Rigaku Corporation

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 12,105,034
- Issue date Oct 1, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Center shift amount estimating apparatus, method, and program
- Patent number 12,106,403
- Issue date Oct 1, 2024
- Rigaku Corporation
- Takumi Ota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 12,092,593
- Issue date Sep 17, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Structure for battery analysis and X-ray diffraction device
- Patent number 12,080,858
- Issue date Sep 3, 2024
- Rigaku Corporation
- Koichiro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Soaking machine of single-crystal X-ray structure analysis sample,...
- Patent number 12,055,501
- Issue date Aug 6, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for analyzing diffraction pattern of mixture, and...
- Patent number 12,031,927
- Issue date Jul 9, 2024
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
- Patent number 11,942,231
- Issue date Mar 26, 2024
- Rigaku Corporation
- Koichiro Ito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample holder unit for single-crystal X-ray structure analysis appa...
- Patent number 11,921,060
- Issue date Mar 5, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,921,065
- Issue date Mar 5, 2024
- Rigaku Corporation
- Shinya Hara
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Imaging type X-ray microscope
- Patent number 11,885,753
- Issue date Jan 30, 2024
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Tolerance error estimating apparatus, method, program, reconstructi...
- Patent number 11,885,754
- Issue date Jan 30, 2024
- Rigaku Corporation
- Takumi Ota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single-crystal X-ray structure analysis system
- Patent number 11,879,857
- Issue date Jan 23, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 11,874,204
- Issue date Jan 16, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 11,874,238
- Issue date Jan 16, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
Degree-of-crystallinity measurement apparatus, degree-of-crystallin...
- Patent number 11,852,597
- Issue date Dec 26, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
- Patent number 11,846,594
- Issue date Dec 19, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 11,841,334
- Issue date Dec 12, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
- Patent number 11,835,476
- Issue date Dec 5, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,832,981
- Issue date Dec 5, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample holder for single-crystal X-ray structure analysis apparatus...
- Patent number 11,821,855
- Issue date Nov 21, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,808,721
- Issue date Nov 7, 2023
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal x-ray structure analysis apparatus and method, and s...
- Patent number 11,802,844
- Issue date Oct 31, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection X-ray fluorescence spectrometer and estimation method
- Patent number 11,796,495
- Issue date Oct 24, 2023
- Rigaku Corporation
- Shinya Kikuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control apparatus, system, method, and program
- Patent number 11,788,974
- Issue date Oct 17, 2023
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Soaking machine and soaking method of sample for single-crystal X-r...
- Patent number 11,774,379
- Issue date Oct 3, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
PEAK IDENTIFICATION ANALYSIS PROGRAM, AND X-RAY FLUORESCENT SPECTRO...
- Publication number 20240337612
- Publication date Oct 10, 2024
- Rigaku Corporation
- Wataru MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240328972
- Publication date Oct 3, 2024
- Rigaku Corporation
- Rieko SUENAGA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
- Publication number 20240280714
- Publication date Aug 22, 2024
- Rigaku Corporation
- Kunitoshi YANAGIHARA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...
- Publication number 20240280711
- Publication date Aug 22, 2024
- Rigaku Corporation
- Yasutaka SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION DEVICE, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240273786
- Publication date Aug 15, 2024
- Rigaku Corporation
- Takumi Ota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS
- Publication number 20240255446
- Publication date Aug 1, 2024
- Rigaku Corporation
- Yuji SHIRAMATA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY CONTRAST MEDIUM AND X-RAY IMAGE ACQUISITION METHOD
- Publication number 20240230658
- Publication date Jul 11, 2024
- Rigaku Corporation
- Koichiro ITO
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, METHOD AND PROGRAM FOR CORRECTING ARTIFACTS
- Publication number 20240202994
- Publication date Jun 20, 2024
- Rigaku Corporation
- Takumi Ota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20240167969
- Publication date May 23, 2024
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION MEASUREMENT APPARATUS
- Publication number 20240167968
- Publication date May 23, 2024
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
- Publication number 20240133829
- Publication date Apr 25, 2024
- Rigaku Corporation
- Takumi OTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...
- Publication number 20240120036
- Publication date Apr 11, 2024
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYSIS APPARATUS
- Publication number 20240077396
- Publication date Mar 7, 2024
- Rigaku Corporation
- Koichiro Noritake
