TOKYO SEIMITSU CO., LTD.

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TOKYO, JP

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Workpiece processing device and method
- Patent number 11,964,361
- Issue date Apr 23, 2024
- Tokyo Seimitsu Co., Ltd.
- Takahiro Iida
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Particle measurement device, three-dimensional shape measurement de...
- Patent number 11,940,463
- Issue date Mar 26, 2024
- Tokyo Seimitsu Co., Ltd.
- Natsumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device
- Patent number 11,859,969
- Issue date Jan 2, 2024
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Inner surface shape measurement device, and alignment method and ma...
- Patent number 11,740,072
- Issue date Aug 29, 2023
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Inner surface shape measurement device, and alignment method for in...
- Patent number 11,740,074
- Issue date Aug 29, 2023
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece diameter measurement method and workpiece circularity mea...
- Patent number 11,656,068
- Issue date May 23, 2023
- Tokyo Seimitsu Co., Ltd.
- Kosuke Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece processing device and method
- Patent number 11,571,785
- Issue date Feb 7, 2023
- Tokyo Seimitsu Co., Ltd.
- Takahiro Iida
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Surface shape measuring device and surface shape measuring method
- Patent number 11,525,660
- Issue date Dec 13, 2022
- Tokyo Seimitsu Co., Ltd.
- Michihiro Sekimoto
- G01 - MEASURING TESTING
Information Patent Grant
Workpiece processing device and method
- Patent number 11,504,869
- Issue date Nov 22, 2022
- Tokyo Seimitsu Co., Ltd.
- Takahiro Iida
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Workpiece processing device and method
- Patent number 11,472,055
- Issue date Oct 18, 2022
- Tokyo Seimitsu Co., Ltd.
- Takahiro Iida
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for manufacturing cutting blade, and cutting blade
- Patent number 11,458,594
- Issue date Oct 4, 2022
- Tokyo Seimitsu Co., Ltd.
- Masato Nakamura
- B24 - GRINDING POLISHING
Information Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
- Patent number 11,435,175
- Issue date Sep 6, 2022
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
- Patent number 11,397,073
- Issue date Jul 26, 2022
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measuring system, and three-dimensional measuring...
- Patent number 11,365,959
- Issue date Jun 21, 2022
- Tokyo Seimitsu Co., Ltd.
- Hitoshi Tamura
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Laser machining device and control method therefor
- Patent number 11,260,470
- Issue date Mar 1, 2022
- Tokyo Seimitsu Co., Ltd.
- Takashi Shimanuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for setting processing device
- Patent number 11,141,830
- Issue date Oct 12, 2021
- Tokyo Seimitsu Co., Ltd.
- Makoto Shimoda
- B24 - GRINDING POLISHING
Information Patent Grant
Method for processing wafer
- Patent number 11,075,071
- Issue date Jul 27, 2021
- Tokyo Seimitsu Co., Ltd.
- Ryosuke Kataoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser processing apparatus and laser processing method
- Patent number 11,065,722
- Issue date Jul 20, 2021
- Tokyo Seimitsu Co., Ltd.
- Kazushi Hyakumura
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional coordinate measurement apparatus
- Patent number 11,067,382
- Issue date Jul 20, 2021
- Tokyo Seimitsu Co., Ltd.
- Yukio Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Linear drive mechanism and shape measuring machine
- Patent number 11,025,151
- Issue date Jun 1, 2021
- Tokyo Seimitsu Co., Ltd.
- Takahiro Okano
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Laser machining device and laser machining method
- Patent number 10,950,471
- Issue date Mar 16, 2021
- Tokyo Seimitsu Co., Ltd.
- Takao Shionoya
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Positioning and fixing device
- Patent number 10,732,220
- Issue date Aug 4, 2020
- Tokyo Seimitsu Co., Ltd.
- Hiroo Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Detector, surface property measuring machine, and roundness measuri...
- Patent number 10,724,841
- Issue date Jul 28, 2020
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional coordinate measurement apparatus
- Patent number 10,663,283
- Issue date May 26, 2020
- Tokyo Seimitsu Co., Ltd.
- Yukio Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Transfer unit and prober
- Patent number 10,605,829
- Issue date Mar 31, 2020
- Tokyo Seimitsu Co., Ltd.
- Kentaro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transfer unit and prober
- Patent number 10,571,486
- Issue date Feb 25, 2020
- Tokyo Seimitsu Co., Ltd.
- Kentaro Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for surface measuring device
- Patent number 10,571,238
- Issue date Feb 25, 2020
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Prober and prober operation method
- Patent number 10,564,185
- Issue date Feb 18, 2020
- Tokyo Seimitsu Co., Ltd.
- Toshiro Mori
- G01 - MEASURING TESTING
Information Patent Grant
Transfer unit and prober
- Patent number 10,539,593
- Issue date Jan 21, 2020
- Tokyo Seimitsu Co., Ltd.
- Kentaro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Transfer unit and prober
- Patent number 10,514,389
- Issue date Dec 24, 2019
- Tokyo Seimitsu Co., Ltd.
- Kentaro Sakai
- H01 - BASIC ELECTRIC ELEMENTS

