OMNIPROBE, INC

Organization

CONCORD, MA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number RE46350
- Issue date Mar 28, 2017
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
Information Patent Grant
Total release method for sample extraction in an energetic-beam ins...
- Patent number 9,349,573
- Issue date May 24, 2016
- Omniprobe, Inc.
- Rocky Kruger
- G01 - MEASURING TESTING
Information Patent Grant
Gas injection system for energetic-beam instruments
- Patent number 9,097,625
- Issue date Aug 4, 2015
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for processing samples held by a nanomanipulator
- Patent number 8,759,765
- Issue date Jun 24, 2014
- Omniprobe, Inc.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for extracting frozen specimens and manufacture of specimen...
- Patent number 8,513,622
- Issue date Aug 20, 2013
- Omniprobe, Inc.
- Cheryl Hartfield
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for precursor delivery system for irradiation beam instru...
- Patent number 8,512,474
- Issue date Aug 20, 2013
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for acquiring simultaneous and overlapping opt...
- Patent number 8,440,969
- Issue date May 14, 2013
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for precursor delivery system for irradiation...
- Patent number 8,394,454
- Issue date Mar 12, 2013
- Omniprobe, Inc.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for preparing specimens for atom probe analysis and specimen...
- Patent number 8,288,740
- Issue date Oct 16, 2012
- Omniprobe, Inc.
- Gonzalo Amador
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,247,768
- Issue date Aug 21, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method for stem sample inspection in a charged particle beam instru...
- Patent number 8,168,949
- Issue date May 1, 2012
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Multiple magnification optical system with single objective lens
- Patent number 8,054,558
- Issue date Nov 8, 2011
- Omniprobe, Inc.
- Herschel M. Marchman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Single-channel optical processing system for energetic-beam microsc...
- Patent number 7,961,397
- Issue date Jun 14, 2011
- Omniprobe, Inc.
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for STEM sample inspection in a charged particle beam instru...
- Patent number 7,834,315
- Issue date Nov 16, 2010
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method for automated stress testing of flip-chip packages
- Patent number 7,755,372
- Issue date Jul 13, 2010
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transfer of samples in a controlled enviro...
- Patent number 7,644,637
- Issue date Jan 12, 2010
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for automated stress testing of flip-chip pack...
- Patent number 7,446,542
- Issue date Nov 4, 2008
- Omniprobe, Inc.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the automated process of in-situ lift-out
- Patent number 7,414,252
- Issue date Aug 19, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Strain detection for automated nano-manipulation
- Patent number 7,395,727
- Issue date Jul 8, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for in-situ probe tip replacement inside a cha...
- Patent number 7,381,971
- Issue date Jun 3, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing a sample for examination in a TEM
- Patent number 7,315,023
- Issue date Jan 1, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of detecting probe tip contact with a surface
- Patent number 7,208,724
- Issue date Apr 24, 2007
- Omniprobe, Inc.
- Thomas Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kit for preparing a tem sample holder
- Patent number 7,126,133
- Issue date Oct 24, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for preparing a TEM sample holder
- Patent number 7,126,132
- Issue date Oct 24, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM sample holder
- Patent number 7,115,882
- Issue date Oct 3, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for rapid sample preparation in a focused ion...
- Patent number 7,053,383
- Issue date May 30, 2006
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method for manipulating microscopic particles and analyzing
- Patent number 6,777,674
- Issue date Aug 17, 2004
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Total release method for sample extraction from a charged-particle...
- Patent number 6,570,170
- Issue date May 27, 2003
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Method for sample separation and lift-out with one cut
- Patent number 6,420,722
- Issue date Jul 16, 2002
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING
- Publication number 20160189929
- Publication date Jun 30, 2016
- OMNIPROBE, INC.
- Matt Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS
- Publication number 20140014742
- Publication date Jan 16, 2014
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN...
- Publication number 20130091875
- Publication date Apr 18, 2013
- OMNIPROBE, INC.
- Cheryl Hartfield
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR
- Publication number 20130037713
- Publication date Feb 14, 2013
- OMNIPROBE, INC.
- Cheryl D. Hartfield
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRU...
- Publication number 20130025536
- Publication date Jan 31, 2013
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...
- Publication number 20120025075
- Publication date Feb 2, 2012
- OMNIPROBE, INC.
- Thomas M. Moore
- G02 - OPTICS
Information Patent Application
APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INS...
- Publication number 20110204226
- Publication date Aug 25, 2011
- OMNIPROBE, INC.
- Gonzalo Amador
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031396
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20110031397
- Publication date Feb 10, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHAR...
- Publication number 20110017927
- Publication date Jan 27, 2011
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUM...
- Publication number 20110017922
- Publication date Jan 27, 2011
- OMNIPROBE, INC.
- Gonzalo Amador
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE MAGNIFICATION OPTICAL SYSTEM WITH SINGLE OBJECTIVE LENS
- Publication number 20100202042
- Publication date Aug 12, 2010
- OMNIPROBE, INC.
- Herschel M. Marchman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY
- Publication number 20100200546
- Publication date Aug 12, 2010
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENE...
- Publication number 20100068408
- Publication date Mar 18, 2010
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSC...
- Publication number 20100051802
- Publication date Mar 4, 2010
- OMNIPROBE, INC.
- Herschel M. Marchman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT
- Publication number 20100025580
- Publication date Feb 4, 2010
- OMNIPROBE, INC.
- Matthew Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Preparing Specimens for Atom Probe Analysis and Specimen...
- Publication number 20090320624
- Publication date Dec 31, 2009
- OMNIPROBE, INC.
- Gonzalo Amador
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF FORMING TEM SAMPLE HOLDER
- Publication number 20090294690
- Publication date Dec 3, 2009
- OMNIPROBE, INC.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION...
- Publication number 20090223451
- Publication date Sep 10, 2009
- OMNIPROBE, INC.
- Rocky Kruger
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR AUTOMATED STRESS TESTING OF FLIP-CHIP PACKAGES
- Publication number 20090015274
- Publication date Jan 15, 2009
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...
- Publication number 20080258056
- Publication date Oct 23, 2008
- OMNIPROBE, INC.
- Lyudmila Zaykova-Feldman
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
86814042 - OMNIGIS
- Serial number 86814042
- Registration number 5101761
- Filing date Nov 9, 2015
- Oxford Instruments Nanotechnology ToolsLimited
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85477529 - SHORT-CUT
- Serial number 85477529
- Registration number 4182463
- Filing date Nov 21, 2011
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85349235 - SMARTGIS
- Serial number 85349235
- Filing date Jun 17, 2011
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85337330 - SHORT-CUT
- Serial number 85337330
- Registration number 4104809
- Filing date Jun 3, 2011
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77815237 - OMNIGIS
- Serial number 77815237
- Registration number 3777388
- Filing date Aug 28, 2009
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77770914 - AUTOPROBE
- Serial number 77770914
- Registration number 3744560
- Filing date Jun 30, 2009
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77524782 - OMNIPROBE
- Serial number 77524782
- Registration number 3594330
- Filing date Jul 17, 2008
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76074317 - OMNIPROBE
- Serial number 76074317
- Registration number 2577420
- Filing date Jun 21, 2000
- Omniprobe, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

