Mirae Corporation

Organization

Ichon-shi, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for spinning test tray of in-line test handler and in-lin...
- Patent number 9,285,420
- Issue date Mar 15, 2016
- Mirae Corporation
- Kyung Tae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Carrier module for use in a handler and handler for handling packag...
- Patent number 8,026,516
- Issue date Sep 27, 2011
- Mirae Corporation
- Jung Ug An
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System for transferring test trays and a handler having same
- Patent number 7,880,461
- Issue date Feb 1, 2011
- Mirae Corporation
- Yong Sun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Test handler, method for loading and manufacturing packaged chips,...
- Patent number 7,876,089
- Issue date Jan 25, 2011
- Mirae Corporation
- Hee Rak Beom
- G01 - MEASURING TESTING
Information Patent Grant
Handler and process for testing a semiconductor chips using the han...
- Patent number 7,772,834
- Issue date Aug 10, 2010
- Mirae Corporation
- Jung Ug An
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing a flat fluorescent lamp
- Patent number 7,749,036
- Issue date Jul 6, 2010
- Mirae Corporation
- Chung-Soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat fluorescent lamp with improved capability of luminance and red...
- Patent number 7,659,657
- Issue date Feb 9, 2010
- Mirae Corporation
- Chung Soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feeder for surface mounting device
- Patent number 7,594,592
- Issue date Sep 29, 2009
- Mirae Corporation
- Ji Hyun Hwang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test tray and handler using the test tray
- Patent number 7,583,076
- Issue date Sep 1, 2009
- Mirae Corporation
- Yong Sun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Tray transferring apparatus with gripper mechanism
- Patent number 7,562,923
- Issue date Jul 21, 2009
- Mirae Corporation
- Jung Ug Han
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Handler for sorting packaged chips
- Patent number 7,557,565
- Issue date Jul 7, 2009
- Mirae Corporation
- Jong Tae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Mounting method of electronic components
- Patent number 7,549,221
- Issue date Jun 23, 2009
- Mirae Corporation
- Hyo Won Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Burn-in sorter and sorting method using the same
- Patent number 7,541,828
- Issue date Jun 2, 2009
- Mirae Corporation
- Byoung Woo Kim
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for transferring trays within a test handler
- Patent number 7,495,463
- Issue date Feb 24, 2009
- Mirae Corporation
- Jung Ug An
- G01 - MEASURING TESTING
Information Patent Grant
Transfer device of handler for testing semiconductor device
- Patent number 7,464,807
- Issue date Dec 16, 2008
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Socket assembly for testing semiconductor device
- Patent number 7,429,868
- Issue date Sep 30, 2008
- Mirae Corporation
- Chan Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Method for recognizing working position of a device transfer appara...
- Patent number 7,424,143
- Issue date Sep 9, 2008
- Mirae Corporation
- Hyun Joo Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Handler for testing semiconductor devices
- Patent number 7,408,338
- Issue date Aug 5, 2008
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing flat fluorescent lamp
- Patent number 7,381,111
- Issue date Jun 3, 2008
- Mirae Corporation
- Jae-Doo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas injection port structure of flat fluorescent lamp
- Patent number 7,352,128
- Issue date Apr 1, 2008
- Mirae Corporation
- Jae Doo Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat fluorescent lamp for display devices
- Patent number 7,339,313
- Issue date Mar 4, 2008
- Mirae Corporation
- Jae Doo Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
External electrode fluorescent lamp, backlight unit using the exter...
- Patent number 7,327,093
- Issue date Feb 5, 2008
- Mirae Corporation
- Jeong-Wook Hur
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for assembling substrates of planar fluorescent lamp
- Patent number 7,308,925
- Issue date Dec 18, 2007
- Mirae Corporation
- Jae Doo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sorting handler for burn-in tester
- Patent number 7,268,534
- Issue date Sep 11, 2007
- Mirae Corporation
- Seong Bong Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing USB memory and method thereof
- Patent number 7,257,747
- Issue date Aug 14, 2007
- Mirae Corporation
- Jae Myung Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Test tray for handler for testing semiconductor devices
- Patent number 7,253,653
- Issue date Aug 7, 2007
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Grant
Handler for testing semiconductor device
- Patent number 7,242,207
- Issue date Jul 10, 2007
- Mirae Corporation
- Chan Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for transferring semiconductor device in handler
- Patent number 7,226,270
- Issue date Jun 5, 2007
- Mirae Corporation
- Hyun Joo Hwang
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Index head in semicondcutor device test handler
- Patent number 7,225,531
- Issue date Jun 5, 2007
- Mirae Corporation
- Hyun Joo Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Handler for testing semiconductor devices
- Patent number 7,196,508
- Issue date Mar 27, 2007
- Mirae Corporation
- Chul Ho Ham
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST HANDLER FOR GRAPHICS CHIP
- Publication number 20250029200
- Publication date Jan 23, 2025
- Mirae Corporation
- Kyung Tae KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR SPINNING TEST TRAY OF IN-LINE TEST HANDLER AND IN-LIN...
