MICROPROBE, CORP

Organization

GARDEN GROVE, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Probe skates for electrical testing of convex pad topologies
- Patent number RE46221
- Issue date Nov 29, 2016
- MicroProbe, Inc.
- January Kister
Information Patent Grant
Probes with high current carrying capability and laser machining me...
- Patent number 9,476,911
- Issue date Oct 25, 2016
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe bonding method having improved control of bonding material
- Patent number 9,250,266
- Issue date Feb 2, 2016
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Multiple contact probes
- Patent number 8,988,091
- Issue date Mar 24, 2015
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe retention arrangement
- Patent number 8,907,689
- Issue date Dec 9, 2014
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical guided layered probe
- Patent number 8,723,546
- Issue date May 13, 2014
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 8,415,963
- Issue date Apr 9, 2013
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 8,324,923
- Issue date Dec 4, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe bonding method having improved control of bonding material
- Patent number 8,230,593
- Issue date Jul 31, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe skates for electrical testing of convex pad topologies
- Patent number RE43503
- Issue date Jul 10, 2012
- MicroProbe, Inc.
- January Kister
- 324 - Electricity: measuring and testing
Information Patent Grant
Probes with offset arm and suspension structure
- Patent number 8,203,353
- Issue date Jun 19, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Knee probe having reduced thickness section for control of scrub mo...
- Patent number 8,111,080
- Issue date Feb 7, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 7,952,377
- Issue date May 31, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 7,944,224
- Issue date May 17, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probes with self-cleaning blunt skates for contacting conductive pads
- Patent number 7,759,949
- Issue date Jul 20, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Knee probe having increased scrub motion
- Patent number 7,733,101
- Issue date Jun 8, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical guided probe array providing sideways scrub motion
- Patent number 7,671,610
- Issue date Mar 2, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Low profile probe having improved mechanical scrub and reduced cont...
- Patent number 7,649,367
- Issue date Jan 19, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe array arranged to provide space transformation
- Patent number 7,514,948
- Issue date Apr 7, 2009
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe skates for electrical testing of convex pad topologies
- Patent number 7,436,192
- Issue date Oct 14, 2008
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe cards employing probes having retaining portions for potting...
- Patent number 7,417,447
- Issue date Aug 26, 2008
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Probe cards employing probes having retaining portions for potting...
- Patent number 7,345,492
- Issue date Mar 18, 2008
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Space transformers employing wire bonds for interconnections with f...
- Patent number 7,312,617
- Issue date Dec 25, 2007
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Freely deflecting knee probe with controlled scrub motion
- Patent number 7,148,709
- Issue date Dec 12, 2006
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Double acting spring probe
- Patent number 7,046,021
- Issue date May 16, 2006
- MicroProbe
- January Kister
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL
- Publication number 20120313621
- Publication date Dec 13, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE
- Publication number 20120313660
- Publication date Dec 13, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH HIGH CURRENT CARRYING CAPABILITY AND LASER MACHINING ME...
- Publication number 20120286816
- Publication date Nov 15, 2012
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONT...
- Publication number 20110273198
- Publication date Nov 10, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION
- Publication number 20110273199
- Publication date Nov 10, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE CONTACT PROBES
- Publication number 20110062978
- Publication date Mar 17, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBE RETENTION ARRANGEMENT
- Publication number 20110006796
- Publication date Jan 13, 2011
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE
- Publication number 20100289512
- Publication date Nov 18, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Knee Probe Having Reduced Thickness Section for Control of Scrub Mo...
- Publication number 20100182030
- Publication date Jul 22, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Layered Probes With Core
- Publication number 20100182031
- Publication date Jul 22, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical Guided Layered Probe
- Publication number 20100176832
- Publication date Jul 15, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Low Profile Probe Having Improved Mechanical Scrub and Reduced Cont...
- Publication number 20100109691
- Publication date May 6, 2010
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
Vertical Probe Array Arranged to Provide Space Transformation
- Publication number 20090201041
- Publication date Aug 13, 2009
- MicroProbe, Inc.
- January Kister
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
77008859 - VERTEX
- Serial number 77008859
- Filing date Sep 27, 2006
- MicroProbe., Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78823354 - µCANTILEVER
- Serial number 78823354
- Filing date Feb 25, 2006
- MicroProbe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78677984 - µBLADE
- Serial number 78677984
- Filing date Jul 25, 2005
- MicroProbe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78531789 - µBEAM
- Serial number 78531789
- Filing date Dec 13, 2004
- MicroProbe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78531795 - ENGINEERED WAFER PROBE
- Serial number 78531795
- Filing date Dec 13, 2004
- MicroProbe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

MICROPROBE, CORP

Organization

Patents Grantslast 30 patents

Probe skates for electrical testing of convex pad topologies

Probes with high current carrying capability and laser machining me...

Probe bonding method having improved control of bonding material

Multiple contact probes

Probe retention arrangement

Vertical guided layered probe

Low profile probe having improved mechanical scrub and reduced cont...

Vertical probe array arranged to provide space transformation

Probe bonding method having improved control of bonding material

Probe skates for electrical testing of convex pad topologies

Probes with offset arm and suspension structure

Knee probe having reduced thickness section for control of scrub mo...

Vertical probe array arranged to provide space transformation

Low profile probe having improved mechanical scrub and reduced cont...

Probes with self-cleaning blunt skates for contacting conductive pads

Knee probe having increased scrub motion

Vertical guided probe array providing sideways scrub motion

Low profile probe having improved mechanical scrub and reduced cont...

Vertical probe array arranged to provide space transformation

Probe skates for electrical testing of convex pad topologies

Probe cards employing probes having retaining portions for potting...

Probe cards employing probes having retaining portions for potting...

Space transformers employing wire bonds for interconnections with f...

Freely deflecting knee probe with controlled scrub motion

Double acting spring probe

Patents Applicationslast 30 patents

PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL

PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

PROBES WITH HIGH CURRENT CARRYING CAPABILITY AND LASER MACHINING ME...

LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONT...

VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION

MULTIPLE CONTACT PROBES

PROBE RETENTION ARRANGEMENT

PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

Knee Probe Having Reduced Thickness Section for Control of Scrub Mo...

Layered Probes With Core

Vertical Guided Layered Probe

Low Profile Probe Having Improved Mechanical Scrub and Reduced Cont...

Vertical Probe Array Arranged to Provide Space Transformation

Trademarklast 30 trademarks

77008859 - VERTEX

78823354 - µCANTILEVER

78677984 - µBLADE

78531789 - µBEAM

78531795 - ENGINEERED WAFER PROBE