SPECS ZURICH GMBH

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ZURICH, CH

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring a piezoelectric response by means of a scannin...
- Patent number 8,950,010
- Issue date Feb 3, 2015
- Specs Zurich GmbH
- Jörg Rychen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and method for operating the same
- Patent number 8,347,411
- Issue date Jan 1, 2013
- Specs Zurich GmbH
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope with current controlled actuator
- Patent number 8,296,857
- Issue date Oct 23, 2012
- Specs Zurich GmbH
- Jörg Rychen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope with periodically phase-shifted AC excita...
- Patent number 8,245,316
- Issue date Aug 14, 2012
- Specs Zurich GmbH
- Jörg Rychen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High resolution digital analog conversion circuit
- Patent number 7,773,009
- Issue date Aug 10, 2010
- Specs Zurich GmbH
- Jorg Rychen
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE WITH CURRENT CONTROLLED ACTUATOR
- Publication number 20110296564
- Publication date Dec 1, 2011
- SPECS ZURICH GMBH
- Jörg Rychen
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring a Piezoelectric Response by Means of a Scannin...
- Publication number 20110271412
- Publication date Nov 3, 2011
- SPECS ZURICH GMBH
- Jörg Rychen
- G01 - MEASURING TESTING

Trademarklast 30 trademarks