NSF Awardslast 12 months

processing...

Count: 3

NSF Awards

Information NSF Award
SBIR Phase II: Photon Enhanced SEM (Scanning Electron Microscopes)...
- Award Id 0956765
- Effective date Feb 15, 2010
Information NSF Award
SBIR Phase I: Instrumentation for In-situ CLEM (Correlated Light an...
- Award Id 0945896
- Effective date Jan 1, 2010
Information NSF Award
SBIR Phase I: Photon Enhanced SEM Platform for Nano-Manufacturing
- Award Id 0839497
- Effective date Jan 1, 2009

OMNIPROBE, INC

Organization

Patents Grantslast 30 patents

Method for stem sample inspection in a charged particle beam instru...

Total release method for sample extraction in an energetic-beam ins...

Gas injection system for energetic-beam instruments

Method for processing samples held by a nanomanipulator

Method for extracting frozen specimens and manufacture of specimen...

Apparatus for precursor delivery system for irradiation beam instru...

Method and apparatus for acquiring simultaneous and overlapping opt...

Method and apparatus for precursor delivery system for irradiation...

Method for preparing specimens for atom probe analysis and specimen...

Method for stem sample inspection in a charged particle beam instru...

Method for stem sample inspection in a charged particle beam instru...

Multiple magnification optical system with single objective lens

Single-channel optical processing system for energetic-beam microsc...

Method for STEM sample inspection in a charged particle beam instru...

Method for automated stress testing of flip-chip packages

Method and apparatus for transfer of samples in a controlled enviro...

Apparatus and method for automated stress testing of flip-chip pack...

Method and apparatus for the automated process of in-situ lift-out

Strain detection for automated nano-manipulation

Method and apparatus for in-situ probe tip replacement inside a cha...

Method of preparing a sample for examination in a TEM

Apparatus and method of detecting probe tip contact with a surface

Kit for preparing a tem sample holder

Apparatus for preparing a TEM sample holder

TEM sample holder

Method and apparatus for rapid sample preparation in a focused ion...

Method for manipulating microscopic particles and analyzing

Total release method for sample extraction from a charged-particle...

Method for sample separation and lift-out with one cut

Patents Applicationslast 30 patents

RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING

GAS INJECTION SYSTEM FOR ENERGETIC-BEAM INSTRUMENTS

METHOD FOR EXTRACTING FROZEN SPECIMENS AND MANUFACTURE OF SPECIMEN...

METHOD FOR PROCESSING SAMPLES HELD BY A NANOMANIPULATOR

APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION BEAM INSTRU...

METHOD AND APPARATUS FOR ACQUIRING SIMULTANEOUS AND OVERLAPPING OPT...

APPARATUS FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INS...

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

METHOD AND APPARATUS FOR THE MONITORING OF SAMPLE MILLING IN A CHAR...

VARIABLE-TILT TEM SPECIMEN HOLDER FOR CHARGED-PARTICLE BEAM INSTRUM...

MULTIPLE MAGNIFICATION OPTICAL SYSTEM WITH SINGLE OBJECTIVE LENS

METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY

METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENE...

SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSC...

GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT

Method for Preparing Specimens for Atom Probe Analysis and Specimen...

METHOD OF FORMING TEM SAMPLE HOLDER

METHOD AND APPARATUS FOR PRECURSOR DELIVERY SYSTEM FOR IRRADIATION...

METHOD FOR AUTOMATED STRESS TESTING OF FLIP-CHIP PACKAGES

METHOD FOR STEM SAMPLE INSPECTION IN A CHARGED PARTICLE BEAM INSTRU...

Trademarklast 30 trademarks

86814042 - OMNIGIS

85477529 - SHORT-CUT

85349235 - SMARTGIS

85337330 - SHORT-CUT

77815237 - OMNIGIS

77770914 - AUTOPROBE

77524782 - OMNIPROBE

76074317 - OMNIPROBE

NSF Awardslast 12 months

NSF Awards

SBIR Phase II: Photon Enhanced SEM (Scanning Electron Microscopes)...

SBIR Phase I: Instrumentation for In-situ CLEM (Correlated Light an...

SBIR Phase I: Photon Enhanced SEM Platform for Nano-Manufacturing