Shanghai Huali Integrated Circuit Mfg. Co., Ltd.

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Analysis method for semiconductor device
- Patent number 11,829,893
- Issue date Nov 28, 2023
- SHANGHAI HUALI INTEGRATED CIRCUIT MFG. CO., LTD.
- Ping-Hsun Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion implantation method and ion implanter for performing the same
- Patent number 11,482,401
- Issue date Oct 25, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Chaorong Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET and a manufacturing method of a contact thereof
- Patent number 11,374,102
- Issue date Jun 28, 2022
- SHANGHAI HUALI INTEGRATED CIRCUIT MFG. CO., LTD.
- Yongji Mao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile flash memory device and a manufacturing method thereof
- Patent number 11,335,692
- Issue date May 17, 2022
- SHANGHAI HUALI INTEGRATED CIRCUIT MFG. CO., LTD.
- Qiwei Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile memory device having a memory-transistor gate-electrode...
- Patent number 11,315,942
- Issue date Apr 26, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Xiaoliang Tang
- G11 - INFORMATION STORAGE
Information Patent Grant
Ultra-low k dielectric layer and manufacturing method thereof
- Patent number 11,309,180
- Issue date Apr 19, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Yiqi Gong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis method for semiconductor device
- Patent number 11,307,240
- Issue date Apr 19, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Ping-Hsun Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis method for semiconductor device
- Patent number 11,243,245
- Issue date Feb 8, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Ping-Hsun Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for analyzing semiconductor wafer
- Patent number 11,244,444
- Issue date Feb 8, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Xiao Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit structure for in-memory computing
- Patent number 11,238,922
- Issue date Feb 1, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Zhen'an Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for positioning short circuit failure
- Patent number 11,215,658
- Issue date Jan 4, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Lingye Yang
- G01 - MEASURING TESTING
Information Patent Grant
Etching method and a semiconductor device
- Patent number 11,152,220
- Issue date Oct 19, 2021
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Penggang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Failure positioning method
- Patent number 11,125,804
- Issue date Sep 21, 2021
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Lingye Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electric fuse structure for optimizing programming current window o...
- Patent number 10,886,216
- Issue date Jan 5, 2021
- SHANGHAI HUALI INTEGRATED CIRCUIT MFG. CO., LTD.
- Yanwei Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NON-VOLATILE FLASH MEMORY DEVICE AND A MANUFACTURING METHOD THEREOF
- Publication number 20210320112
- Publication date Oct 14, 2021
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Qiwei WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET AND A MANUFACTURING METHOD OF A CONTACT THEREOF
- Publication number 20210305383
- Publication date Sep 30, 2021
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Yongji MAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT STRUCTURE FOR IN-MEMORY COMPUTING
- Publication number 20210304815
- Publication date Sep 30, 2021
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Zhen'an LAI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20210151349
- Publication date May 20, 2021
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Nianheng ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTATION METHOD AND ION IMPLANTER FOR PERFORMING THE SAME
- Publication number 20200388465
- Publication date Dec 10, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Chaorong Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-LOW K DIELECTRIC LAYER AND MANUFACTURING METHOD THEREOF
- Publication number 20200357632
- Publication date Nov 12, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Yiqi GONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20200309843
- Publication date Oct 1, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Ping-Hsun SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20200309842
- Publication date Oct 1, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Ping-Hsun SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Method for Semiconductor Device
- Publication number 20200311578
- Publication date Oct 1, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Ping-Hsun SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20200211637
- Publication date Jul 2, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Xiaojun ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR POSITIONING SHORT CIRCUIT FAILURE
- Publication number 20200191861
- Publication date Jun 18, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Lingye YANG
- G01 - MEASURING TESTING
Information Patent Application
FAILURE POSITIONING METHOD
- Publication number 20200191859
- Publication date Jun 18, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Lingye YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PIXEL STRUCTURE AND MANUFACTURING METHOD THEREFOR
- Publication number 20200075654
- Publication date Mar 5, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Yan LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FUSE STRUCTURE AND MANUFACTURING METHOD THEREFOR
- Publication number 20200035600
- Publication date Jan 30, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Yanwei ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR GATE STRUCTURE, AND MANUFACTURING METHOD THEREFOR
- Publication number 20190378907
- Publication date Dec 12, 2019
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Shiming WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD FOR SAME
- Publication number 20190378910
- Publication date Dec 12, 2019
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Yang SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD FOR READING CURRENT OF STATIC RANDOM ACCESS MEMORY
- Publication number 20190341121
- Publication date Nov 7, 2019
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Pinhan CHEN
- G11 - INFORMATION STORAGE

Shanghai Huali Integrated Circuit Mfg. Co., Ltd.

Organization

Patents Grantslast 30 patents

Analysis method for semiconductor device

Ion implantation method and ion implanter for performing the same

FinFET and a manufacturing method of a contact thereof

Non-volatile flash memory device and a manufacturing method thereof

Nonvolatile memory device having a memory-transistor gate-electrode...

Ultra-low k dielectric layer and manufacturing method thereof

Analysis method for semiconductor device

Analysis method for semiconductor device

Method and apparatus for analyzing semiconductor wafer

Circuit structure for in-memory computing

Method for positioning short circuit failure

Etching method and a semiconductor device

Failure positioning method

Electric fuse structure for optimizing programming current window o...

Patents Applicationslast 30 patents

NON-VOLATILE FLASH MEMORY DEVICE AND A MANUFACTURING METHOD THEREOF

FINFET AND A MANUFACTURING METHOD OF A CONTACT THEREOF

CIRCUIT STRUCTURE FOR IN-MEMORY COMPUTING

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

ION IMPLANTATION METHOD AND ION IMPLANTER FOR PERFORMING THE SAME

ULTRA-LOW K DIELECTRIC LAYER AND MANUFACTURING METHOD THEREOF

ANALYSIS METHOD FOR SEMICONDUCTOR DEVICE

ANALYSIS METHOD FOR SEMICONDUCTOR DEVICE

Analysis Method for Semiconductor Device

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

METHOD FOR POSITIONING SHORT CIRCUIT FAILURE

FAILURE POSITIONING METHOD

PIXEL STRUCTURE AND MANUFACTURING METHOD THEREFOR

ELECTRIC FUSE STRUCTURE AND MANUFACTURING METHOD THEREFOR

TRANSISTOR GATE STRUCTURE, AND MANUFACTURING METHOD THEREFOR

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD FOR SAME

TESTING METHOD FOR READING CURRENT OF STATIC RANDOM ACCESS MEMORY

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