- Publication number 20140203832
- Publication date Jul 24, 2014
- MIRAE CORPORATION
- Kyung Tae KIM
- G01 - MEASURING TESTING
Information Patent Application
CARRIER FOR CARRYING A PACKAGED CHIP AND HANDLER EQUIPPED WITH THE...
- Publication number 20080260976
- Publication date Oct 23, 2008
- MIRAE CORPORATION
- Kyoung Won Kang
- G01 - MEASURING TESTING
Information Patent Application
Carrier module for use in a handler and handler for handling packag...
- Publication number 20080121561
- Publication date May 29, 2008
- MIRAE CORPORATION
- Jung Ug An
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
PUSHING BLOCK AND AND A HANDLER WITH THE PUSHING BLOCK
- Publication number 20080074120
- Publication date Mar 27, 2008
- MIRAE CORPORATION
- Jung-ug AHN
- G01 - MEASURING TESTING
Information Patent Application
PICKER AND HEAD ASSEMBLY WITH THE PICKERS
- Publication number 20080075574
- Publication date Mar 27, 2008
- MIRAE CORPORATION
- Jung-ug AHN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HANDLER
- Publication number 20080071409
- Publication date Mar 20, 2008
- MIRAE CORPORATION
- Jung-ug AHN
- G01 - MEASURING TESTING
Information Patent Application
Carrier module and test tray for an upright-positionable packaged c...
- Publication number 20080012113
- Publication date Jan 17, 2008
- MIRAE CORPORATION
- Hae Jun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Handler for testing packaged chips
- Publication number 20080001145
- Publication date Jan 3, 2008
- MIRAE CORPORATION
- Sung Yong Chu
- G01 - MEASURING TESTING
Information Patent Application
Burn-in sorter and sorting method using the same
- Publication number 20070296448
- Publication date Dec 27, 2007
- MIRAE CORPORATION
- Byoung Woo Kim
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
Handler for sorting packaged chips
- Publication number 20070262769
- Publication date Nov 15, 2007
- MIRAE CORPORATION
- Jong Tae Kim
- G01 - MEASURING TESTING
Information Patent Application
Flat fluorescent lamp
- Publication number 20070247070
- Publication date Oct 25, 2007
- MIRAE CORPORATION
- Chung Soo Kim
- G02 - OPTICS
Information Patent Application
Handler for testing semiconductor devices
- Publication number 20070152655
- Publication date Jul 5, 2007
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Mounting method of electronic components
- Publication number 20060230610
- Publication date Oct 19, 2006
- MIRAE CORPORATION
- Hyo Won Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Handler for testing semiconductor devices
- Publication number 20060214655
- Publication date Sep 28, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Test tray for handler for testing semiconductor devices
- Publication number 20060192583
- Publication date Aug 31, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Sokcet assembly for testing semiconductor device
- Publication number 20060170412
- Publication date Aug 3, 2006
- MIRAE CORPORATION
- Chan Ho Park
- G01 - MEASURING TESTING
Information Patent Application
Transfer device of handler for testing semiconductor device
- Publication number 20060119345
- Publication date Jun 8, 2006
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
External electrode fluorescent lamp, backlight unit using the exter...
- Publication number 20060119283
- Publication date Jun 8, 2006
- Mirae Corporation
- Jeong-Wook Hur
- G02 - OPTICS
Information Patent Application
Method of manufacturing fluorescent lamp
- Publication number 20060084350
- Publication date Apr 20, 2006
- MIRAE CORPORTATION
- Jae-Doo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for producing upper plates of flat fluorescent lamps
- Publication number 20060059951
- Publication date Mar 23, 2006
- MIRAE CORPORATION
- Jae Doo Yoon
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Apparatus for assembling substrates of planar fluorescent lamp
- Publication number 20060063465
- Publication date Mar 23, 2006
- MIRAE CORPORATION
- Jae Doo Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas injection port structure of flat fluorescent lamp
- Publication number 20060061274
- Publication date Mar 23, 2006
- MIRAE CORPORATION
- Jae Doo Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Flat fluorescent lamp for display devices
- Publication number 20060043869
- Publication date Mar 2, 2006
- MIRAE CORPORATION
- Jae Doo Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for testing USB memory and method thereof
- Publication number 20050216811
- Publication date Sep 29, 2005
- MIRAE CORPORATION
- Jae Myung Song
- G01 - MEASURING TESTING
Information Patent Application
Carrier module
- Publication number 20050200000
- Publication date Sep 15, 2005
- MIRAE CORPORATION
- Chul Ho Ham
- G01 - MEASURING TESTING
Information Patent Application
Tray transferring apparatus
- Publication number 20050173446
- Publication date Aug 11, 2005
- MIRAE CORPORATION
- Jung Ug Han
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Sorting handler for burn-in tester
- Publication number 20050168214
- Publication date Aug 4, 2005
- MIRAE CORPORATION
- Seong Bong Kim
- G01 - MEASURING TESTING
Information Patent Application
Index head in semiconductor device test handler
- Publication number 20050155219
- Publication date Jul 21, 2005
- MIRAE CORPORATION
- Hyun Joo Hwang
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR SEATING SEMICONDUCTOR DEVICE IN SEMICONDUCTOR TEST HANDLER
- Publication number 20040251460
- Publication date Dec 16, 2004
- MIRAE CORPORATION
- Ki Hyun Lee
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
76388245 - M MIRAE
- Serial number 76388245
- Registration number 2942458
- Filing date Mar 26, 2002
- Mirae Corporation
- 7 - Machines and machine tools

