TENCOR INSTRUMENTS (A CA CORP

Organization

MOUNTAIN VIEW, CA, US

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Constant-force profilometer with stylus-stabilizing sensor assembly...
- Patent number 5,705,741
- Issue date Jan 6, 1998
- Tencor Instruments
- Steven G. Eaton
- G01 - MEASURING TESTING
Information Patent Grant
Variable spot-size scanning apparatus
- Patent number 5,633,747
- Issue date May 27, 1997
- Tencor Instruments
- Mehrdad Nikoonahad
- G02 - OPTICS
Information Patent Grant
Focused beam spectroscopic ellipsometry method and system
- Patent number 5,608,526
- Issue date Mar 4, 1997
- Tencor Instruments
- Timothy R. Piwonka-Corle
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system employing a subsystem for collecting scat...
- Patent number 5,604,585
- Issue date Feb 18, 1997
- Tencor Instruments
- Ralph Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating an ellipsometer
- Patent number 5,581,350
- Issue date Dec 3, 1996
- Tencor Instruments
- Xing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment sensor
- Patent number 5,576,831
- Issue date Nov 19, 1996
- Tencor Instruments
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Surface scanning apparatus and method using crossed-cylinder optica...
- Patent number 5,565,979
- Issue date Oct 15, 1996
- Tencor Instruments
- Kenneth P. Gross
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current test method and apparatus for measuring conductance by...
- Patent number 5,552,704
- Issue date Sep 3, 1996
- Tencor Instruments
- Chester L. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Optical wafer positioning system
- Patent number 5,530,550
- Issue date Jun 25, 1996
- Tencor Instruments
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Surface scanner with thin film gauge
- Patent number 5,416,594
- Issue date May 16, 1995
- Tencor Instruments
- Kenneth P. Gross
- G01 - MEASURING TESTING
Information Patent Grant
Process for inspecting patterned wafers
- Patent number 5,355,212
- Issue date Oct 11, 1994
- Tencor Instruments
- Keith B. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Profilometer stylus assembly insensitive to vibration
- Patent number 5,309,755
- Issue date May 10, 1994
- Tencor Instruments
- William R. Wheeler
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive spatial filter for surface inspection
- Patent number 5,276,498
- Issue date Jan 4, 1994
- Tencor Instruments
- Lee K. Galbraith
- G02 - OPTICS
Information Patent Grant
Speckle reduction track filter apparatus for optical inspection of...
- Patent number 5,264,912
- Issue date Nov 23, 1993
- Tencor Instruments
- John L. Vaught
- G02 - OPTICS
Information Patent Grant
Area-division beamsplitter with broad spectral bandwidth
- Patent number 5,243,465
- Issue date Sep 7, 1993
- Tencor Instruments
- Michael E. Fein
- G02 - OPTICS
Information Patent Grant
Thin film thickness monitor
- Patent number 5,241,366
- Issue date Aug 31, 1993
- Tencor Instruments
- Christopher F. Bevis
- G01 - MEASURING TESTING
Information Patent Grant
Particle detector for rough surfaces
- Patent number 5,189,481
- Issue date Feb 23, 1993
- Tencor Instruments
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Flat field telecentric scanner
- Patent number 5,168,386
- Issue date Dec 1, 1992
- Tencor Instruments
- Lee K. Galbraith
- G02 - OPTICS
Information Patent Grant
Position location in surface scanning using interval timing between...
- Patent number 5,083,035
- Issue date Jan 21, 1992
- Tencor Instruments
- Jiri Pecen
- G02 - OPTICS
Information Patent Grant
Particle detection on a patterned or bare wafer surface
- Patent number 5,076,692
- Issue date Dec 31, 1991
- Tencor Instruments
- Armand P. Neukermans
- G01 - MEASURING TESTING
Information Patent Grant
Cantilevered microtip manufacturing by ion implantation and etching
- Patent number 5,026,437
- Issue date Jun 25, 1991
- Tencor Instruments
- Armand P. Neukermans
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Shock wave particle removal method and apparatus
- Patent number 5,023,424
- Issue date Jun 11, 1991
- Tencor Instruments
- John L. Vaught
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Photoemission contaminant detector
- Patent number 4,998,019
- Issue date Mar 5, 1991
- Tencor Instruments
- Stanley Stokowski
- G01 - MEASURING TESTING
Information Patent Grant
Via hole checker
- Patent number 4,988,877
- Issue date Jan 29, 1991
- Tencor Instruments
- Stanley Stokowksi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting and sizing particles on surfaces
- Patent number 4,967,095
- Issue date Oct 30, 1990
- Tencor Instruments
- Josef Berger
- G01 - MEASURING TESTING
Information Patent Grant
Vapor discharge lamp with gradient temperature control
- Patent number 4,965,484
- Issue date Oct 23, 1990
- Tencor Instruments
- Michael E. Fein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection on patterned wafers and the like
- Patent number 4,898,471
- Issue date Feb 6, 1990
- Tencor Instruments
- John L. Vaught
- G01 - MEASURING TESTING
Information Patent Grant
Thin film thickness measuring method
- Patent number 4,899,055
- Issue date Feb 6, 1990
- Tencor Instruments
- Arnold Adams
- G01 - MEASURING TESTING
Information Patent Grant
High brightness and viewed gas discharge lamp
- Patent number 4,877,997
- Issue date Oct 31, 1989
- Tencor Instruments
- Michael E. Fein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Suspension assembly for a scanning mirror
- Patent number 4,861,125
- Issue date Aug 29, 1989
- Tencor Instruments
- John L. Vaught
- G02 - OPTICS

