Shanghai Huali Integrated Circuit Corporation

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Shanghai, CN

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Method for growing multiple layers of source drain epitaxial silico...
- Patent number 12,369,395
- Issue date Jul 22, 2025
- Shanghai Huali Integrated Circuit Corporation
- Peng Zhao
Information Patent Grant
Multilevel voltage detector circuit
- Patent number 12,340,854
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Yu Jia
- G01 - MEASURING TESTING
Information Patent Grant
Method of failure analysis for defect locations
- Patent number 12,339,202
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wet clean apparatus for single wafer
- Patent number 12,341,029
- Issue date Jun 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Wenqian Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dose mapper method
- Patent number 12,326,664
- Issue date Jun 10, 2025
- Shanghai Huali Integrated Circuit Corporation
- Shuo Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for manufacturing isolation structure of hybrid epitaxial ar...
- Patent number 12,308,281
- Issue date May 20, 2025
- Shanghai Huali Integrated Circuit Corporation
- Yongyue Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Epitaxial growth method for FDSOI hybrid region
- Patent number 12,308,232
- Issue date May 20, 2025
- Shanghai Huali Integrated Circuit Corporation
- Jiaqi Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing metal gate of PMOS
- Patent number 12,295,153
- Issue date May 6, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhaoqin Zeng
Information Patent Grant
Method for manufacturing metal gate
- Patent number 12,284,824
- Issue date Apr 22, 2025
- Shanghai Huali Integrated Circuit Corporation
- Yanxia Hao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for avoiding damage to overlay metrology mark
- Patent number 12,276,920
- Issue date Apr 15, 2025
- Shanghai Huali Integrated Circuit Corporation
- Chengchang Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testability circuit and read and write path decoupling circuit of SRAM
- Patent number 12,260,924
- Issue date Mar 25, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for forming fin structure in fin field effect transistor pro...
- Patent number 12,224,176
- Issue date Feb 11, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xiaobo Guo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse link programming cell, programming circuit, control circuit, a...
- Patent number 12,198,771
- Issue date Jan 14, 2025
- Shanghai Huali Integrated Circuit Corporation
- Ying Yan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for predicting yield of semiconductor devices
- Patent number 12,198,061
- Issue date Jan 14, 2025
- Shanghai Huali Integrated Circuit Corporation
- Shanshan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing fin field effect transistor
- Patent number 12,148,670
- Issue date Nov 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming FinFET super well
- Patent number 12,136,551
- Issue date Nov 5, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET standard cell with double self-aligned contacts and method t...
- Patent number 12,062,659
- Issue date Aug 13, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing fin field effect transistor
- Patent number 12,046,518
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yong Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit for temperature stress test for memory chips
- Patent number 12,044,723
- Issue date Jul 23, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhenan Lai
- G01 - MEASURING TESTING
Information Patent Grant
Semi-floating gate memory device and method for fabricating the same
- Patent number 12,040,413
- Issue date Jul 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-port SRAM
- Patent number 12,009,818
- Issue date Jun 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Pinhan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer transfer module and method thereof for transferring to-be-tra...
- Patent number 11,972,963
- Issue date Apr 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Yu Ren
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Manufacturing method for integrating gate dielectric layers of diff...
- Patent number 11,961,740
- Issue date Apr 16, 2024
- Shanghai Huali Integrated Circuit Corporation
- Lian Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semi-floating gate device
- Patent number 11,955,524
- Issue date Apr 9, 2024
- Shanghai Huali Integrated Circuit Corporation
- Heng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and test method for online detection of metal via op...
- Patent number 11,906,572
- Issue date Feb 20, 2024
- Shanghai Huali Integrated Circuit Corporation
- Shumiao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor integrated in FinFET device and method for fabricating th...
- Patent number 11,887,983
- Issue date Jan 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Rui Pan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,855,212
- Issue date Dec 26, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed LDO structure without external capacitor
- Patent number 11,841,723
- Issue date Dec 12, 2023
- Shanghai Huali Integrated Circuit Corporation
- Xiangyang Li
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fin semiconductor device and method for making the same
- Patent number 11,810,965
- Issue date Nov 7, 2023
- Shanghai Huali Integrated Circuit Corporation
- Qiuming Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improving overlay metrology accuracy of self-aligned mul...
- Patent number 11,762,303
- Issue date Sep 19, 2023
- Shanghai Huali Integrated Circuit Corporation
- Yuyang Bian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR FORMING HYBRID SUBSTRATE OF SOI WAFER
- Publication number 20250226260
