Raintree Scientific Instruments (Shanghai) Corporation

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Device and method used for measuring wafers
- Patent number 12,033,901
- Issue date Jul 9, 2024
- Raintree Scientific Instruments (Shanghai) Corporation
- Bin Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibrating method and device for broad-band achromatic composite w...
- Patent number 10,309,834
- Issue date Jun 4, 2019
- Raintree Scientific Instruments (Shanghai) Corporation
- Fengjiao Zhong
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for wafer alignment
- Patent number 9,978,152
- Issue date May 22, 2018
- Raintree Scientific Instruments (Shanghai) Corporation
- Jian Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for ellipsometry measurement
- Patent number 9,200,998
- Issue date Dec 1, 2015
- Raintree Scientific Instruments (Shanghai) Corporation
- Jiang-tao Dang
- G01 - MEASURING TESTING
Information Patent Grant
Image pattern matching systems and methods for wafer alignment
- Patent number 8,538,168
- Issue date Sep 17, 2013
- Raintree Scientific Instruments (Shanghai) Corporation
- Lisong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectroscopic ellipsometers
- Patent number 7,999,949
- Issue date Aug 16, 2011
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD USED FOR MEASURING WAFERS
- Publication number 20220020648
- Publication date Jan 20, 2022
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Bin LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATING METHOD AND DEVICE FOR BROAD-BAND ACHROMATIC COMPOSITE W...
- Publication number 20180283951
- Publication date Oct 4, 2018
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Fengjiao ZHONG
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20170323761
- Publication date Nov 9, 2017
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Hu Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MEASURING CRITICAL DIMENSION OF SEMICONDUCTOR
- Publication number 20150198434
- Publication date Jul 16, 2015
- Raintree Scientific Instruments (Shanghai) Corporation
- Huiping CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER ALIGNMENT
- Publication number 20150125069
- Publication date May 7, 2015
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Jian ZHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Ellipsometry Measurement
- Publication number 20120038920
- Publication date Feb 16, 2012
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Jiang-tao Dang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ELLIPSOMETRY MEASUREMENT
- Publication number 20110176133
- Publication date Jul 21, 2011
- RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION
- Jiang-tao Dang
- G01 - MEASURING TESTING
Information Patent Application
Composite Optical Focusing Devices
- Publication number 20100118308
- Publication date May 13, 2010
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING
Information Patent Application
Image Rotation Devices and Their Applications
- Publication number 20080024790
- Publication date Jan 31, 2008
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING
Information Patent Application
Optical Measurement System with Simultaneous Multiple Wavelengths,...
- Publication number 20070263220
- Publication date Nov 15, 2007
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Ellipsometers
- Publication number 20070247624
- Publication date Oct 25, 2007
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING
Information Patent Application
Optical Focusing Devices
- Publication number 20070242267
- Publication date Oct 18, 2007
- Raintree Scientific Instruments (Shanghai) Corporation
- Tongxin Lu
- G01 - MEASURING TESTING

Raintree Scientific Instruments (Shanghai) Corporation

Organization

Patents Grantslast 30 patents

Device and method used for measuring wafers

Calibrating method and device for broad-band achromatic composite w...

Method and system for wafer alignment

Method and apparatus for ellipsometry measurement

Image pattern matching systems and methods for wafer alignment

Spectroscopic ellipsometers

Patents Applicationslast 30 patents

DEVICE AND METHOD USED FOR MEASURING WAFERS

CALIBRATING METHOD AND DEVICE FOR BROAD-BAND ACHROMATIC COMPOSITE W...

CHARGED PARTICLE DETECTOR

METHOD AND APPARATUS FOR MEASURING CRITICAL DIMENSION OF SEMICONDUCTOR

METHOD AND SYSTEM FOR WAFER ALIGNMENT

Method and Apparatus for Ellipsometry Measurement

METHOD AND APPARATUS FOR ELLIPSOMETRY MEASUREMENT

Composite Optical Focusing Devices

Image Rotation Devices and Their Applications

Optical Measurement System with Simultaneous Multiple Wavelengths,...

Spectroscopic Ellipsometers

Optical Focusing Devices

Trademarklast 30 trademarks