The above and other objects, features and other advantages of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:
Hereinafter, a preferred embodiment of the present invention will be described with reference to accompanying drawings, in which like reference numerals designate like parts having practically the same functions as the conventional structure.
As shown in
Further, cables 100 are provided to pass through electrode contact holes 91 and guard contact holes 92. The probe electrodes 41 and 42 and the guard portion 50 interface with an inspection apparatus through the cables 100 such that the exciting and sensing are performed through the probe electrodes 41 and 42 and the guard portion 50 is electrically grounded.
In this case, the insulating films 61 and the conductive films 62 may be configured by stacking printed circuit boards (PCBs) or flexible printed circuit boards (FPCBs). In order to form the probe electrodes having finer lines, the insulating films 61 and the conductive films 62 may be formed by depositing thin films according to a semiconductor manufacturing process.
As shown in
As shown in
As shown in
In this case, the exciter electrode 41 and the sensor electrode 42 serving as probe electrodes may be thickened by repeatedly stacking the second layers 80.
Meanwhile, as shown in
As described above, in the non-contact type single side probe structure according to the present invention, a plurality of insulating films and a plurality of conductive films are repeatedly stacked, and the structure includes probe electrodes formed at an inner conductive film portion of the cross-section of the structure and a guard portion formed at an outer conductive film portion of the cross-section. Accordingly, it is possible to form the probe electrodes to have the thickness of the conductive films corresponding to a pitch of a pattern electrode, thereby detecting open and short circuit in a miniaturized pattern electrode.
Further, in the non-contact type single side probe structure according to the present invention, the cross-section used as a probe is spaced at a specified distance or further from the contact holes, thereby having a high resistance to noises.
Further, in the non-contact type single side probe structure according to the present invention the insulating films and the conductive films may be formed by depositing thin films according to a semiconductor manufacturing process. Thus, it can be applied to a miniaturized pattern electrode.
Although the preferred embodiment of the present invention has been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as disclosed in the accompanying claims.
Number | Date | Country | Kind |
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2006-068232 | Jul 2006 | KR | national |