- Publication date Jul 10, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zifang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIS PIXEL READOUT STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250151424
- Publication date May 8, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiwei WANG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CIS PIXEL READOUT CIRCUIT STRUCTURE AND METHOD FOR FABRICATING THE...
- Publication number 20250150735
- Publication date May 8, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiwei WANG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR MANUFACTURING NOR FLASH
- Publication number 20250142819
- Publication date May 1, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qiwei WANG
Information Patent Application
POLYSILICON GATE ETCH METHOD
- Publication number 20250140571
- Publication date May 1, 2025
- Shanghai Huali Integrated Circuit Corporation
- Jin XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND STRUCTURE FOR IMPROVING ESD PERFORMANCE OF METAL-GATE HI...
- Publication number 20250133813
- Publication date Apr 24, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhi TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE VARIATION EXTRACTION CHIP
- Publication number 20250102556
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTACT FILLING METHOD
- Publication number 20250105060
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhiqi YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING PERFORMANCE OF MOS DEVICE
- Publication number 20250107225
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Huiyun JIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING MOS CAPACITOR BASED ON SONOS PROCESS
- Publication number 20250107111
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Peng Zhao
Information Patent Application
MEMORY CIRCUIT
- Publication number 20250069671
- Publication date Feb 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Hao LIU
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-PORT SRAM CIRCUIT
- Publication number 20250069650
- Publication date Feb 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR REDUCING RESISTANCE OF CONTACT
- Publication number 20250069949
- Publication date Feb 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhaoqin ZENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING RESISTIVE RANDOM ACCESS MEMORY AND RESISTI...
- Publication number 20250072301
- Publication date Feb 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Wuzhi ZHANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MANUFACTURING ALUMINUM PAD OF SEMICONDUCTOR CHIP
- Publication number 20250062254
- Publication date Feb 20, 2025
- Shanghai Huali Integrated Circuit Corporation
- Tianquan SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING STEP HEIGHT OF EPITAXIAL LAYER OF CMOS DEVICE
- Publication number 20250054814
- Publication date Feb 13, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zexiao YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE
- Publication number 20250038054
- Publication date Jan 30, 2025
- Shanghai Huali Integrated Circuit Corporation
- Qianqian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE MODIFICATION METHOD FOR REDUCING WAFER DEFECTS
- Publication number 20250031461
- Publication date Jan 23, 2025
- Shanghai Huali Integrated Circuit Corporation
- Jin Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISTRIBUTED POWER SUPPLY SWITCHING CIRCUIT FOR EFUSE MEMORY
- Publication number 20250029668
- Publication date Jan 23, 2025
- Shanghai Huali Integrated Circuit Corporation
- Chuyi HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR ADJUSTING LINEWIDTH DUE TO PATTERN LOAD EFFECT IN SADP M...
- Publication number 20250022717
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Liyuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING QUALITY OF CDSEM IMAGES
- Publication number 20250022108
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Zhenbin WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...
- Publication number 20250020751
- Publication date Jan 16, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xiaoming LIU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING FDSOI DEVICE LEAKAGE
- Publication number 20250006743
- Publication date Jan 2, 2025
- Shanghai Huali Integrated Circuit Corporation
- Xing Gao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING RESIDUE FORMATION AFTER MANDREL REMOVAL
- Publication number 20240429059
- Publication date Dec 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Tianchen Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING MEASUREMENT ERRORS IN CRITICAL PATTERN DIMENSIO...
- Publication number 20240429107
- Publication date Dec 26, 2024
- Shanghai Huali Integrated Circuit Corporation
- Guanbo Yin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE METAL GATE DEVICE AND PROCESS METHOD FOR THE SAME
- Publication number 20240421210
- Publication date Dec 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Zhi TIAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING DAMAGE TO FLOATING GATE POLYSILICON DURING ETCHING
- Publication number 20240421215
- Publication date Dec 19, 2024
- Shanghai Huali Integrated Circuit Corporation
- Cuili Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPER FLASH AND METHOD FOR MANUFACTURING SAME
- Publication number 20240379879
- Publication date Nov 14, 2024
- Shanghai Huali Integrated Circuit Corporation
- Caiyun CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Four-Terminal Resistance Testing Structure
- Publication number 20240379472
- Publication date Nov 14, 2024
- Shanghai Huali Integrated Circuit Corporation
- Hao Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST METHOD FOR IMPROVING IO DEVICE YIELD
- Publication number 20240353468
- Publication date Oct 24, 2024
- Shanghai Huali Integrated Circuit Corporation
- Jiacheng Wen
- H03 - BASIC ELECTRONIC CIRCUITRY

Shanghai Huali Integrated Circuit Corporation

Organization

Patents Grantslast 30 patents

Method for growing multiple layers of source drain epitaxial silico...

