Osmic, Inc.

Organization

Auburn Hills, MI, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Beam conditioning system with sequential optic
- Patent number 7,280,634
- Issue date Oct 9, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system with adjustable convergence
- Patent number 7,245,699
- Issue date Jul 17, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Two-dimensional small angle x-ray scattering camera
- Patent number 7,139,366
- Issue date Nov 21, 2006
- Osmic, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Beam conditioning system
- Patent number 7,076,026
- Issue date Jul 11, 2006
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray source
- Patent number 6,944,270
- Issue date Sep 13, 2005
- Osmic, Inc.
- Bonglea Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark-field phase contrast imaging
- Patent number 6,870,896
- Issue date Mar 22, 2005
- Osmic, Inc.
- Vladimir V. Protopopov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-layer structure with variable bandpass for monochromatization...
- Patent number 6,809,864
- Issue date Oct 26, 2004
- Osmic, Inc.
- Vladimir V. Martynov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for detecting boron in x-ray fluorescence spec...
- Patent number 6,763,086
- Issue date Jul 13, 2004
- Osmic, Inc.
- Yuriy Platonov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Protective layer for multilayers exposed to x-rays
- Patent number 6,643,353
- Issue date Nov 4, 2003
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-layer structure with variable bandpass for monochromatization...
- Patent number 6,510,200
- Issue date Jan 21, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multilayer optics with adjustable working wavelength
- Patent number 6,421,417
- Issue date Jul 16, 2002
- Osmic, Inc.
- Licai Jiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray lens system
- Patent number 6,389,100
- Issue date May 14, 2002
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical scheme for high flux low-background two-dimensional small a...
- Patent number 6,330,301
- Issue date Dec 11, 2001
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with adjustable image distance
- Patent number 6,069,934
- Issue date May 30, 2000
- Osmic, Inc.
- Boris Verman
- G01 - MEASURING TESTING
Information Patent Grant
Single corner kirkpatrick-baez beam conditioning optic assembly
- Patent number 6,041,099
- Issue date Mar 21, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
- Patent number 6,014,423
- Issue date Jan 11, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Steerable x-ray optical system
- Patent number 5,757,882
- Issue date May 26, 1998
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical element of multilayered thin film for X-rays and neutrons
- Patent number 5,646,976
- Issue date Jul 8, 1997
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA
- Publication number 20100284516
- Publication date Nov 11, 2010
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA
- Publication number 20080069302
- Publication date Mar 20, 2008
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
Beam conditioning system with sequential optic
- Publication number 20060239405
- Publication date Oct 26, 2006
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY SOURCE
- Publication number 20050190887
- Publication date Sep 1, 2005
- Osmic, Inc.
- Bonglea Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray optical system with adjustable convergence
- Publication number 20040170250
- Publication date Sep 2, 2004
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray lens system
- Publication number 20030128811
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS
- Publication number 20030128810
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multi-layer structure with variable bandpass for monochromatization...
- Publication number 20030072412
- Publication date Apr 17, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- G02 - OPTICS
Information Patent Application
MULTI-LAYER STRUCTURE WITH VARIABLE BANDPASS FOR MONOCHROMATIZATION...
- Publication number 20030002622
- Publication date Jan 2, 2003
- Osmic, Inc.
- Vladimir V. Martynov
- B82 - NANO-TECHNOLOGY

Trademarklast 30 trademarks

Information Trademark
76333754 - MICRO MAX
- Serial number 76333754
- Registration number 2645634
- Filing date Nov 2, 2001
- OSMIC, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75427384 - MAX-FLUX
- Serial number 75427384
- Registration number 2635609
- Filing date Feb 2, 1998
- OSMIC, INC.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Osmic, Inc.

Organization

Patents Grantslast 30 patents

Beam conditioning system with sequential optic

X-ray optical system with adjustable convergence

Two-dimensional small angle x-ray scattering camera

Beam conditioning system

X-ray source

Dark-field phase contrast imaging

Multi-layer structure with variable bandpass for monochromatization...

Method and apparatus for detecting boron in x-ray fluorescence spec...

Protective layer for multilayers exposed to x-rays

Multi-layer structure with variable bandpass for monochromatization...

Multilayer optics with adjustable working wavelength

X-ray lens system

Optical scheme for high flux low-background two-dimensional small a...

X-ray diffractometer with adjustable image distance

Single corner kirkpatrick-baez beam conditioning optic assembly

Multiple corner Kirkpatrick-Baez beam conditioning optic assembly

Steerable x-ray optical system

Optical element of multilayered thin film for X-rays and neutrons

Patents Applicationslast 30 patents

TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA

TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA

Beam conditioning system with sequential optic

X-RAY SOURCE

X-ray optical system with adjustable convergence

X-ray lens system

PROTECTIVE LAYER FOR MULTILAYERS EXPOSED TO X-RAYS

Multi-layer structure with variable bandpass for monochromatization...

MULTI-LAYER STRUCTURE WITH VARIABLE BANDPASS FOR MONOCHROMATIZATION...

Trademarklast 30 trademarks

76333754 - MICRO MAX

75427384 - MAX-FLUX