MICROINSPECTION, INC.

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SEOUL, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for inspecting illumination of lighting micro led
- Patent number 11,624,771
- Issue date Apr 11, 2023
- Microinspection, Inc.
- Tak Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method of circuit substrate
- Patent number 8,072,600
- Issue date Dec 6, 2011
- Microinspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact type apparatus for testing open and short circuits of a...
- Patent number 7,746,086
- Issue date Jun 29, 2010
- Microinspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Grant
Contact type single side probe device and apparatus and method for...
- Patent number 7,629,796
- Issue date Dec 8, 2009
- Microinspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Grant
Authentication method using cellular phone in internet
- Patent number 7,447,784
- Issue date Nov 4, 2008
- MicroInspection, Inc.
- Tak Eun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Steerable inline skate
- Patent number 7,104,549
- Issue date Sep 12, 2006
- Microinspection Inc.
- Tak Eun
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Inspection apparatus and method adapted to a scanning technique emp...
- Patent number 6,753,684
- Issue date Jun 22, 2004
- MicroInspection, Inc.
- Tak Eun
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Apparatus for Inspecting Illumination of Lighting Micro LED
- Publication number 20220390503
- Publication date Dec 8, 2022
- MICROINSPECTION, INC.
- Tak EUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER PROCESSING APPARATUS
- Publication number 20160001397
- Publication date Jan 7, 2016
- MICROINSPECTION, INC.
- Tak EUN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Inspection method of circuit substrate
- Publication number 20100002232
- Publication date Jan 7, 2010
- MICROINSPECTION, INC.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Application
Noncontact type single side probe device and apparatus and method f...
- Publication number 20080018339
- Publication date Jan 24, 2008
- MICROINSPECTION, INC.
- Tak Eun
- G02 - OPTICS
Information Patent Application
Non-contact type single side probe structure
- Publication number 20080017508
- Publication date Jan 24, 2008
- MICROINSPECTION, INC.
- Tak Eun
- G01 - MEASURING TESTING
Information Patent Application
Contact type single side probe device and apparatus and method for...
- Publication number 20080018338
- Publication date Jan 24, 2008
- MICROINSPECTION, INC.
- Tak Eun
- G01 - MEASURING TESTING