Multilevel voltage detector circuit

Method of failure analysis for defect locations

Wet clean apparatus for single wafer

Dose mapper method

Method for manufacturing isolation structure of hybrid epitaxial ar...

Epitaxial growth method for FDSOI hybrid region

Method for manufacturing metal gate of PMOS

Method for manufacturing metal gate

Method for avoiding damage to overlay metrology mark

Testability circuit and read and write path decoupling circuit of SRAM

Method for forming fin structure in fin field effect transistor pro...

Fuse link programming cell, programming circuit, control circuit, a...

Method and apparatus for predicting yield of semiconductor devices

Method for manufacturing fin field effect transistor

Method for forming FinFET super well

FinFET standard cell with double self-aligned contacts and method t...

Method for manufacturing fin field effect transistor

Circuit for temperature stress test for memory chips

Semi-floating gate memory device and method for fabricating the same

Dual-port SRAM

Wafer transfer module and method thereof for transferring to-be-tra...

Manufacturing method for integrating gate dielectric layers of diff...

Semi-floating gate device

Test structure and test method for online detection of metal via op...

Capacitor integrated in FinFET device and method for fabricating th...

FDSOI device structure and preparation method thereof

Distributed LDO structure without external capacitor

Fin semiconductor device and method for making the same

Method for improving overlay metrology accuracy of self-aligned mul...

Patents Applicationslast 30 patents

METHOD FOR FORMING HYBRID SUBSTRATE OF SOI WAFER

CIS PIXEL READOUT STRUCTURE AND METHOD FOR FABRICATING THE SAME

CIS PIXEL READOUT CIRCUIT STRUCTURE AND METHOD FOR FABRICATING THE...

METHOD FOR MANUFACTURING NOR FLASH

POLYSILICON GATE ETCH METHOD

METHOD AND STRUCTURE FOR IMPROVING ESD PERFORMANCE OF METAL-GATE HI...

DEVICE VARIATION EXTRACTION CHIP

CONTACT FILLING METHOD

METHOD FOR IMPROVING PERFORMANCE OF MOS DEVICE

METHOD FOR FABRICATING MOS CAPACITOR BASED ON SONOS PROCESS

MEMORY CIRCUIT

THREE-PORT SRAM CIRCUIT

METHOD FOR REDUCING RESISTANCE OF CONTACT

METHOD FOR MANUFACTURING RESISTIVE RANDOM ACCESS MEMORY AND RESISTI...

METHOD FOR MANUFACTURING ALUMINUM PAD OF SEMICONDUCTOR CHIP

METHOD FOR MONITORING STEP HEIGHT OF EPITAXIAL LAYER OF CMOS DEVICE

TEST STRUCTURE AND METHOD FOR CALIBRATING GATE PARASITIC CAPACITANCE

SURFACE MODIFICATION METHOD FOR REDUCING WAFER DEFECTS

DISTRIBUTED POWER SUPPLY SWITCHING CIRCUIT FOR EFUSE MEMORY

METHOD FOR ADJUSTING LINEWIDTH DUE TO PATTERN LOAD EFFECT IN SADP M...

METHOD FOR IMPROVING QUALITY OF CDSEM IMAGES

METHOD FOR CORRECTING CAPACITANCE MEASUREMENT VALUE UNDER HIGH LEAK...

METHOD FOR IMPROVING FDSOI DEVICE LEAKAGE

METHOD FOR IMPROVING RESIDUE FORMATION AFTER MANDREL REMOVAL

METHOD FOR REDUCING MEASUREMENT ERRORS IN CRITICAL PATTERN DIMENSIO...

HIGH-VOLTAGE METAL GATE DEVICE AND PROCESS METHOD FOR THE SAME

METHOD FOR REDUCING DAMAGE TO FLOATING GATE POLYSILICON DURING ETCHING

SUPER FLASH AND METHOD FOR MANUFACTURING SAME

Four-Terminal Resistance Testing Structure

TEST METHOD FOR IMPROVING IO DEVICE YIELD

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