Shanghai Huali Integrated Circuit Corporation

Organization

Shanghai, CN

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
FinFET standard cell with double self-aligned contacts and method t...
- Patent number 12,062,659
- Issue date Aug 13, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing fin field effect transistor
- Patent number 12,046,518
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for temperature stress test for memory chips
- Patent number 12,044,723
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Semi-floating gate memory device and method for fabricating the same
- Patent number 12,040,413
- Issue date Jul 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-port SRAM
- Patent number 12,009,818
- Issue date Jun 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Pinhan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer transfer module and method thereof for transferring to-be-tra...
- Patent number 11,972,963
- Issue date Apr 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yu Ren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Manufacturing method for integrating gate dielectric layers of diff...
- Patent number 11,961,740
- Issue date Apr 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lian Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-floating gate device
- Patent number 11,955,524
- Issue date Apr 9, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and test method for online detection of metal via op...
- Patent number 11,906,572
- Issue date Feb 20, 2024
- Shanghai Huali Integrated Circuit Corporation
- Shumiao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor integrated in FinFET device and method for fabricating th...
- Patent number 11,887,983
- Issue date Jan 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Rui Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,855,212
- Issue date Dec 26, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed LDO structure without external capacitor
- Patent number 11,841,723
- Issue date Dec 12, 2023
- Shanghai Huali Integrated Circuit Corporation
- Xiangyang Li
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fin semiconductor device and method for making the same
- Patent number 11,810,965
- Issue date Nov 7, 2023
- Shanghai Huali Integrated Circuit Corporation
- Qiuming Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving overlay metrology accuracy of self-aligned mul...
- Patent number 11,762,303
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yuyang Bian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and structure for detecting physical short-circuit defect be...
- Patent number 11,764,116
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Shuhua Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving metal work function boundary effect
- Patent number 11,756,798
- Issue date Sep 12, 2023
- Shanghai Huali Integrated Circuit Corporation
- Wenyin Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack capacitor, a flash memory device and a manufacturing method t...
- Patent number 11,737,268
- Issue date Aug 22, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhi Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of copper plating filling
- Patent number 11,728,213
- Issue date Aug 15, 2023
- Shanghai Huali Integrated Circuit Corporation
- Junjie Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing fin field-effect transistor
- Patent number 11,646,233
- Issue date May 9, 2023
- Shanghai Huali Integrated Circuit Corporation
- Tiancai Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cutting off FIN field effect transistor
- Patent number 11,640,910
- Issue date May 2, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yenchan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing FDSOI
- Patent number 11,640,923
- Issue date May 2, 2023
- Shanghai Huali Integrated Circuit Corporation
- Tianpeng Guan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double control gate semi-floating gate transistor and method for pr...
- Patent number 11,637,187
- Issue date Apr 25, 2023
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET transistor cut etching process method
- Patent number 11,637,194
- Issue date Apr 25, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yenchan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,610,981
- Issue date Mar 21, 2023
- Shanghai Huali Integrated Circuit Corporation
- Changhung Kung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,581,225
- Issue date Feb 14, 2023
- Shanghai Huali Integrated Circuit Corporation
- Changhung Kung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing method and device for CDSEM
- Patent number 11,573,188
- Issue date Feb 7, 2023
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi Liu
- G01 - MEASURING TESTING
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,569,385
- Issue date Jan 31, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for etching back hard mask layer on tops of dummy polysilico...
- Patent number 11,538,923
- Issue date Dec 27, 2022
- Shanghai Huali Integrated Circuit Corporation
- Shidong Fu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of Fin field-effect transistor
- Patent number 11,495,502
- Issue date Nov 8, 2022
- Shanghai Huali Integrated Circuit Corporation
- Huojin Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing 1.5T SONOS flash memory
- Patent number 11,476,269
- Issue date Oct 18, 2022
- Shanghai Huali Integrated Circuit Corporation
- Shugang Dai
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD FOR IMPROVING IO DEVICE YIELD
- Publication number 20240353468
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiacheng Wen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROCESS METHOD FOR IMPROVING SRAM OPERATING SPEED
- Publication number 20240357791
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yuan Yuan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AUXILIARY COLORING METHOD FOR APERIODIC PATTERN QUAD-COLOR SPLIT
- Publication number 20240346216
- Publication date Oct 17, 2024
- Shanghai Huali Integrated Circuit Corporation
- Baoxuan LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...
- Publication number 20240344884
- Publication date Oct 17, 2024
- Shanghai Huali Integrated Circuit Corporation
- Peng CHENG
- G02 - OPTICS
Information Patent Application
STATIC RANDOM-ACCESS MEMORY AND INTEGRATED CIRCUIT LAYOUT THEREOF
- Publication number 20240321346
- Publication date Sep 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Mu CAO
- G11 - INFORMATION STORAGE
Information Patent Application
EFUSE UNIT AND APPLICATION CIRCUIT THEREOF
- Publication number 20240312544
- Publication date Sep 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Ying Yan
- G11 - INFORMATION STORAGE
Information Patent Application
EFUSE UNIT AND APPLICATION CIRCUIT THEREOF
- Publication number 20240312545
- Publication date Sep 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Ying YAN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MEASURING THICKNESS OF SILICON EPITAXIAL LAYER
- Publication number 20240282646
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bottom Layer Metal Interconnection Line Structure
- Publication number 20240282701
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yekai Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS INTEGRATION METHOD FOR IMPROVING LEAKAGE IN MV DEVICE
- Publication number 20240282635
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qiwei WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure Analysis and Location Method for Short Circuit Structure
- Publication number 20240282648
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lingye Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device
- Publication number 20240269799
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jian Zhang
- B24 - GRINDING POLISHING
Information Patent Application
NOVEL CAPACITIVE DAC STRUCTURE
- Publication number 20240275398
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jingping GU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wafer Temperature Control System and Control Method, Computer Devic...
- Publication number 20240269797
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qingqing Duan
- B24 - GRINDING POLISHING
Information Patent Application
A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS
- Publication number 20240264222
- Publication date Aug 8, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Application
Method of Back End of Line Metal Via Process
- Publication number 20240258165
- Publication date Aug 1, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qiaodan Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING GATE OXIDE THICKNESS
- Publication number 20240234217
- Publication date Jul 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Haibo LEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE LEAKAGE CURRENT MODEL AND METHOD FOR EXTRACTING THE SAME
- Publication number 20240232468
- Publication date Jul 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qingwen WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR FABRICATING FULLY DEPLETED SILICON-ON-INSULATOR PMOS DEV...
- Publication number 20240186402
- Publication date Jun 6, 2024
- Shanghai Huali Integrated Circuit Corporation
- Siyuan CHE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPTIMIZING OPC LITHOGRAPHY MODEL PARAMETERS
- Publication number 20240184196
- Publication date Jun 6, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenbin WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING BRIDGING PROCESS WINDOW OF CONTACT HOLE AND G...
- Publication number 20240170277
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yenxia HAO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
EPITAXIAL GROWTH METHOD FOR FDSOI HYBRID REGION
- Publication number 20240170287
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING MULTIPLE WORK FUNCTION LAYERS
- Publication number 20240170279
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Hongzhu ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HV DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20240170572
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhi TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HV DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20240170573
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhi TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SOURCE/DRAIN EPITAXIAL LAYER OF FDSOI MOSFET
- Publication number 20240170344
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING RAISED STRIP-SHAPED ACTIVE AREAS
- Publication number 20240170292
- Publication date May 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yang HE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING METAL ZERO LAYER
- Publication number 20240162330
- Publication date May 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Haibo LEI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
N-TYPE MOSFET
- Publication number 20240162292
- Publication date May 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Wenyin Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING METAL GATE
- Publication number 20240154005
- Publication date May 9, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhou YAO
- H01 - BASIC ELECTRIC ELEMENTS