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Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS
- Publication number 20240149391
- Publication date May 9, 2024
- Tokyo Seimitsu Co., Ltd.
- Tadashi MURASATO
- B24 - GRINDING POLISHING
Information Patent Application
TAPE AFFIXING SYSTEM
- Publication number 20240124258
- Publication date Apr 18, 2024
- Tokyo Seimitsu Co., Ltd.
- Kiyotaka KIZAKI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER
- Publication number 20240094254
- Publication date Mar 21, 2024
- TOKYO SEIMITSU CO., LTD.
- Tetsuo YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TAPE AFFIXING APPARATUS
- Publication number 20240087922
- Publication date Mar 14, 2024
- Tokyo Seimitsu Co., Ltd.
- Kiyotaka KIZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS
- Publication number 20240077304
- Publication date Mar 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND MACHINING DEVICE
- Publication number 20240068798
- Publication date Feb 29, 2024
- TOKYO SEIMITSU CO., LTD.
- Tasuku SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD FOR OPTICAL ROTATION PROBE
- Publication number 20240011767
- Publication date Jan 11, 2024
- TOKYO SEIMITSU CO., LTD.
- Yoshiyuki KAWATA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...
- Publication number 20230417797
- Publication date Dec 28, 2023
- TOKYO SEIMITSU CO., LTD.
- Natsumi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING TRUER
- Publication number 20230415293
- Publication date Dec 28, 2023
- TOKYO SEIMITSU CO., LTD.
- Shinichi KISHISHITA
- B24 - GRINDING POLISHING
Information Patent Application
TAPE AFFIXING APPARATUS AND TAPE MAGAZINE
- Publication number 20230402301
- Publication date Dec 14, 2023
- Tokyo Seimitsu Co., Ltd.
- Kiyotaka KIZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING DEVICE
- Publication number 20230302603
- Publication date Sep 28, 2023
- TOKYO SEIMITSU CO., LTD.
- Fumio MASE
- B24 - GRINDING POLISHING
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND THREE-DIMENSI...
- Publication number 20230269470
- Publication date Aug 24, 2023
- TOKYO SEIMITSU CO., LTD.
- Kyohei HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER MACHINING APPARATUS AND LASER MACHINING METHOD
- Publication number 20230264292
- Publication date Aug 24, 2023
- TOKYO SEIMITSU CO., LTD.
- Chikara AIKAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROCESSING DEVICE AND METHOD
- Publication number 20230238257
- Publication date Jul 27, 2023
- TOKYO SEIMITSU CO., LTD.
- Masaki KANAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER MACHINING DEVICE, WAFER PROCESSING SYSTEM, AND METHOD FOR CON...
- Publication number 20230150054
- Publication date May 18, 2023
- TOKYO SEIMITSU CO., LTD.
- Chikara AIKAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SPHERICAL ABERRATION ADJUSTMENT METHOD FOR OBJECTIVE OPTICAL SYSTEM...
