NPTEST, INC.

Organization

SAN JOSE, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Pin electronics interface circuit
- Patent number 6,940,271
- Issue date Sep 6, 2005
- NPTest, Inc.
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Grant
Measuring back-side voltage of an integrated circuit
- Patent number 6,872,581
- Issue date Mar 29, 2005
- NPTest, Inc.
- Christopher Shaw
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for forming a cavity in a semiconductor substr...
- Patent number 6,855,622
- Issue date Feb 15, 2005
- NPTest, LLC
- Erwan Le Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open-loop for waveform acquisition
- Patent number 6,853,941
- Issue date Feb 8, 2005
- NPTest, Inc.
- Hui Wang
- G01 - MEASURING TESTING
Information Patent Grant
Comparator circuit for differential swing comparison and common-mod...
- Patent number 6,822,435
- Issue date Nov 23, 2004
- NPTest Inc.
- Toshihiro Nomura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for socket calibration of integrated circuit t...
- Patent number 6,794,861
- Issue date Sep 21, 2004
- NPTest, LLC
- Howard M. Maassen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accessing internal nodes of an integrated...
- Patent number 6,781,218
- Issue date Aug 24, 2004
- NPTest, Inc.
- Kenneth Wilsher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method and apparatus for source synchronous signals
- Patent number 6,775,637
- Issue date Aug 10, 2004
- NPTest, LLC
- Rodolfo F. Garcia
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for contacting device with delicate light-tran...
- Patent number 6,760,223
- Issue date Jul 6, 2004
- NPTest, Inc.
- Gary A. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Scan stream sequencing for testing integrated circuits
- Patent number 6,748,564
- Issue date Jun 8, 2004
- NPTest, LLC
- Jamie S. Cullen
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system and methodology
- Patent number 6,744,267
- Issue date Jun 1, 2004
- NPTest, LLC
- Frank M. Sauk
- G01 - MEASURING TESTING
Information Patent Grant
Photoconductive-sampling voltage measurement
- Patent number 6,737,853
- Issue date May 18, 2004
- NPTest, LLC
- Kenneth R. Wilsher
- G01 - MEASURING TESTING
Information Patent Grant
Method for global die thinning and polishing of flip-chip packaged...
- Patent number 6,672,947
- Issue date Jan 6, 2004
- NPTest, LLC
- Chun-Cheng Tsao
- B24 - GRINDING POLISHING
Information Patent Grant
Measuring jitter of high-speed data channels
- Patent number 6,661,836
- Issue date Dec 9, 2003
- NPTest, LLP
- Wajih Dalal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Compact, high collection efficiency scintillator for secondary elec...
- Patent number 6,630,667
- Issue date Oct 7, 2003
- NPTest, LLC
- Li Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge placement and jitter measurement for electronic elements
- Patent number 6,622,107
- Issue date Sep 16, 2003
- NPTest LLC
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Grant
Test system and associated interface module
- Patent number 6,522,162
- Issue date Feb 18, 2003
- NPTest, Inc.
- Gary W. Griffin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sub-resolution alignment of images
- Publication number 20050044519
- Publication date Feb 24, 2005
- NPTEST, LLC, a Delaware corporation
- Madhumita Sengupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pin electronics interface circuit
- Publication number 20050024041
- Publication date Feb 3, 2005
- NPTest, Inc., a Delaware corporation
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Application
Very small pin count IC tester
- Publication number 20040187049
- Publication date Sep 23, 2004
- NPTEST, INC.
- Burnell G. West
- G01 - MEASURING TESTING
Information Patent Application
Method for surface preparation to enable uniform etching of polycry...
- Publication number 20040084407
- Publication date May 6, 2004
- NPTEST, INC.
- Vladimir V. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for surface preparation to enable uniform etching of polycry...
- Publication number 20040084408
- Publication date May 6, 2004
- NPTEST, INC.
- Vladimir V. Makarov
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
78324859 - IDS OPTICA
- Serial number 78324859
- Registration number 2913110
- Filing date Nov 7, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78270229 - NP NPTEST
- Serial number 78270229
- Registration number 2879425
- Filing date Jul 3, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78257201 - NPOWER
- Serial number 78257201
- Filing date Jun 2, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78257198 - XTOS
- Serial number 78257198
- Registration number 2936978
- Filing date Jun 2, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78244106 - NP PLATFORM
- Serial number 78244106
- Filing date Apr 30, 2003
- NPTest Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78244117 - SAPPHIRE NP
- Serial number 78244117
- Filing date Apr 30, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78201707 - NPTEST
- Serial number 78201707
- Filing date Jan 9, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78201756 - OPTIFIB
- Serial number 78201756
- Filing date Jan 9, 2003
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78188755 - OPTICA
- Serial number 78188755
- Filing date Nov 25, 2002
- NPtest, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78175606 - ISOCHRONOUS FABRIC INTERFACE
- Serial number 78175606
- Registration number 2936802
- Filing date Oct 17, 2002
- NP Test, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76446026 - NPTEST
- Serial number 76446026
- Registration number 2736418
- Filing date Aug 29, 2002
- NPtest, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
76340932 - NXGENSUPPORT
- Serial number 76340932
- Registration number 2870056
- Filing date Nov 23, 2001
- SCHLUMBERGER TECHNOLOGIES, INC.
- 37 - Building construction

NPTEST, INC.

Organization

Patents Grantslast 30 patents

Pin electronics interface circuit

Measuring back-side voltage of an integrated circuit

Method and apparatus for forming a cavity in a semiconductor substr...

Open-loop for waveform acquisition

Comparator circuit for differential swing comparison and common-mod...

Method and apparatus for socket calibration of integrated circuit t...

Method and apparatus for accessing internal nodes of an integrated...

Test method and apparatus for source synchronous signals

Apparatus and method for contacting device with delicate light-tran...

Scan stream sequencing for testing integrated circuits

Test system and methodology

Photoconductive-sampling voltage measurement

Method for global die thinning and polishing of flip-chip packaged...

Measuring jitter of high-speed data channels

Compact, high collection efficiency scintillator for secondary elec...

Edge placement and jitter measurement for electronic elements

Test system and associated interface module

Patents Applicationslast 30 patents

Sub-resolution alignment of images

Pin electronics interface circuit

Very small pin count IC tester

Method for surface preparation to enable uniform etching of polycry...

Method for surface preparation to enable uniform etching of polycry...

Trademarklast 30 trademarks

78324859 - IDS OPTICA

78270229 - NP NPTEST

78257201 - NPOWER

78257198 - XTOS

78244106 - NP PLATFORM

78244117 - SAPPHIRE NP

78201707 - NPTEST

78201756 - OPTIFIB

78188755 - OPTICA

78175606 - ISOCHRONOUS FABRIC INTERFACE

76446026 - NPTEST

76340932 - NXGENSUPPORT