Shanghai Huali Integrated Circuit Corporation

Organization

Patents Grantslast 30 patents

FinFET standard cell with double self-aligned contacts and method t...

Method for manufacturing fin field effect transistor

Circuit for temperature stress test for memory chips

Semi-floating gate memory device and method for fabricating the same

Dual-port SRAM

Wafer transfer module and method thereof for transferring to-be-tra...

Manufacturing method for integrating gate dielectric layers of diff...

Semi-floating gate device

Test structure and test method for online detection of metal via op...

Capacitor integrated in FinFET device and method for fabricating th...

FDSOI device structure and preparation method thereof

Distributed LDO structure without external capacitor

Fin semiconductor device and method for making the same

Method for improving overlay metrology accuracy of self-aligned mul...

Method and structure for detecting physical short-circuit defect be...

Method for improving metal work function boundary effect

Stack capacitor, a flash memory device and a manufacturing method t...

Method of copper plating filling

Method for manufacturing fin field-effect transistor

Method for cutting off FIN field effect transistor

Method for manufacturing FDSOI

Double control gate semi-floating gate transistor and method for pr...

FinFET transistor cut etching process method

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Image processing method and device for CDSEM

FDSOI device structure and preparation method thereof

Method for etching back hard mask layer on tops of dummy polysilico...

Manufacturing method of Fin field-effect transistor

Method for manufacturing 1.5T SONOS flash memory

Patents Applicationslast 30 patents

TEST METHOD FOR IMPROVING IO DEVICE YIELD

PROCESS METHOD FOR IMPROVING SRAM OPERATING SPEED

AUXILIARY COLORING METHOD FOR APERIODIC PATTERN QUAD-COLOR SPLIT

APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...

STATIC RANDOM-ACCESS MEMORY AND INTEGRATED CIRCUIT LAYOUT THEREOF

EFUSE UNIT AND APPLICATION CIRCUIT THEREOF

EFUSE UNIT AND APPLICATION CIRCUIT THEREOF

METHOD FOR MEASURING THICKNESS OF SILICON EPITAXIAL LAYER

Bottom Layer Metal Interconnection Line Structure

PROCESS INTEGRATION METHOD FOR IMPROVING LEAKAGE IN MV DEVICE

Failure Analysis and Location Method for Short Circuit Structure

Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device

NOVEL CAPACITIVE DAC STRUCTURE

Wafer Temperature Control System and Control Method, Computer Devic...

A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS

Method of Back End of Line Metal Via Process

METHOD FOR MONITORING GATE OXIDE THICKNESS

DEVICE LEAKAGE CURRENT MODEL AND METHOD FOR EXTRACTING THE SAME

METHOD FOR FABRICATING FULLY DEPLETED SILICON-ON-INSULATOR PMOS DEV...

METHOD FOR OPTIMIZING OPC LITHOGRAPHY MODEL PARAMETERS

METHOD FOR INCREASING BRIDGING PROCESS WINDOW OF CONTACT HOLE AND G...

EPITAXIAL GROWTH METHOD FOR FDSOI HYBRID REGION

METHOD FOR FABRICATING MULTIPLE WORK FUNCTION LAYERS

HV DEVICE AND METHOD FOR MANUFACTURING SAME

HV DEVICE AND METHOD FOR MANUFACTURING SAME

METHOD FOR MANUFACTURING SOURCE/DRAIN EPITAXIAL LAYER OF FDSOI MOSFET

METHOD FOR MANUFACTURING RAISED STRIP-SHAPED ACTIVE AREAS

METHOD FOR MANUFACTURING METAL ZERO LAYER

N-TYPE MOSFET

METHOD FOR MANUFACTURING METAL GATE