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ANALYSIS APPARATUS AND CONTROL SOFTWARE FOR THERMAL ANALYSI...
- Publication number 20240068876
- Publication date Feb 29, 2024
- Rigaku Corporation
- Koichiro NORITAKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20240027373
- Publication date Jan 25, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR
- Publication number 20240019385
- Publication date Jan 18, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20240005569
- Publication date Jan 4, 2024
- Rigaku Corporation
- Shota TAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230400423
- Publication date Dec 14, 2023
- Rigaku Corporation
- Makoto KAMBE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230393084
- Publication date Dec 7, 2023
- Rigaku Corporation
- Shinya HARA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...
- Publication number 20230304948
- Publication date Sep 28, 2023
- Rigaku Corporation
- Ryouichi YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230293129
- Publication date Sep 21, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230296539
- Publication date Sep 21, 2023
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER AND ESTIMATION METHOD
- Publication number 20230288353
- Publication date Sep 14, 2023
- Rigaku Corporation
- Shinya KIKUTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS
- Publication number 20230288348
- Publication date Sep 14, 2023
- Rigaku Corporation
- Masashi KAGEYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
- Publication number 20230258586
- Publication date Aug 17, 2023
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
98173620 - IOPTIX
- Serial number 98173620
- Filing date Sep 11, 2023
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98079967 - TFXRD
- Serial number 98079967
- Filing date Jul 11, 2023
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98018907 - SUPERLAB
- Serial number 98018907
- Filing date May 30, 2023
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97609229 - SUREDI
- Serial number 97609229
- Registration number 7239960
- Filing date Sep 27, 2022
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97609288 - RIGAKU SUREDI
- Serial number 97609288
- Registration number 7239961
- Filing date Sep 27, 2022
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97360855 - SAXS3DM
- Serial number 97360855
- Registration number 7216128
- Filing date Apr 13, 2022
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88879274 - DIRECT DERIVATION METHOD
- Serial number 88879274
- Filing date Apr 20, 2020
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88859042 - DD METHOD
- Serial number 88859042
- Filing date Apr 3, 2020
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88859030 - DIRECT DERIVATIVE METHOD
- Serial number 88859030
- Filing date Apr 3, 2020
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88838495 - XSPA
- Serial number 88838495
- Registration number 6431068
- Filing date Mar 18, 2020
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79276647 - XTRAIA
- Serial number 79276647
- Registration number 6208039
- Filing date Oct 10, 2019
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79273177 - XHEMIS
- Serial number 79273177
- Registration number 6110185
- Filing date Oct 3, 2019
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79206193 - SIMULTIX
- Serial number 79206193
- Registration number 5298880
- Filing date Jan 18, 2017
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87165782 - NANOPIX
- Serial number 87165782
- Registration number 5176448
- Filing date Sep 9, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87156374 - XTALCHECK
- Serial number 87156374
- Registration number 5377081
- Filing date Aug 31, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87065979 - EZX
- Serial number 87065979
- Registration number 5216620
- Filing date Jun 9, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87065984 - EZX
- Serial number 87065984
- Registration number 5216621
- Filing date Jun 9, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87065961 - EASYX
- Serial number 87065961
- Registration number 5216618
- Filing date Jun 9, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87065971 - EASYX
- Serial number 87065971
- Registration number 5216619
- Filing date Jun 9, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87004110 - XTALAB SYNERGY
- Serial number 87004110
- Registration number 5243955
- Filing date Apr 18, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87004127 - XTALAB SYNERGY
- Serial number 87004127
- Registration number 5243956
- Filing date Apr 18, 2016
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86780706 - XTALAB
- Serial number 86780706
- Registration number 5001949
- Filing date Oct 7, 2015
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86193810 - SMARTSITE
- Serial number 86193810
- Registration number 4639992
- Filing date Feb 14, 2014
- Rigaku Corporation
- 10 - Surgical, medical, dental and veterinary apparatus and instruments, artificial limbs, eyes and teeth
Information Trademark
86193830 - SMARTSITE
- Serial number 86193830
- Registration number 4648165
- Filing date Feb 14, 2014
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85829900 - HYPIX
- Serial number 85829900
- Registration number 4424499
- Filing date Jan 23, 2013
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79029535 - PAX PHARMAXESS
- Serial number 79029535
- Registration number 3258994
- Filing date May 11, 2006
- Rigaku Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Rigaku Corporation