- Publication number 20230125120
- Publication date Apr 27, 2023
- TOKYO SEIMITSU CO., LTD.
- Kazuo KAJITANI
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM AND LASER MACHINING DEVICE
- Publication number 20230124650
- Publication date Apr 20, 2023
- TOKYO SEIMITSU CO., LTD.
- Kazushi HYAKUMURA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SHAPE MEASUREMENT DEVICE AND METHOD FOR CONTROLLING SAME
- Publication number 20230064860
- Publication date Mar 2, 2023
- TOKYO SEIMITSU CO., LTD.
- Hikaru MASUTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20230052870
- Publication date Feb 16, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD FOR IN...
- Publication number 20230028748
- Publication date Jan 26, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD AND MA...
- Publication number 20230003510
- Publication date Jan 5, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
DICING DEVICE, AND BLADE HEIGHT CORRECTION METHOD AND WORKPIECE PRO...
- Publication number 20220362958
- Publication date Nov 17, 2022
- TOKYO SEIMITSU CO., LTD.
- Marina EKI
- B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information Patent Application
WORKPIECE DIAMETER MEASUREMENT METHOD AND WORKPIECE CIRCULARITY MEA...
- Publication number 20220357143
- Publication date Nov 10, 2022
- TOKYO SEIMITSU CO., LTD.
- Kosuke TOMITA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASURING METHOD
- Publication number 20220276037
- Publication date Sep 1, 2022
- TOKYO SEIMITSU CO., LTD.
- Michihiro SEKIMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL DEVICE FOR SEMICONDUCTOR WAFER AND TEMPERATURE...
- Publication number 20220262660
- Publication date Aug 18, 2022
- KELK LTD.
- Wataru Omuro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL MEASURING SYSTEM, AND THREE-DIMENSIONAL MEASURING...
- Publication number 20210293519
- Publication date Sep 23, 2021
- TOKYO SEIMITSU CO., LTD.
- Hitoshi TAMURA
- G01 - MEASURING TESTING
Information Patent Application
WORKPIECE PROCESSING DEVICE AND METHOD
- Publication number 20210283745
- Publication date Sep 16, 2021
- TOKYO SEIMITSU CO., LTD.
- Takahiro IIDA
- B24 - GRINDING POLISHING
Information Patent Application
DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...
- Publication number 20210285751
- Publication date Sep 16, 2021
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
LASER MACHINING DEVICE AND CONTROL METHOD THEREFOR
- Publication number 20210276121
- Publication date Sep 9, 2021
- TOKYO SEIMITSU CO., LTD.
- Takashi SHIMANUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
WORKPIECE PROCESSING DEVICE AND METHOD
- Publication number 20210245324
- Publication date Aug 12, 2021
- TOKYO SEIMITSU CO., LTD.
- Takahiro IIDA
- B24 - GRINDING POLISHING

