STEK LLC

Organization

REDMOND, WA, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for cleaning substrates
- Patent number 11,123,775
- Issue date Sep 21, 2021
- STEK CO., LTD
- Ming-Sheng Chen
- B08 - CLEANING
Information Patent Grant
Optical system and method for inspecting a transparent plate
- Patent number 10,345,248
- Issue date Jul 9, 2019
- STEK CO. LTD
- Ming-Sheng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspecting apparatus with an optical screening device
- Patent number 10,241,057
- Issue date Mar 26, 2019
- STEK CO., LTD
- Ming-Sheng Chen
- G06 - COMPUTING CALCULATING COUNTING

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Patents Applicationslast 30 patents

Information Patent Application
MASK INSPECTION APPARATUS WITH A PLATFORM MODULE
- Publication number 20240027922
- Publication date Jan 25, 2024
- STEK CO., LTD.
- Ming-Sheng Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK INSPECTION APPARATUS
- Publication number 20240027895
- Publication date Jan 25, 2024
- STEK CO., LTD.
- Ming-Sheng Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUBSTRATE LOADER
- Publication number 20230227273
- Publication date Jul 20, 2023
- STEK CO., LTD.
- Ming-Sheng Chen
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PRE-ALIGNER
- Publication number 20230230867
- Publication date Jul 20, 2023
- STEK CO., LTD.
- Ming-Sheng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR OPENING SNAP-SHOT CASES
- Publication number 20190333797
- Publication date Oct 31, 2019
- STEK CO., LTD
- Ming-Sheng Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
BOUNDARY DETECTOR OF AN OPTICAL INSPECTION MACHINE
- Publication number 20190331475
- Publication date Oct 31, 2019
- STEK CO., LTD
- Ming-Sheng Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CLEANING SUBSTRATES
- Publication number 20190329301
- Publication date Oct 31, 2019
- STEK CO., LTD
- Ming-Sheng Chen
- B08 - CLEANING
Information Patent Application
OPTICAL SYSTEM AND METHOD FOR INSPECTING A TRANSPARENT PLATE
- Publication number 20180238813
- Publication date Aug 23, 2018
- STEK CO., LTD
- Ming-Sheng Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTING APPARATUS WITH AN OPTICAL SCREENING DEVICE
- Publication number 20180238812
- Publication date Aug 23, 2018
- STEK CO., LTD
- Ming-Sheng Chen
- G06 - COMPUTING CALCULATING COUNTING

Organization

Patents Grantslast 30 patents

Apparatus and method for cleaning substrates

Optical system and method for inspecting a transparent plate

Optical inspecting apparatus with an optical screening device

Patents Applicationslast 30 patents

MASK INSPECTION APPARATUS WITH A PLATFORM MODULE

MASK INSPECTION APPARATUS

SUBSTRATE LOADER

PRE-ALIGNER

APPARATUS AND METHOD FOR OPENING SNAP-SHOT CASES

BOUNDARY DETECTOR OF AN OPTICAL INSPECTION MACHINE

APPARATUS AND METHOD FOR CLEANING SUBSTRATES

OPTICAL SYSTEM AND METHOD FOR INSPECTING A TRANSPARENT PLATE

OPTICAL INSPECTING APPARATUS WITH AN OPTICAL SCREENING DEVICE