NANOFACTORY INSTRUMENTS AB

Organization

Goteborg, SE

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Iterative feedback tuning in a scanning probe microscope
- Patent number 8,250,667
- Issue date Aug 21, 2012
- Nanofactory Instruments AB
- Krister Svensson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
MEMS nanoindenter
- Patent number 7,654,159
- Issue date Feb 2, 2010
- Nanofactory Instruments AB
- Peter Enoksson
- G01 - MEASURING TESTING
Information Patent Grant
Microfabricated cantilever chip
- Patent number 7,586,105
- Issue date Sep 8, 2009
- Nanofactory Instruments AB
- Kristian Molhave
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Measurement device for electron microscope
- Patent number 7,363,802
- Issue date Apr 29, 2008
- Nanofactory Instruments AB
- Håkan Olin
- G01 - MEASURING TESTING
Information Patent Grant
Device for reducing the impact of distortions in a microscope
- Patent number 6,924,489
- Issue date Aug 2, 2005
- Nanofactory Instruments AB
- Håkan Olin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micropositioning device
- Patent number 6,917,140
- Issue date Jul 12, 2005
- Nanofactory Instruments AB
- Håkan Olin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for increasing the measurement information available from a...
- Patent number 6,864,483
- Issue date Mar 8, 2005
- Nanofactory Instruments AB
- Håkan Olin
- G01 - MEASURING TESTING
Information Patent Grant
Device for micropositioning of an object
- Patent number 6,452,307
- Issue date Sep 17, 2002
- Nanofactory Instruments AB
- Hakan Olin
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Please log in for detailed analytics

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL PROBING IN ELECTRON MICROSCOPES
- Publication number 20120138792
- Publication date Jun 7, 2012
- NANOFACTORY INSTRUMENTS AB
- Andrey Danilov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE
- Publication number 20110016592
- Publication date Jan 20, 2011
- NANOFACTORY INSTRUMENTS AB
- Krister Svensson
- G01 - MEASURING TESTING
Information Patent Application
SAFE MOTION
- Publication number 20100230608
- Publication date Sep 16, 2010
- NANOFACTORY INSTRUMENTS AB
- Paul Bengtsson
- G01 - MEASURING TESTING
Information Patent Application
Mems Nanoindenter
- Publication number 20080276727
- Publication date Nov 13, 2008
- NANOFACTORY INSTRUMENTS AB
- Peter Enoksson
- G01 - MEASURING TESTING

NANOFACTORY INSTRUMENTS AB

Organization

Patents Grantslast 30 patents

Iterative feedback tuning in a scanning probe microscope

MEMS nanoindenter

Microfabricated cantilever chip

Measurement device for electron microscope

Device for reducing the impact of distortions in a microscope

Micropositioning device

Method for increasing the measurement information available from a...

Device for micropositioning of an object

Patents Applicationslast 30 patents

OPTICAL PROBING IN ELECTRON MICROSCOPES

ITERATIVE FEEDBACK TUNING IN A SCANNING PROBE MICROSCOPE

SAFE MOTION

Mems Nanoindenter