MPI Incorporated

Organization

Poughkeepsie, NY, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Optical detection system and laser light providing module without u...
- Patent number 11,906,571
- Issue date Feb 20, 2024
- MPI CORPORATION
- Chien-Yu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card and manufacturing method thereof
- Patent number 11,874,313
- Issue date Jan 16, 2024
- MPI CORPORATION
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board for semiconductor test
- Patent number 11,852,679
- Issue date Dec 26, 2023
- MPI Corporation
- Shih-Ching Chen
- G01 - MEASURING TESTING
Information Patent Grant
Trace embedded probe device
- Patent number 11,839,020
- Issue date Dec 5, 2023
- MPI Corporation
- Yu-Shan Hu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Chip chuck for supporting light emitting chip under optical inspect...
- Patent number 11,781,904
- Issue date Oct 10, 2023
- MPI Corporation
- Hung-I Lin
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head
- Patent number 11,774,468
- Issue date Oct 3, 2023
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card
- Patent number 11,733,267
- Issue date Aug 22, 2023
- MPI CORPORATION
- Che-Wei Lin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 11,656,271
- Issue date May 23, 2023
- MPI Corporation
- Yi-Hsuan Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing device under test
- Patent number D983681
- Issue date Apr 18, 2023
- MPI Corporation
- Tzu-Yang Chen
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Probe head and die set having horizontally fine adjustable die and...
- Patent number 11,619,656
- Issue date Apr 4, 2023
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and probe module thereof
- Patent number 11,585,832
- Issue date Feb 21, 2023
- MPI CORPORATION
- Chung-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly
- Patent number 11,543,430
- Issue date Jan 3, 2023
- MPI CORPORATION
- Ming-Hsiang Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus
- Patent number 11,536,765
- Issue date Dec 27, 2022
- MPI CORPORATION
- Kang-Yen Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing method for light emitting device
- Patent number 11,526,978
- Issue date Dec 13, 2022
- MPI Corporation
- Ping-Ying Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe head with linear probe
- Patent number 11,493,536
- Issue date Nov 8, 2022
- MPI Corporation
- Tzu-Yang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe device for impedance testing for circuit board
- Patent number 11,460,498
- Issue date Oct 4, 2022
- MPI Corporation
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Light emitting element detecting method and equipment
- Patent number 11,451,714
- Issue date Sep 20, 2022
- MPI Corporation
- Ping-Ying Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Positionable probe card and manufacturing method thereof
- Patent number 11,402,407
- Issue date Aug 2, 2022
- MPI CORPORATION
- Zhi-Wei Su
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection method and wafer probing system
- Patent number 11,353,501
- Issue date Jun 7, 2022
- MPI CORPORATION
- Lin-Lin Chih
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing method
- Patent number 11,348,221
- Issue date May 31, 2022
- MPI Corporation
- Chien-Yu Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection system
- Patent number 11,346,789
- Issue date May 31, 2022
- MPI Corporation
- Ping-Ying Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,346,860
- Issue date May 31, 2022
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe station capable of maintaining position of probe tip upon tem...
- Patent number 11,313,883
- Issue date Apr 26, 2022
- MPI CORPORATION
- Yu-Hsun Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Optical test equipment with heating function
- Patent number 11,293,973
- Issue date Apr 5, 2022
- MPI Corporation
- Wen Pin Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Method for compensating to distance between probe tip and device un...
- Patent number 11,287,475
- Issue date Mar 29, 2022
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station
- Patent number 11,262,401
- Issue date Mar 1, 2022
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus equipped with heating device for light emitting chip
- Patent number 11,162,996
- Issue date Nov 2, 2021
- MPI Corporation
- Wen Pin Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for high frequency signal test and medium or low frequen...
- Patent number 11,150,269
- Issue date Oct 19, 2021
- MPI Corporation
- Hui-Pin Yang
- G01 - MEASURING TESTING
Information Patent Grant
Probe head with linear probe
- Patent number 11,143,674
- Issue date Oct 12, 2021
- MPI Corporation
- Tzu Yang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Control method of touch display apparatus
- Patent number 11,144,198
- Issue date Oct 12, 2021
- MPI CORPORATION
- Chien-Hung Chen
- G06 - COMPUTING CALCULATING COUNTING