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Trademarklast 30 trademarks

Information Trademark
79374178 - ALTAPROV
- Serial number 79374178
- Filing date May 31, 2023
- TOKYO SEIMITSU CO., LTD.
- 7 - Machines and machine tools
Information Trademark
98021849 - PRUVIS
- Serial number 98021849
- Filing date May 31, 2023
- Tokyo Seimitsu Co., Ltd.
- 7 - Machines and machine tools
Information Trademark
79353565 - GAMMA
- Serial number 79353565
- Filing date Aug 30, 2022
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79353566 - GAMMA
- Serial number 79353566
- Filing date Aug 30, 2022
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79329578 - AP3000
- Serial number 79329578
- Registration number 7045368
- Filing date Oct 29, 2021
- TOKYO SEIMITSU CO., LTD
- 7 - Machines and machine tools
Information Trademark
79329579 - AP3000E
- Serial number 79329579
- Registration number 7045369
- Filing date Oct 29, 2021
- TOKYO SEIMITSU CO., LTD
- 7 - Machines and machine tools
Information Trademark
79321158 - ACCRETECH
- Serial number 79321158
- Registration number 6848889
- Filing date Mar 23, 2021
- TOKYO SEIMITSU CO., LTD
- 40 - Treatment of materials
Information Trademark
87305279 - ACCRETECH
- Serial number 87305279
- Registration number 5284626
- Filing date Jan 18, 2017
- Tokyo Seimitsu Co., Ltd.
- 7 - Machines and machine tools
Information Trademark
79158566 - OPT-SCOPE
- Serial number 79158566
- Registration number 4753956
- Filing date Oct 27, 2014
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86256532 - ACCRETECH
- Serial number 86256532
- Registration number 4742087
- Filing date Apr 18, 2014
- Tokyo Seimitsu Co., Ltd.
- 37 - Building construction
Information Trademark
79149132 - OPT-MEASURE
- Serial number 79149132
- Registration number 4634998
- Filing date Apr 9, 2014
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85337060 - ACCTEE
- Serial number 85337060
- Registration number 4234804
- Filing date Jun 3, 2011
- Tokyo Seimitsu Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79062882 - ACCTEE
- Serial number 79062882
- Filing date Oct 23, 2008
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76702576 - ACCTEE
- Serial number 76702576
- Filing date Oct 23, 2008
- Tokyo Seimitsu Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79060543 - TIMSYS
- Serial number 79060543
- Filing date Aug 13, 2008
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76479207 - MAHOHDICING
- Serial number 76479207
- Registration number 3344605
- Filing date Dec 30, 2002
- Tokyo Seimitsu Co., Ltd.
- 7 - Machines and machine tools
Information Trademark
76978386 - MAHOHDICING
- Serial number 76978386
- Registration number 3211735
- Filing date Dec 30, 2002
- Tokyo Seimitsu Co., Ltd.
- 7 - Machines and machine tools
Information Trademark
76198020 - ACCRETECH
- Serial number 76198020
- Filing date Jan 22, 2001
- Tokyo Seimitsu Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
75843773 - OKHOTSK
- Serial number 75843773
- Filing date Nov 9, 1999
- Kabushiki Kaisha Tokyo Seimitsu Tokyo Seimitsu Co., Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
73548242 - HANDYSURF
- Serial number 73548242
- Registration number 1384103
- Filing date Jul 16, 1985
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72449206 - RONDCOM
- Serial number 72449206
- Registration number 1000262
- Filing date Feb 20, 1973
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72369275 - DIGICOM
- Serial number 72369275
- Registration number 941435
- Filing date Aug 27, 1970
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72369276 - MINICOMMATE
- Serial number 72369276
- Registration number 921556
- Filing date Aug 27, 1970
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72369277 - PEAKTOP
- Serial number 72369277
- Registration number 921557
- Filing date Aug 27, 1970
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72355546 - TSK
- Serial number 72355546
- Registration number 905486
- Filing date Mar 31, 1970
- TOKYO SEIMITSU CO., LTD.
- 7 - Machines and machine tools
Information Trademark
72328363 - TSK
- Serial number 72328363
- Registration number 901499
- Filing date May 26, 1969
- TOKYO SEIMITSU CO., LTD.
- 1 - Chemicals used in industry, science and photography, as well as in agriculture, horticulture and forestry
Information Trademark
72328364 - PULCOM
- Serial number 72328364
- Registration number 1021301
- Filing date May 26, 1969
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
72180150 - SURFCOM
- Serial number 72180150
- Registration number 808455
- Filing date Sep 13, 1963
- TOKYO SEIMITSU CO., LTD.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

TOKYO SEIMITSU CO., LTD.