Organization

Patents Grantslast 30 patents

Single-crystal X-ray structure analysis apparatus, and method therefor

Center shift amount estimating apparatus, method, and program

X-ray spectrometer and pulse height prediction program

Single-crystal X-ray structure analysis apparatus and method, and s...

Structure for battery analysis and X-ray diffraction device

Soaking machine of single-crystal X-ray structure analysis sample,...

Method and device for analyzing diffraction pattern of mixture, and...

Transmissive small-angle scattering device

Airtight box for measurement, airtight apparatus, measurement syste...

Sample holder unit for single-crystal X-ray structure analysis appa...

X-ray fluorescence spectrometer

Structure for pressurization analysis, X-ray diffraction apparatus...

Imaging type X-ray microscope

Tolerance error estimating apparatus, method, program, reconstructi...

Single-crystal X-ray structure analysis system

Single-crystal X-ray structure analysis apparatus, and method therefor

Single-crystal X-ray structure analysis apparatus and method, and s...

Total reflection x-ray fluorescence spectrometer

Degree-of-crystallinity measurement apparatus, degree-of-crystallin...

Single-crystal X-ray structure analysis apparatus and sample holder

Quantitative phase analysis device, quantitative phase analysis met...

Single-crystal X-ray structure analysis apparatus and sample holder...

X-ray fluorescence spectrometer

Sample holder for single-crystal X-ray structure analysis apparatus...

X-ray analysis apparatus

Single-crystal x-ray structure analysis apparatus and method, and s...

Total reflection X-ray fluorescence spectrometer and estimation method

Control apparatus, system, method, and program

Quantitative analysis method, quantitative analysis program, and X-...

Soaking machine and soaking method of sample for single-crystal X-r...

Patents Applicationslast 30 patents

PEAK IDENTIFICATION ANALYSIS PROGRAM, AND X-RAY FLUORESCENT SPECTRO...

ANALYSIS APPARATUS, SYSTEM, METHOD, AND PROGRAM

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...

RADIATION DETECTOR, TRIGGER SIGNAL GENERATOR, AND RADIATION ANALYZI...

CORRECTION DEVICE, SYSTEM, METHOD, AND PROGRAM

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS

X-RAY CONTRAST MEDIUM AND X-RAY IMAGE ACQUISITION METHOD

CORRECTION APPARATUS, METHOD AND PROGRAM FOR CORRECTING ARTIFACTS

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

RADIATION MEASUREMENT APPARATUS

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...

THERMAL ANALYSIS APPARATUS

THERMAL ANALYSIS APPARATUS AND CONTROL SOFTWARE FOR THERMAL ANALYSI...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER

X-RAY FLUORESCENCE SPECTROMETER

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...

X-RAY FLUORESCENCE SPECTROMETER

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER AND ESTIMATION METHOD

METHOD OF EVALUATING ANISOTROPY AND ANISOTROPY EVALUATION APPARATUS

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD

Trademarklast 30 trademarks

98173620 - IOPTIX

98079967 - TFXRD

98018907 - SUPERLAB

97609229 - SUREDI

97609288 - RIGAKU SUREDI

97360855 - SAXS3DM

88879274 - DIRECT DERIVATION METHOD

88859042 - DD METHOD

88859030 - DIRECT DERIVATIVE METHOD

88838495 - XSPA

79276647 - XTRAIA

79273177 - XHEMIS

79206193 - SIMULTIX

87165782 - NANOPIX

87156374 - XTALCHECK