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Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20240118316
- Publication date Apr 11, 2024
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD HAVING SPRING PROBES
- Publication number 20240118313
- Publication date Apr 11, 2024
- MPI Corporation
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...
- Publication number 20240077519
- Publication date Mar 7, 2024
- MPI CORPORATION
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Application
MOTORIZED CHUCK STAGE CONTROLLING METHOD
- Publication number 20230314505
- Publication date Oct 5, 2023
- MPI Corporation
- Sebastian Giessmann
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WAFER INSPECTION SYSTEM AND ANNULAR SEAT THEREOF
- Publication number 20230251303
- Publication date Aug 10, 2023
- MPI Corporation
- YI-HSUAN CHENG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PATH CORRECTION SUBASSEMBLY, OPTICAL DETECTION ASSEMBLY, AN...
- Publication number 20230147804
- Publication date May 11, 2023
- MPI Corporation
- PO-YI TING
- G11 - INFORMATION STORAGE
Information Patent Application
PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF
- Publication number 20230065896
- Publication date Mar 2, 2023
- MPI Corporation
- Yi-Chien Tsai
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION SYSTEM AND ALIGNMENT METHOD FOR A PREDETERMINED T...
- Publication number 20230058964
- Publication date Feb 23, 2023
- MPI Corporation
- SEBASTIAN GIESSMANN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20230059740
- Publication date Feb 23, 2023
- MPI Corporation
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD
- Publication number 20230007997
- Publication date Jan 12, 2023
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE INSTALLATION CIRCUIT BOARD AND PROBE DEVICE FOR PROBE CARD
- Publication number 20220349919
- Publication date Nov 3, 2022
- MPI Corporation
- YU-SHAN HU
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR TEST
- Publication number 20220334178
- Publication date Oct 20, 2022
- MPI Corporation
- SHIH-CHING CHEN
- G01 - MEASURING TESTING
Information Patent Application
TRACE EMBEDDED PROBE DEVICE
- Publication number 20220312583
- Publication date Sep 29, 2022
- MPI Corporation
- Yu-Shan HU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION SYSTEM AND LASER LIGHT PROVIDING MODULE WITHOUT U...
- Publication number 20220299560
- Publication date Sep 22, 2022
- MPI Corporation
- CHIEN-YU CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20220299564
- Publication date Sep 22, 2022
- MPI Corporation
- YI-HSUAN CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...
- Publication number 20220214379
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME
- Publication number 20220214380
- Publication date Jul 7, 2022
- MPI Corporation
- CHIN-YI LIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND MANUFACTURING METHOD THEREOF
- Publication number 20220170961
- Publication date Jun 2, 2022
- MPI Corporation
- Chin-Yi Lin
- G01 - MEASURING TESTING
Information Patent Application
CHIP CHUCK AND CHIP SUPPORTING DEVICE FOR OPTICAL INSPECTION
- Publication number 20220170781
- Publication date Jun 2, 2022
- MPI Corporation
- HUNG-I LIN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD
- Publication number 20220155365
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING METHOD
- Publication number 20220155366
- Publication date May 19, 2022
- MPI CORPORATION
- Volker Hansel
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20220113334
- Publication date Apr 14, 2022
- MPI CORPORATION
- Chin-Yi Tsai
- G01 - MEASURING TESTING
Information Patent Application
MACRO AND MICRO INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20220074866
- Publication date Mar 10, 2022
- MPI Corporation
- CHEN-YANG TSAI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY
- Publication number 20220074970
- Publication date Mar 10, 2022
- MPI Corporation
- Ming-Hsiang Hsieh
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION
- Publication number 20220074972
- Publication date Mar 10, 2022
- MPI Corporation
- Yu-Hsun HSU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...
- Publication number 20220043027
- Publication date Feb 10, 2022
- MPI Corporation
- Yu-Chen HSU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF ALIGNING WAFER
- Publication number 20220005721
- Publication date Jan 6, 2022
- MPI Corporation
- Yung-Chin LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR COMPENSATING TO DISTANCE BETWEEN PROBE TIP AND DEVICE UN...
- Publication number 20210382108
- Publication date Dec 9, 2021
- MPI Corporation
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD WITH LINEAR PROBE
- Publication number 20210373048
- Publication date Dec 2, 2021
- MPI Corporation
- TZU-YANG CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING DISTANCE BETWEEN PROBE AND WAFER HELD BY WAFE...
- Publication number 20210333219
- Publication date Oct 28, 2021
- MPI Corporation
- Frank FEHRMANN
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
90154026 - PROBENIX
- Serial number 90154026
- Registration number 6572221
- Filing date Sep 2, 2020
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88071817 - WAFERWALLET
- Serial number 88071817
- Registration number 5952834
- Filing date Aug 9, 2018
- MPI CORPORATION
- 7 - Machines and machine tools
Information Trademark
87106807 - IMAG
- Serial number 87106807
- Registration number 5320341
- Filing date Jul 18, 2016
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86953401 - QALIBRIA
- Serial number 86953401
- Registration number 5211876
- Filing date Mar 25, 2016
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86953402 - SENTIO
- Serial number 86953402
- Registration number 5211877
- Filing date Mar 25, 2016
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86733281 - BRINGING TEMPERATURE TO YOUR TEST
- Serial number 86733281
- Registration number 5365435
- Filing date Aug 21, 2015
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86733284 - THERMALAIR
- Serial number 86733284
- Registration number 5028813
- Filing date Aug 21, 2015
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86293965 - QALIBRIA
- Serial number 86293965
- Filing date May 28, 2014
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86281743 - 3DS
- Serial number 86281743
- Registration number 5271515
- Filing date May 15, 2014
- MPI CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77420622 - MPI
- Serial number 77420622
- Registration number 3658964
- Filing date Mar 13, 2008
- MJC PROBE INCORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