Organization

Patents Grantslast 30 patents

Workpiece processing device and method

Particle measurement device, three-dimensional shape measurement de...

Measurement device

Inner surface shape measurement device, and alignment method and ma...

Inner surface shape measurement device, and alignment method for in...

Workpiece diameter measurement method and workpiece circularity mea...

Workpiece processing device and method

Surface shape measuring device and surface shape measuring method

Workpiece processing device and method

Workpiece processing device and method

Method for manufacturing cutting blade, and cutting blade

Displacement detector, surface shape measuring apparatus, and round...

Displacement detector, surface shape measuring apparatus, and round...

Three-dimensional measuring system, and three-dimensional measuring...

Laser machining device and control method therefor

Method for setting processing device

Method for processing wafer

Laser processing apparatus and laser processing method

Three-dimensional coordinate measurement apparatus

Linear drive mechanism and shape measuring machine

Laser machining device and laser machining method

Positioning and fixing device

Detector, surface property measuring machine, and roundness measuri...

Three-dimensional coordinate measurement apparatus

Transfer unit and prober

Transfer unit and prober

Detector for surface measuring device

Prober and prober operation method

Transfer unit and prober

Transfer unit and prober

Patents Applicationslast 30 patents

PROCESSING APPARATUS

TAPE AFFIXING SYSTEM

PROBER CONTROLLING DEVICE, PROBER CONTROLLING METHOD, AND PROBER

TAPE AFFIXING APPARATUS

ALIGNMENT METHOD, SHAPE MEASURING METHOD AND SHAPE MEASURING APPARATUS

MEASURING DEVICE AND MACHINING DEVICE

CALIBRATION METHOD FOR OPTICAL ROTATION PROBE

PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...

METHOD OF FORMING TRUER

TAPE AFFIXING APPARATUS AND TAPE MAGAZINE

PROCESSING DEVICE

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND THREE-DIMENSI...

LASER MACHINING APPARATUS AND LASER MACHINING METHOD

PROCESSING DEVICE AND METHOD

LASER MACHINING DEVICE, WAFER PROCESSING SYSTEM, AND METHOD FOR CON...

SPHERICAL ABERRATION ADJUSTMENT METHOD FOR OBJECTIVE OPTICAL SYSTEM...

OPTICAL SYSTEM AND LASER MACHINING DEVICE

SHAPE MEASUREMENT DEVICE AND METHOD FOR CONTROLLING SAME

MEASUREMENT DEVICE

INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD FOR IN...

INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD AND MA...

DICING DEVICE, AND BLADE HEIGHT CORRECTION METHOD AND WORKPIECE PRO...

WORKPIECE DIAMETER MEASUREMENT METHOD AND WORKPIECE CIRCULARITY MEA...

SURFACE SHAPE MEASURING DEVICE AND SURFACE SHAPE MEASURING METHOD

TEMPERATURE CONTROL DEVICE FOR SEMICONDUCTOR WAFER AND TEMPERATURE...

THREE-DIMENSIONAL MEASURING SYSTEM, AND THREE-DIMENSIONAL MEASURING...

WORKPIECE PROCESSING DEVICE AND METHOD

DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...

LASER MACHINING DEVICE AND CONTROL METHOD THEREFOR

WORKPIECE PROCESSING DEVICE AND METHOD

Trademarklast 30 trademarks

79374178 - ALTAPROV

98021849 - PRUVIS

79353565 - GAMMA

79353566 - GAMMA

79329578 - AP3000

79329579 - AP3000E

79321158 - ACCRETECH

87305279 - ACCRETECH

79158566 - OPT-SCOPE

86256532 - ACCRETECH

79149132 - OPT-MEASURE

85337060 - ACCTEE

79062882 - ACCTEE

76702576 - ACCTEE

79060543 - TIMSYS