Kansas City, KS, US
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Patent Grant
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Quynh Ngoc Nguyen
G01 - MEASURING TESTING
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Patent Grant
Smiths Interconnect Americas, Inc.
Robert Milligan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Moamer Hasanovic
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Jiachun Zhou
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Jiachun Zhou
G01 - MEASURING TESTING
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Patent Grant
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Jedidiah Bentz
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Christopher Raymond Hawn
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Smiths Interconnect Americas, Inc.
Arkady Shinder-Lerner
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Smiths Interconnect Americas, Inc.
Richard Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Khaled Elmadbouly
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Jiachun Zhou
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Application
Smiths Interconnect Americas, Inc.
Jiachun Zhou
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Khaled Elmadbouly
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Mathew Kurien
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Moamer Hasanovic
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Antares Advanced Test Technologies (Suzhou) Limited
Jiachun Zhou
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Mathew Kurien
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Peter Ursu
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Quynh Ngoc Nguyen
G01 - MEASURING TESTING
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Patent Application
Smiths Interconnect Americas, Inc.
Moamer Hasanovic
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Application
Smiths Interconnect Americas, Inc.
Moamer Hasanovic
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Robert Milligan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Jiachun Zhou
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Jedidiah Bentz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Smiths Interconnect Americas, Inc.
Arkady Shinder-Lerner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Smiths Interconnect Americas, Inc.
Jiachun Zhou
G01 - MEASURING TESTING
Information
Patent Application
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Smiths Interconnect Americas, Inc.
Richard A. Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Christopher Raymond Hawn
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Smiths Interconnect Americas, Inc.
Richard Johannes
H01 - BASIC ELECTRIC ELEMENTS
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Trademark
Smiths Interconnect Americas, Inc.
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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Trademark
Hypertronics Corporation
9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
