SEMILAB Semiconductor Physics Laboratory, Inc.

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Budapest, HU

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor doping using constant surface potential cor...
- Patent number 10,969,370
- Issue date Apr 6, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging
- Patent number 10,883,941
- Issue date Jan 5, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro photoluminescence imaging with optical filtering
- Patent number 10,209,190
- Issue date Feb 19, 2019
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging with optical filtering
- Patent number 10,018,565
- Issue date Jul 10, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Grant
Micro photoluminescence imaging
- Patent number 10,012,593
- Issue date Jul 3, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Mobility measurements of inversion charge carriers
- Patent number 7,663,393
- Issue date Feb 16, 2010
- IMEC
- Jean-Luc Everaert
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
MICRO PHOTOLUMINESCENCE IMAGING
- Publication number 20200300767
- Publication date Sep 24, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
Micro Photoluminescence Imaging
- Publication number 20190391079
- Publication date Dec 26, 2019
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Zoltan Tamas Kiss
- G01 - MEASURING TESTING
Information Patent Application
Charge Metrology for Integrated Measurement
- Publication number 20180315630
- Publication date Nov 1, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOBILITY MEASUREMENTS OF INVERSION CHARGE CARRIERS
- Publication number 20080297189
- Publication date Dec 4, 2008
- Interuniversitair Microelektronica Centrum vzw (IMEC)
- Jean-Luc Everaert
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
74381027 - SEMILAB
- Serial number 74381027
- Filing date Apr 19, 1993
- SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74213918 - SEMILAB
- Serial number 74213918
- Filing date Oct 21, 1991
- Semilab Semiconductor Physics Laboratory Co. Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

SEMILAB Semiconductor Physics Laboratory, Inc.

Organization

Patents Grantslast 30 patents

Semiconductor doping characterization method using photoneutralizat...

Topside contact device and method for characterization of high elec...

Measuring semiconductor doping using constant surface potential cor...

Micro photoluminescence imaging

Non-contact method to monitor and quantify effective work function...

Micro photoluminescence imaging with optical filtering

Micro photoluminescence imaging with optical filtering

Micro photoluminescence imaging

Mobility measurements of inversion charge carriers

Patents Applicationslast 30 patents

TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...

MICRO PHOTOLUMINESCENCE IMAGING

Micro Photoluminescence Imaging

Charge Metrology for Integrated Measurement

MOBILITY MEASUREMENTS OF INVERSION CHARGE CARRIERS

Trademarklast 30 trademarks

74381027 - SEMILAB

74213918 - SEMILAB