T.P.S. SYSTEM CO., LTD.

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Tokyo, JP

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

Information Patent Application
Stage for Holding Silicon Wafer Substrate and Method for Measuring...
- Publication number 20080043806
- Publication date Feb 21, 2008
- INTELLECTUAL PROPERTY BANK CORP
- Yukihiro Murakami
- G01 - MEASURING TESTING

Trademarklast 30 trademarks

Information Trademark
74502591 - TPS
- Serial number 74502591
- Registration number 2153246
- Filing date Mar 17, 1994
- TPS Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
74502594 - TPS
- Serial number 74502594
- Registration number 2149944
- Filing date Mar 17, 1994
- TPS Systems, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments