Shanghai Huali Integrated Circuit Corporation

Organization

Shanghai, CN

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for forming fin structure in fin field effect transistor pro...
- Patent number 12,224,176
- Issue date Feb 11, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xiaobo Guo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse link programming cell, programming circuit, control circuit, a...
- Patent number 12,198,771
- Issue date Jan 14, 2025
- Shanghai Huali Integrated Circuit Corporation
- Ying Yan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for predicting yield of semiconductor devices
- Patent number 12,198,061
- Issue date Jan 14, 2025
- Shanghai Huali Integrated Circuit Corporation
- Shanshan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing fin field effect transistor
- Patent number 12,148,670
- Issue date Nov 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming FinFET super well
- Patent number 12,136,551
- Issue date Nov 5, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET standard cell with double self-aligned contacts and method t...
- Patent number 12,062,659
- Issue date Aug 13, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing fin field effect transistor
- Patent number 12,046,518
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for temperature stress test for memory chips
- Patent number 12,044,723
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Semi-floating gate memory device and method for fabricating the same
- Patent number 12,040,413
- Issue date Jul 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-port SRAM
- Patent number 12,009,818
- Issue date Jun 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Pinhan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer transfer module and method thereof for transferring to-be-tra...
- Patent number 11,972,963
- Issue date Apr 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yu Ren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Manufacturing method for integrating gate dielectric layers of diff...
- Patent number 11,961,740
- Issue date Apr 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lian Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-floating gate device
- Patent number 11,955,524
- Issue date Apr 9, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and test method for online detection of metal via op...
- Patent number 11,906,572
- Issue date Feb 20, 2024
- Shanghai Huali Integrated Circuit Corporation
- Shumiao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor integrated in FinFET device and method for fabricating th...
- Patent number 11,887,983
- Issue date Jan 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Rui Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,855,212
- Issue date Dec 26, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed LDO structure without external capacitor
- Patent number 11,841,723
- Issue date Dec 12, 2023
- Shanghai Huali Integrated Circuit Corporation
- Xiangyang Li
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fin semiconductor device and method for making the same
- Patent number 11,810,965
- Issue date Nov 7, 2023
- Shanghai Huali Integrated Circuit Corporation
- Qiuming Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving overlay metrology accuracy of self-aligned mul...
- Patent number 11,762,303
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yuyang Bian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and structure for detecting physical short-circuit defect be...
- Patent number 11,764,116
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Shuhua Lei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving metal work function boundary effect
- Patent number 11,756,798
- Issue date Sep 12, 2023
- Shanghai Huali Integrated Circuit Corporation
- Wenyin Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack capacitor, a flash memory device and a manufacturing method t...
- Patent number 11,737,268
- Issue date Aug 22, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhi Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of copper plating filling
- Patent number 11,728,213
- Issue date Aug 15, 2023
- Shanghai Huali Integrated Circuit Corporation
- Junjie Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing fin field-effect transistor
- Patent number 11,646,233
- Issue date May 9, 2023
- Shanghai Huali Integrated Circuit Corporation
- Tiancai Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cutting off FIN field effect transistor
- Patent number 11,640,910
- Issue date May 2, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yenchan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing FDSOI
- Patent number 11,640,923
- Issue date May 2, 2023
- Shanghai Huali Integrated Circuit Corporation
- Tianpeng Guan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double control gate semi-floating gate transistor and method for pr...
- Patent number 11,637,187
- Issue date Apr 25, 2023
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET transistor cut etching process method
- Patent number 11,637,194
- Issue date Apr 25, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yenchan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,610,981
- Issue date Mar 21, 2023
- Shanghai Huali Integrated Circuit Corporation
- Changhung Kung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,581,225
- Issue date Feb 14, 2023
- Shanghai Huali Integrated Circuit Corporation
- Changhung Kung
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING ALUMINUM PAD OF SEMICONDUCTOR CHIP
- Publication number 20250062254
- Publication date Feb 20, 2025
- Shanghai Huali Integrated Circuit Corporation
- Tianquan SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING STEP HEIGHT OF EPITAXIAL LAYER OF CMOS DEVICE
- Publication number 20250054814
- Publication date Feb 13, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zexiao YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE
- Publication number 20250038054
- Publication date Jan 30, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qianqian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE MODIFICATION METHOD FOR REDUCING WAFER DEFECTS
- Publication number 20250031461
- Publication date Jan 23, 2025
- Shanghai Huali Integrated Circuit Corporation
- Jin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTRIBUTED POWER SUPPLY SWITCHING CIRCUIT FOR EFUSE MEMORY
- Publication number 20250029668
- Publication date Jan 23, 2025
- Shanghai Huali Integrated Circuit Corporation
- Chuyi HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR ADJUSTING LINEWIDTH DUE TO PATTERN LOAD EFFECT IN SADP M...
- Publication number 20250022717
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Liyuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING QUALITY OF CDSEM IMAGES
- Publication number 20250022108
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhenbin WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...
- Publication number 20250020751
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xiaoming LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING FDSOI DEVICE LEAKAGE
- Publication number 20250006743
- Publication date Jan 2, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xing Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING RESIDUE FORMATION AFTER MANDREL REMOVAL
- Publication number 20240429059
- Publication date Dec 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Tianchen Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING MEASUREMENT ERRORS IN CRITICAL PATTERN DIMENSIO...
- Publication number 20240429107
- Publication date Dec 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Guanbo Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE METAL GATE DEVICE AND PROCESS METHOD FOR THE SAME
- Publication number 20240421210
- Publication date Dec 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhi TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING DAMAGE TO FLOATING GATE POLYSILICON DURING ETCHING
- Publication number 20240421215
- Publication date Dec 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Cuili Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPER FLASH AND METHOD FOR MANUFACTURING SAME
- Publication number 20240379879
- Publication date Nov 14, 2024
- Shanghai Huali Integrated Circuit Corporation
- Caiyun CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Four-Terminal Resistance Testing Structure
- Publication number 20240379472
- Publication date Nov 14, 2024
- Shanghai Huali Integrated Circuit Corporation
- Hao Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST METHOD FOR IMPROVING IO DEVICE YIELD
- Publication number 20240353468
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiacheng Wen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROCESS METHOD FOR IMPROVING SRAM OPERATING SPEED
- Publication number 20240357791
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yuan Yuan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AUXILIARY COLORING METHOD FOR APERIODIC PATTERN QUAD-COLOR SPLIT
- Publication number 20240346216
- Publication date Oct 17, 2024
- Shanghai Huali Integrated Circuit Corporation
- Baoxuan LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...
- Publication number 20240344884
- Publication date Oct 17, 2024
- Shanghai Huali Integrated Circuit Corporation
- Peng CHENG
- G02 - OPTICS
Information Patent Application
STATIC RANDOM-ACCESS MEMORY AND INTEGRATED CIRCUIT LAYOUT THEREOF
- Publication number 20240321346
- Publication date Sep 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Mu CAO
- G11 - INFORMATION STORAGE
Information Patent Application
EFUSE UNIT AND APPLICATION CIRCUIT THEREOF
- Publication number 20240312544
- Publication date Sep 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Ying Yan
- G11 - INFORMATION STORAGE
Information Patent Application
EFUSE UNIT AND APPLICATION CIRCUIT THEREOF
- Publication number 20240312545
- Publication date Sep 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Ying YAN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MEASURING THICKNESS OF SILICON EPITAXIAL LAYER
- Publication number 20240282646
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bottom Layer Metal Interconnection Line Structure
- Publication number 20240282701
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yekai Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS INTEGRATION METHOD FOR IMPROVING LEAKAGE IN MV DEVICE
- Publication number 20240282635
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qiwei WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Failure Analysis and Location Method for Short Circuit Structure
- Publication number 20240282648
- Publication date Aug 22, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lingye Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL CAPACITIVE DAC STRUCTURE
- Publication number 20240275398
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jingping GU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device
- Publication number 20240269799
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jian Zhang
- B24 - GRINDING POLISHING
Information Patent Application
Wafer Temperature Control System and Control Method, Computer Devic...
- Publication number 20240269797
- Publication date Aug 15, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qingqing Duan
- B24 - GRINDING POLISHING
Information Patent Application
A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS
- Publication number 20240264222
- Publication date Aug 8, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING

Shanghai Huali Integrated Circuit Corporation

Organization

Patents Grantslast 30 patents

Method for forming fin structure in fin field effect transistor pro...

Fuse link programming cell, programming circuit, control circuit, a...

Method and apparatus for predicting yield of semiconductor devices

Method for manufacturing fin field effect transistor

Method for forming FinFET super well

FinFET standard cell with double self-aligned contacts and method t...

Method for manufacturing fin field effect transistor

Circuit for temperature stress test for memory chips

Semi-floating gate memory device and method for fabricating the same

Dual-port SRAM

Wafer transfer module and method thereof for transferring to-be-tra...

Manufacturing method for integrating gate dielectric layers of diff...

Semi-floating gate device

Test structure and test method for online detection of metal via op...

Capacitor integrated in FinFET device and method for fabricating th...

FDSOI device structure and preparation method thereof

Distributed LDO structure without external capacitor

Fin semiconductor device and method for making the same

Method for improving overlay metrology accuracy of self-aligned mul...

Method and structure for detecting physical short-circuit defect be...

Method for improving metal work function boundary effect

Stack capacitor, a flash memory device and a manufacturing method t...

Method of copper plating filling

Method for manufacturing fin field-effect transistor

Method for cutting off FIN field effect transistor

Method for manufacturing FDSOI

Double control gate semi-floating gate transistor and method for pr...

FinFET transistor cut etching process method

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING ALUMINUM PAD OF SEMICONDUCTOR CHIP

METHOD FOR MONITORING STEP HEIGHT OF EPITAXIAL LAYER OF CMOS DEVICE

TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE

SURFACE MODIFICATION METHOD FOR REDUCING WAFER DEFECTS

DISTRIBUTED POWER SUPPLY SWITCHING CIRCUIT FOR EFUSE MEMORY

METHOD FOR ADJUSTING LINEWIDTH DUE TO PATTERN LOAD EFFECT IN SADP M...

METHOD FOR IMPROVING QUALITY OF CDSEM IMAGES

METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...

METHOD FOR IMPROVING FDSOI DEVICE LEAKAGE

METHOD FOR IMPROVING RESIDUE FORMATION AFTER MANDREL REMOVAL

METHOD FOR REDUCING MEASUREMENT ERRORS IN CRITICAL PATTERN DIMENSIO...

HIGH-VOLTAGE METAL GATE DEVICE AND PROCESS METHOD FOR THE SAME

METHOD FOR REDUCING DAMAGE TO FLOATING GATE POLYSILICON DURING ETCHING

SUPER FLASH AND METHOD FOR MANUFACTURING SAME

Four-Terminal Resistance Testing Structure

TEST METHOD FOR IMPROVING IO DEVICE YIELD

PROCESS METHOD FOR IMPROVING SRAM OPERATING SPEED

AUXILIARY COLORING METHOD FOR APERIODIC PATTERN QUAD-COLOR SPLIT

APPARATUS FOR FILTERING LIGHTING SOURCE OF SEMICONDUCTOR APPEARANCE...

STATIC RANDOM-ACCESS MEMORY AND INTEGRATED CIRCUIT LAYOUT THEREOF

EFUSE UNIT AND APPLICATION CIRCUIT THEREOF

EFUSE UNIT AND APPLICATION CIRCUIT THEREOF

METHOD FOR MEASURING THICKNESS OF SILICON EPITAXIAL LAYER

Bottom Layer Metal Interconnection Line Structure

PROCESS INTEGRATION METHOD FOR IMPROVING LEAKAGE IN MV DEVICE

Failure Analysis and Location Method for Short Circuit Structure

NOVEL CAPACITIVE DAC STRUCTURE

Wafer Polishing Locating Ring and Chemical Mechanical Polishing Device

Wafer Temperature Control System and Control Method, Computer Devic...

A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS

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