MPI Incorporated

Organization

Patents Grantslast 30 patents

Optical detection system and laser light providing module without u...

Probe card and manufacturing method thereof

Circuit board for semiconductor test

Trace embedded probe device

Chip chuck for supporting light emitting chip under optical inspect...

Vertical probe head

Probe head and probe card

Wafer inspection system

Probe for testing device under test

Probe head and die set having horizontally fine adjustable die and...

Probe card and probe module thereof

Probe assembly

Probing apparatus

Image processing method for light emitting device

Probe head with linear probe

Adjustable probe device for impedance testing for circuit board

Light emitting element detecting method and equipment

Positionable probe card and manufacturing method thereof

Wafer inspection method and wafer probing system

Wafer testing method

Optical inspection system

Probe head for high frequency signal test and medium or low frequen...

Probe station capable of maintaining position of probe tip upon tem...

Optical test equipment with heating function

Method for compensating to distance between probe tip and device un...

Wafer probe station

Probing apparatus equipped with heating device for light emitting chip

Probe head for high frequency signal test and medium or low frequen...

Probe head with linear probe

Control method of touch display apparatus

Patents Applicationslast 30 patents

PROBE CARD AND MANUFACTURING METHOD THEREOF

PROBE HEAD HAVING SPRING PROBES

PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...

MOTORIZED CHUCK STAGE CONTROLLING METHOD

WAFER INSPECTION SYSTEM AND ANNULAR SEAT THEREOF

OPTICAL PATH CORRECTION SUBASSEMBLY, OPTICAL DETECTION ASSEMBLY, AN...

PROBE CARD AND WAFER TESTING ASSEMBLY THEREOF

OPTICAL DETECTION SYSTEM AND ALIGNMENT METHOD FOR A PREDETERMINED T...

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

VERTICAL PROBE HEAD

PROBE INSTALLATION CIRCUIT BOARD AND PROBE DEVICE FOR PROBE CARD

CIRCUIT BOARD FOR SEMICONDUCTOR TEST

TRACE EMBEDDED PROBE DEVICE

OPTICAL DETECTION SYSTEM AND LASER LIGHT PROVIDING MODULE WITHOUT U...

WAFER INSPECTION SYSTEM

PROBE HEAD AND DIE SET HAVING HORIZONTALLY FINE ADJUSTABLE DIE AND...

HEAT DISSIPATABLE DIE UNIT AND PROBE SEAT USING THE SAME

PROBE CARD AND MANUFACTURING METHOD THEREOF

CHIP CHUCK AND CHIP SUPPORTING DEVICE FOR OPTICAL INSPECTION

SEMICONDUCTOR INSPECTING METHOD FOR ENSURING SCRUBBING LENGTH ON PAD

SEMICONDUCTOR INSPECTING METHOD

PROBE CARD

MACRO AND MICRO INSPECTION APPARATUS AND INSPECTION METHOD

PROBE ASSEMBLY

PROBE STATION

PROBE MODULE HAVING MICROELECTROMECHANICAL PROBE AND METHOD OF MANU...

METHOD OF ALIGNING WAFER

METHOD FOR COMPENSATING TO DISTANCE BETWEEN PROBE TIP AND DEVICE UN...

PROBE HEAD WITH LINEAR PROBE

METHOD OF DETERMINING DISTANCE BETWEEN PROBE AND WAFER HELD BY WAFE...

Trademarklast 30 trademarks

90154026 - PROBENIX

88071817 - WAFERWALLET

87106807 - IMAG

86953401 - QALIBRIA

86953402 - SENTIO

86733281 - BRINGING TEMPERATURE TO YOUR TEST

86733284 - THERMALAIR

86293965 - QALIBRIA

86281743 - 3DS

77420622 - MPI