Please log in for detailed analytics

Trademarklast 30 trademarks

Information Trademark
75181704 - HRP
- Serial number 75181704
- Registration number 2316918
- Filing date Oct 15, 1996
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75181771 - ULTRALITE
- Serial number 75181771
- Registration number 2446633
- Filing date Oct 15, 1996
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75181772 - DURASHARP
- Serial number 75181772
- Registration number 2444630
- Filing date Oct 15, 1996
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75074075 - DBS
- Serial number 75074075
- Filing date Mar 18, 1996
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75023317 - MICROVIEW
- Serial number 75023317
- Registration number 2236992
- Filing date Nov 22, 1995
- Tencor Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74693396 - SWIFTACCESS
- Serial number 74693396
- Filing date Jun 26, 1995
- Tencor Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73792473 - SURFSCAN
- Serial number 73792473
- Registration number 1615482
- Filing date Apr 10, 1989
- Tencor Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73757817 - TENCOR
- Serial number 73757817
- Registration number 1549939
- Filing date Oct 17, 1988
- Tencor Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73199618 - SONOGAGE RT2
- Serial number 73199618
- Registration number 1142341
- Filing date Jan 11, 1979
- Tencor Instruments
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73159311 - TI
- Serial number 73159311
- Registration number 1122240
- Filing date Feb 21, 1978
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73159312 - ALPHA-STEP
- Serial number 73159312
- Registration number 1122241
- Filing date Feb 21, 1978
- TENCOR INSTRUMENTS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

TENCOR INSTRUMENTS (A CA CORP

Organization

Patents Grantslast 30 patents

Constant-force profilometer with stylus-stabilizing sensor assembly...

Variable spot-size scanning apparatus

Focused beam spectroscopic ellipsometry method and system

Particle detection system employing a subsystem for collecting scat...

Method and system for calibrating an ellipsometer

Wafer alignment sensor

Surface scanning apparatus and method using crossed-cylinder optica...

Eddy current test method and apparatus for measuring conductance by...

Optical wafer positioning system

Surface scanner with thin film gauge

Process for inspecting patterned wafers

Profilometer stylus assembly insensitive to vibration

Adaptive spatial filter for surface inspection

Speckle reduction track filter apparatus for optical inspection of...

Area-division beamsplitter with broad spectral bandwidth

Thin film thickness monitor

Particle detector for rough surfaces

Flat field telecentric scanner

Position location in surface scanning using interval timing between...

Particle detection on a patterned or bare wafer surface

Cantilevered microtip manufacturing by ion implantation and etching

Shock wave particle removal method and apparatus

Photoemission contaminant detector

Via hole checker

Method and apparatus for detecting and sizing particles on surfaces

Vapor discharge lamp with gradient temperature control

Particle detection on patterned wafers and the like

Thin film thickness measuring method

High brightness and viewed gas discharge lamp

Suspension assembly for a scanning mirror

Trademarklast 30 trademarks

75181704 - HRP

75181771 - ULTRALITE

75181772 - DURASHARP

75074075 - DBS

75023317 - MICROVIEW

74693396 - SWIFTACCESS

73792473 - SURFSCAN

73757817 - TENCOR

73199618 - SONOGAGE RT2

73159311 - TI

73159312 - ALPHA-STEP