Prometrix Corporation

Organization

Santa Clara, CA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring reflectance in two wavelength ba...
- Patent number 5,486,701
- Issue date Jan 23, 1996
- Prometrix Corporation
- Adam E. Norton
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for imaging dense linewidth features using an...
- Patent number 5,386,317
- Issue date Jan 31, 1995
- Prometrix Corporation
- Timothy R. Corle
- G02 - OPTICS
Information Patent Grant
Semiconductor surface resistivity probe with semiconductor temperat...
- Patent number 5,260,668
- Issue date Nov 9, 1993
- Prometrix Corporation
- Chester L. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Data analysis system and method for industrial process control systems
- Patent number 5,226,118
- Issue date Jul 6, 1993
- Prometrix Corporation
- Michael K. Baker
- G05 - CONTROLLING REGULATING
Information Patent Grant
Confocal scanning optical microscope
- Patent number 5,067,805
- Issue date Nov 26, 1991
- Prometrix Corporation
- Timothy R. Corle
- G02 - OPTICS
Information Patent Grant
Process control interface system for managing measurement data
- Patent number 4,967,381
- Issue date Oct 30, 1990
- Prometrix Corporation
- Leslie A. Lane
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multilevel menu and hierarchy for selecting items and performing ta...
- Patent number 4,951,190
- Issue date Aug 21, 1990
- Prometrix Corporation
- Leslie A. Lane
- G05 - CONTROLLING REGULATING
Information Patent Grant
Autofocusing system for microscope having contrast detection means
- Patent number 4,945,220
- Issue date Jul 31, 1990
- Prometrix Corporation
- Chester L. Mallory
- G02 - OPTICS
Information Patent Grant
Apparatus for handling semiconductor wafers
- Patent number 4,907,931
- Issue date Mar 13, 1990
- Prometrix Corporation
- Chester L. Mallory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control interface with simultaneously displayed three level...
- Patent number 4,873,623
- Issue date Oct 10, 1989
- Prometrix Corporation
- Leslie A. Lane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-level dynamic menu which suppresses display of items previous...
- Patent number 4,843,538
- Issue date Jun 27, 1989
- Prometrix Corporation
- Leslie A. Lane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process control interface system for managing measurement data
- Patent number 4,805,089
- Issue date Feb 14, 1989
- Prometrix Corporation
- Leslie A. Lane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy film thickness measurement system
- Patent number 4,776,695
- Issue date Oct 11, 1988
- Prometrix Corporation
- Hung van Pham
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for semiconductor wafer testing
- Patent number 4,755,746
- Issue date Jul 5, 1988
- Prometrix Corporation
- Chester Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Automatic semiconductor wafer tester
- Patent number D292979
- Issue date Dec 1, 1987
- Prometrix Corporation
- Marland Chow
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Apparatus and methods for resistivity testing
- Patent number 4,703,252
- Issue date Oct 27, 1987
- Prometrix Corporation
- David S. Perloff
- G01 - MEASURING TESTING
Information Patent Grant
Process control interface system for designer and operator
- Patent number 4,679,137
- Issue date Jul 7, 1987
- Prometrix Corporation
- Leslie A. Lane
- G05 - CONTROLLING REGULATING

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Patents Applicationslast 30 patents

Information Patent Application
Modular security enclosure for gaming machine
- Publication number 20050057126
- Publication date Mar 17, 2005
- Prometrix Corporation
- Chester Lawrence Mallory
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

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Trademarklast 30 trademarks

Information Trademark
74396016 - C2C
- Serial number 74396016
- Registration number 1822524
- Filing date May 28, 1993
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74304322 - SWIFT/STATION
- Serial number 74304322
- Registration number 1764300
- Filing date Aug 14, 1992
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74304318
- Serial number 74304318
- Registration number 1764299
- Filing date Aug 14, 1992
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74062679 - CONQUEST
- Serial number 74062679
- Registration number 1661281
- Filing date May 25, 1990
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73644509 - SPECTRAMAP
- Serial number 73644509
- Registration number 1516228
- Filing date Feb 13, 1987
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73644488 - STATTRAX
- Serial number 73644488
- Registration number 1456334
- Filing date Feb 13, 1987
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471541 - VERSAPROBE
- Serial number 73471541
- Registration number 1338875
- Filing date Mar 22, 1984
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471543 - LITHOMAP
- Serial number 73471543
- Registration number 1338876
- Filing date Mar 22, 1984
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471545 - PROMETRIX
- Serial number 73471545
- Registration number 1338877
- Filing date Mar 22, 1984
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73471544 - OMNIMAP
- Serial number 73471544
- Registration number 1340258
- Filing date Mar 22, 1984
- Prometrix Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Prometrix Corporation

Organization

Patents Grantslast 30 patents

Method and apparatus for measuring reflectance in two wavelength ba...

Method and apparatus for imaging dense linewidth features using an...

Semiconductor surface resistivity probe with semiconductor temperat...

Data analysis system and method for industrial process control systems

Confocal scanning optical microscope

Process control interface system for managing measurement data

Multilevel menu and hierarchy for selecting items and performing ta...

Autofocusing system for microscope having contrast detection means

Apparatus for handling semiconductor wafers

Process control interface with simultaneously displayed three level...

Multi-level dynamic menu which suppresses display of items previous...

Process control interface system for managing measurement data

High accuracy film thickness measurement system

Apparatus and methods for semiconductor wafer testing

Automatic semiconductor wafer tester

Apparatus and methods for resistivity testing

Process control interface system for designer and operator

Patents Applicationslast 30 patents

Modular security enclosure for gaming machine

Trademarklast 30 trademarks

74396016 - C2C

74304322 - SWIFT/STATION

74304318

74062679 - CONQUEST

73644509 - SPECTRAMAP

73644488 - STATTRAX

73471541 - VERSAPROBE

73471543 - LITHOMAP

73471545 - PROMETRIX

73471544 - OMNIMAP