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MUTRONICS CO., LTD.
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Anseong-si, Gyeonggi-do, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Dual-band dual-polarized antenna radiation device
Patent number
12,021,310
Issue date
Jun 25, 2024
MUTRONICS CO., LTD
Seung-Mo Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Active phased array for performing dual-band and dual polarization
Patent number
12,021,308
Issue date
Jun 25, 2024
MUTRONICS CO., LTD
Seung-Mo Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radio altimeter
Patent number
10,310,070
Issue date
Jun 4, 2019
MUTRONICS CO., LTD.
Tae-Wook Lim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for processing signal by means of electromagnetic waves a...
Patent number
10,197,509
Issue date
Feb 5, 2019
MUTRONICS CO., LTD.
Seung-Mo Park
G01 - MEASURING TESTING
Information
Patent Grant
Radio altimeter
Patent number
10,036,807
Issue date
Jul 31, 2018
MUTRONICS CO., LTD.
Tae-Wook Lim
G01 - MEASURING TESTING
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Patents Applications
last 30 patents
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Patent Application
ACTIVE PHASED ARRAY ANTENNA
Publication number
20230327335
Publication date
Oct 12, 2023
MUTRONICS CO.,LTD
Seung-Mo PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACTIVE PHASED ARRAY FOR PERFORMING DUAL-BAND AND DUAL POLARIZATION
Publication number
20230307850
Publication date
Sep 28, 2023
MUTRONICS CO.,LTD
Seung-Mo PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DUAL-BAND DUAL-POLARIZED ANTENNA RADIATION DEVICE
Publication number
20230155303
Publication date
May 18, 2023
MUTRONICS CO.,LTD
Seung-Mo PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADIO ALTIMETER
Publication number
20180299542
Publication date
Oct 18, 2018
MUTRONICS CO., LTD.
Tae-Wook Lim
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR PROCESSING SIGNAL BY MEANS OF ELECTROMAGNETIC WAVES A...
Publication number
20170284946
Publication date
Oct 5, 2017
MUTRONICS CO., LTD
Seung-Mo PARK
G01 - MEASURING TESTING
Information
Patent Application
RADIO ALTIMETER
Publication number
20150145715
Publication date
May 28, 2015
MUTRONICS CO., LTD.
Tae-Wook Lim
G01 - MEASURING TESTING