Ryoden Semiconductor Systems Engineering Corporation

Organization

Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device with built-in self test circuit operati...
- Patent number 6,993,696
- Issue date Jan 31, 2006
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Jitter measurement circuit for measuring jitter of measurement targ...
- Patent number 6,934,648
- Issue date Aug 23, 2005
- Renesas Technology Corp.
- Hisayoshi Hanai
- G01 - MEASURING TESTING
Information Patent Grant
Power module
- Patent number 6,900,986
- Issue date May 31, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Kimoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,864,580
- Issue date Mar 8, 2005
- Renesas Technology Corp.
- Shoichiro Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device and flash memory
- Patent number 6,841,487
- Issue date Jan 11, 2005
- Renesas Technology Corp.
- Kojiro Yuzuriha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate carrier management system and program
- Patent number 6,823,229
- Issue date Nov 23, 2004
- Renesas Technology Corp.
- Masaki Ootani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor device with a passivation film
- Patent number 6,815,265
- Issue date Nov 9, 2004
- Renesas Technology Corp.
- Shinya Nakatani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 6,808,973
- Issue date Oct 26, 2004
- Renesas Technology Corp.
- Yoshitaka Ootsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test pattern generation circuit and method for use with self-diagno...
- Patent number 6,802,034
- Issue date Oct 5, 2004
- Renesas Technology Corp.
- Yukikazu Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Process control device and process control method
- Patent number 6,788,990
- Issue date Sep 7, 2004
- Renesas Technology Corp.
- Taichi Yanaru
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Power module
- Patent number 6,762,937
- Issue date Jul 13, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Kimoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Substrate testing apparatus and substrate testing method
- Patent number 6,747,466
- Issue date Jun 8, 2004
- Renesas Technology Corp.
- Hiromitsu Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of interbay transportation
- Patent number 6,733,243
- Issue date May 11, 2004
- Renesas Technology Corp.
- Ryoji Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device provided with memory chips
- Patent number 6,724,668
- Issue date Apr 20, 2004
- Renesas Technology Corp.
- Ryuji Ohmura
- G11 - INFORMATION STORAGE
Information Patent Grant
Track conveyance system
- Patent number 6,721,627
- Issue date Apr 13, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Syoji Udou
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method of producing a semiconductor device
- Patent number 6,716,718
- Issue date Apr 6, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hiroyuki Nagatani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing semiconductor integrated circuit
- Patent number 6,714,888
- Issue date Mar 30, 2004
- Renesas Technology Corp.
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing manufacturing plan and method for manufacturin...
- Patent number 6,708,070
- Issue date Mar 16, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Chigusa Yasuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor module
- Patent number 6,708,302
- Issue date Mar 16, 2004
- Renesas Technology Corp.
- Mari Shibayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Field effect transistor having improved withstand voltage
- Patent number 6,696,727
- Issue date Feb 24, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yoshio Takahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having S/D to S/D connection and isolation reg...
- Patent number 6,696,732
- Issue date Feb 24, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Takeru Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing semiconductor integrated circuit
- Patent number 6,690,189
- Issue date Feb 10, 2004
- Renesas Technology Corp.
- Hisaya Mori
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transportation system
- Patent number 6,687,568
- Issue date Feb 3, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hirofumi Ohtsuka
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Tester for semiconductor integrated circuits
- Patent number 6,661,248
- Issue date Dec 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
External test auxiliary device to be used for testing semiconductor...
- Patent number 6,653,855
- Issue date Nov 25, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus, and method of testing semiconductor d...
- Patent number 6,651,023
- Issue date Nov 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing semiconductor devices using improv...
- Patent number 6,646,461
- Issue date Nov 11, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kazushi Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 6,645,859
- Issue date Nov 11, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mahito Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tester for semiconductor integrated circuits and method for testing...
- Patent number 6,642,736
- Issue date Nov 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hisaya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Insulated gate semiconductor device having first trench and second...
- Patent number 6,642,600
- Issue date Nov 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Atsushi Narazaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Power module
- Publication number 20040179341
- Publication date Sep 16, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Kimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing interconnection structure applied to semico...
- Publication number 20040087137
- Publication date May 6, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hiroki Takewaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Jitter measurement circuit for measuring jitter of measurement targ...
- Publication number 20040044488
- Publication date Mar 4, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hisayoshi Hanai
- G01 - MEASURING TESTING
Information Patent Application
Resist pattern formation method
- Publication number 20040018646
- Publication date Jan 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Tarutani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Charge coupled device
- Publication number 20040016935
- Publication date Jan 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Mutsumi Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wiring structure
- Publication number 20040017279
- Publication date Jan 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Takao Kamoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus of testing semiconductor
- Publication number 20030210068
- Publication date Nov 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yoshinori Fujiwara
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having capacitive element and manufacturing me...
- Publication number 20030109100
- Publication date Jun 12, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yoshifumi Takata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interbay transportation system and method of interbay transportation
- Publication number 20030108407
- Publication date Jun 12, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryoji Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device provided with memory chips
- Publication number 20030107926
- Publication date Jun 12, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Ohmura
- G11 - INFORMATION STORAGE

Ryoden Semiconductor Systems Engineering Corporation

Organization

Patents Grantslast 30 patents

Semiconductor memory device with built-in self test circuit operati...

Jitter measurement circuit for measuring jitter of measurement targ...

Power module

Semiconductor device and method of manufacturing the same

Method of manufacturing semiconductor device and flash memory

Substrate carrier management system and program

Method of fabricating a semiconductor device with a passivation film

Manufacturing method of semiconductor device

Test pattern generation circuit and method for use with self-diagno...

Process control device and process control method

Power module

Substrate testing apparatus and substrate testing method

Method of interbay transportation

Semiconductor device provided with memory chips

Track conveyance system

Method of producing a semiconductor device

Apparatus for testing semiconductor integrated circuit

Method for preparing manufacturing plan and method for manufacturin...

Semiconductor module

Field effect transistor having improved withstand voltage

Semiconductor device having S/D to S/D connection and isolation reg...

Apparatus and method for testing semiconductor integrated circuit

Transportation system

Tester for semiconductor integrated circuits

External test auxiliary device to be used for testing semiconductor...

Semiconductor test apparatus, and method of testing semiconductor d...

Method and apparatus for testing semiconductor devices using improv...

Semiconductor device and manufacturing method thereof

Tester for semiconductor integrated circuits and method for testing...

Insulated gate semiconductor device having first trench and second...

Patents Applicationslast 30 patents

Power module

Method of manufacturing interconnection structure applied to semico...

Jitter measurement circuit for measuring jitter of measurement targ...

Resist pattern formation method

Charge coupled device

Wiring structure

Apparatus of testing semiconductor

Semiconductor device having capacitive element and manufacturing me...

Interbay transportation system and method of interbay transportation

Semiconductor device provided with memory chips

Trademarklast 30 trademarks