number 86225658
- Registration number 5513948
- Filing date Mar 19, 2014
- LTX-Credence Corporation
- 7 - Machines and machine tools
Information Trademark
86222472 - XCERRA
- Serial number 86222472
- Registration number 5513947
- Filing date Mar 16, 2014
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85500342 - LTXC
- Serial number 85500342
- Registration number 4215510
- Filing date Dec 20, 2011
- LTX-Credence Corporation
- 37 - Building construction
Information Trademark
77955745 - LTX-CREDENCE
- Serial number 77955745
- Registration number 3946845
- Filing date Mar 10, 2010
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77955761 - LTX CREDENCE
- Serial number 77955761
- Registration number 3946846
- Filing date Mar 10, 2010
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77955772 - XC
- Serial number 77955772
- Registration number 4029508
- Filing date Mar 10, 2010
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77955788 - I M A
- Serial number 77955788
- Registration number 4003369
- Filing date Mar 10, 2010
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77952097 - LTXC
- Serial number 77952097
- Filing date Mar 5, 2010
- LTX-Credence Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75408003 - FUSION
- Serial number 75408003
- Registration number 2263729
- Filing date Dec 18, 1997
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74217805 - LTX
- Serial number 74217805
- Registration number 1742873
- Filing date Nov 1, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74217835 - LTX
- Serial number 74217835
- Registration number 1742874
- Filing date Nov 1, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74178442 - FASTMATH
- Serial number 74178442
- Filing date Jun 21, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74176712 - ENVISION
- Serial number 74176712
- Filing date Jun 17, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74176714 - HIPER
- Serial number 74176714
- Registration number 1799983
- Filing date Jun 17, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74176746 - SIGNALGUARD
- Serial number 74176746
- Filing date Jun 17, 1991
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73668644 - EZ NET
- Serial number 73668644
- Registration number 1564210
- Filing date Jun 25, 1987
- LTX CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

LTX CORPORATION, A CORP. OF MASSACHUSETTS

Organization

Ticker Symbols

Business Address

Mailing Address

State Location

State of Incorporation

Patents Grantslast 30 patents

Dielectric resonating test contactor and method

Coaxial probe

Calibration system

Test socket assembly with antenna and related methods

System and method for attenuating and/or terminating RF circuit

Test socket assembly with waveguide antenna probe

Spring-loaded probe having folded portions and probe assembly

Test socket assembly and related methods

Testing device and method for testing a printed circuit board

Hybrid probe head assembly for testing a wafer device under test

Testing system and method

Testing system and method

Link socket sliding mount with preload

Test socket assembly and related methods

Cross-bar unit for a test apparatus for circuit boards, and test ap...

Test socket assembly and related methods

Test probe assembly and related methods

Wiring board for testing loaded printed circuit board

Automated test platform for testing short circuits

Heat dissipation system

Automated test platform utilizing segmented data sequencers to prov...

Scalable test platform in a PCI express environment with direct mem...

Scalable test platform in a PCI express environment with direct mem...

Integrated circuit chip tester with an anti-rotation link

Integrated circuit chip tester with embedded micro link

Scalable test platform

Connector / cable assembly

Automated test platform utilizing status register polling with temp...

Integrated circuit (IC) test socket with Faraday cage

Distortion measurement and correction system and method

Patents Applicationslast 30 patents

REFLECTIVE AND INTERFERENCE CONTROLLED ABSORPTIVE CONTACTOR

Calibration System

COAXIAL PROBE

TEST SOCKET ASSEMBLY WITH ANTENNA AND RELATED METHODS

SYSTEM AND METHOD FOR ATTENUATING AND/OR TERMINATING RF CIRCUIT

DIELECTRIC RESONATING TEST CONTACTOR AND METHOD

Capacitive Test Needle for Measuring Electrically Conductive Layers...

TEST SOCKET ASSEMBLY WITH WAVEGUIDE ANTENNA PROBE

TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION

HIGH FREQUENCY CIRCUIT WITH RADAR ABSORBING MATERIAL TERMINATION CO...

SPRING-LOADED PROBE HAVING FOLDED PORTIONS AND PROBE ASSEMBLY

Testing device and method for testing a printed circuit board

HYBRID PROBE HEAD ASSEMBLY FOR TESTING A WAFER DEVICE UNDER TEST

MULTI-NODE TESTING SYSTEM AND METHOD

MULTI-NODE TESTING SYSTEM AND METHOD

LINK SOCKET SLIDING MOUNT WITH PRELOAD

COMPACT TESTING SYSTEM

TEST SOCKET ASSEMBLY AND RELATED METHODS

TESTING SYSTEM AND METHOD

TESTING SYSTEM AND METHOD

AUTOMATED TEST PLATFORM

TEST SOCKET ASSEMBLY AND RELATED METHODS

DEBUGGING SYSTEM AND METHOD

DEBUGGING SYSTEM AND METHOD

DEBUGGING SYSTEM AND METHOD

DEBUGGING SYSTEM AND METHOD

DEBUGGING SYSTEM AND METHOD

TEST PROBE ASSEMBLY AND RELATED METHODS

WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD

DISTORTION MEASUREMENT AND CORRECTION SYSTEM AND METHOD

Trademarklast 30 trademarks

86947425 - XCERRA

86789699 - ACCORDION

86225658 - XCERRA

86222472 - XCERRA

85500342 - LTXC

77955745 - LTX-CREDENCE

77955761 - LTX CREDENCE

77955772 - XC

77955788 - I M A

77952097 - LTXC