Mirae Corporation

Organization

Patents Grantslast 30 patents

Apparatus for spinning test tray of in-line test handler and in-lin...

Carrier module for use in a handler and handler for handling packag...

System for transferring test trays and a handler having same

Test handler, method for loading and manufacturing packaged chips,...

Handler and process for testing a semiconductor chips using the han...

Method and apparatus for manufacturing a flat fluorescent lamp

Flat fluorescent lamp with improved capability of luminance and red...

Feeder for surface mounting device

Test tray and handler using the test tray

Tray transferring apparatus with gripper mechanism

Handler for sorting packaged chips

Mounting method of electronic components

Burn-in sorter and sorting method using the same

System and method for transferring trays within a test handler

Transfer device of handler for testing semiconductor device

Socket assembly for testing semiconductor device

Method for recognizing working position of a device transfer appara...

Handler for testing semiconductor devices

Method of manufacturing flat fluorescent lamp

Gas injection port structure of flat fluorescent lamp

Flat fluorescent lamp for display devices

External electrode fluorescent lamp, backlight unit using the exter...

Apparatus for assembling substrates of planar fluorescent lamp

Sorting handler for burn-in tester

Apparatus for testing USB memory and method thereof

Test tray for handler for testing semiconductor devices

Handler for testing semiconductor device

Apparatus for transferring semiconductor device in handler

Index head in semicondcutor device test handler

Handler for testing semiconductor devices

Patents Applicationslast 30 patents

TEST HANDLER FOR GRAPHICS CHIP

APPARATUS FOR SPINNING TEST TRAY OF IN-LINE TEST HANDLER AND IN-LIN...

CARRIER FOR CARRYING A PACKAGED CHIP AND HANDLER EQUIPPED WITH THE...

Carrier module for use in a handler and handler for handling packag...

PUSHING BLOCK AND AND A HANDLER WITH THE PUSHING BLOCK

PICKER AND HEAD ASSEMBLY WITH THE PICKERS

HANDLER

Carrier module and test tray for an upright-positionable packaged c...

Handler for testing packaged chips

Burn-in sorter and sorting method using the same

Handler for sorting packaged chips

Flat fluorescent lamp

Handler for testing semiconductor devices

Mounting method of electronic components

Handler for testing semiconductor devices

Test tray for handler for testing semiconductor devices

Sokcet assembly for testing semiconductor device

Transfer device of handler for testing semiconductor device

External electrode fluorescent lamp, backlight unit using the exter...

Method of manufacturing fluorescent lamp

System for producing upper plates of flat fluorescent lamps

Apparatus for assembling substrates of planar fluorescent lamp

Gas injection port structure of flat fluorescent lamp

Flat fluorescent lamp for display devices

Apparatus for testing USB memory and method thereof

Carrier module

Tray transferring apparatus

Sorting handler for burn-in tester

Index head in semiconductor device test handler

DEVICE FOR SEATING SEMICONDUCTOR DEVICE IN SEMICONDUCTOR TEST HANDLER

Trademarklast 30 trademarks

76388245 - M MIRAE