ONE TEST SYSTEMS

Organization

Santa Clara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Chip testing apparatus
- Patent number 11,630,148
- Issue date Apr 18, 2023
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Temperature adjusting device
- Patent number 11,624,776
- Issue date Apr 11, 2023
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing system
- Patent number 11,435,396
- Issue date Sep 6, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 11,428,711
- Issue date Aug 30, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressing assembly and chip testing apparatus
- Patent number 11,366,136
- Issue date Jun 21, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip tray kit and chip testing apparatus
- Patent number 11,366,159
- Issue date Jun 21, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing device and chip testing system for testing memory chips
- Patent number 11,366,155
- Issue date Jun 21, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip testing system for testing chips
- Patent number 11,327,110
- Issue date May 10, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Environment control apparatus and chip testing system
- Patent number 11,327,111
- Issue date May 10, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Memory test method
- Patent number 11,327,866
- Issue date May 10, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip testing circuit and testing method thereof
- Patent number 11,287,466
- Issue date Mar 29, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
System-level testing apparatus and system-level testing system
- Patent number 11,226,362
- Issue date Jan 18, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing method for testing chips by chip testing system
- Patent number 11,193,971
- Issue date Dec 7, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Environment control apparatus
- Patent number 11,183,265
- Issue date Nov 23, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing device
- Patent number 11,125,809
- Issue date Sep 21, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Environment control apparatus and chip testing system
- Patent number 11,119,147
- Issue date Sep 14, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus, chip carrying device, and electrically connectin...
- Patent number 11,029,333
- Issue date Jun 8, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 11,022,643
- Issue date Jun 1, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Environment control apparatus
- Patent number 10,955,466
- Issue date Mar 23, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 10,726,183
- Issue date Jul 28, 2020
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G06 - COMPUTING CALCULATING COUNTING

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Patents Applicationslast 30 patents

Information Patent Application
CHIP TESTING APPARATUS
- Publication number 20230048515
- Publication date Feb 16, 2023
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE ADJUSTING DEVICE
- Publication number 20230051010
- Publication date Feb 16, 2023
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
PRESSING ASSEMBLY AND CHIP TESTING APPARATUS
- Publication number 20220128600
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TRAY KIT AND CHIP TESTING APPARATUS
- Publication number 20220128626
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING SYSTEM
- Publication number 20220128621
- Publication date Apr 28, 2022
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM
- Publication number 20210364568
- Publication date Nov 25, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING CIRCUIT AND TESTING METHOD THEREOF
- Publication number 20210311109
- Publication date Oct 7, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM-LEVEL TESTING APPARATUS AND SYSTEM-LEVEL TESTING SYSTEM
- Publication number 20210311107
- Publication date Oct 7, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM
- Publication number 20210132142
- Publication date May 6, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND CHIP TESTING SYSTEM
- Publication number 20210132140
- Publication date May 6, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TESTING METHOD
- Publication number 20210018558
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
MEMORY TEST METHOD
- Publication number 20210019245
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENVIRONMENT CONTROL APPARATUS
- Publication number 20210018560
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
ENVIRONMENT CONTROL APPARATUS
- Publication number 20210020260
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE
- Publication number 20210018557
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING SYSTEM
- Publication number 20210018559
- Publication date Jan 21, 2021
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS
- Publication number 20200355725
- Publication date Nov 12, 2020
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS
- Publication number 20200355740
- Publication date Nov 12, 2020
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS, CHIP CARRYING DEVICE, AND ELECTRICALLY CONNECTIN...
- Publication number 20200355726
- Publication date Nov 12, 2020
- ONE TEST SYSTEMS
- CHEN-LUNG TSAI
- G01 - MEASURING TESTING

ONE TEST SYSTEMS

Organization

Patents Grantslast 30 patents

Chip testing apparatus

Temperature adjusting device

Chip testing system

Testing apparatus

Pressing assembly and chip testing apparatus

Chip tray kit and chip testing apparatus

Chip testing device and chip testing system for testing memory chips

Chip testing system for testing chips

Environment control apparatus and chip testing system

Memory test method

Chip testing circuit and testing method thereof

System-level testing apparatus and system-level testing system

Chip testing method for testing chips by chip testing system

Environment control apparatus

Chip testing device

Environment control apparatus and chip testing system

Testing apparatus, chip carrying device, and electrically connectin...

Testing apparatus

Environment control apparatus

Testing apparatus

Patents Applicationslast 30 patents

CHIP TESTING APPARATUS

TEMPERATURE ADJUSTING DEVICE

PRESSING ASSEMBLY AND CHIP TESTING APPARATUS

CHIP TRAY KIT AND CHIP TESTING APPARATUS

CHIP TESTING SYSTEM

ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM

CHIP TESTING CIRCUIT AND TESTING METHOD THEREOF

SYSTEM-LEVEL TESTING APPARATUS AND SYSTEM-LEVEL TESTING SYSTEM

ENVIRONMENT CONTROL APPARATUS AND CHIP TESTING SYSTEM

CHIP TESTING DEVICE AND CHIP TESTING SYSTEM

CHIP TESTING METHOD

MEMORY TEST METHOD

ENVIRONMENT CONTROL APPARATUS

ENVIRONMENT CONTROL APPARATUS

CHIP TESTING DEVICE

CHIP TESTING SYSTEM

TESTING APPARATUS

TESTING APPARATUS

TESTING APPARATUS, CHIP CARRYING DEVICE, AND ELECTRICALLY CONNECTIN...