Translarity, Inc.

Organization

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Probe card for testing semiconductor wafers
- Patent number 10,281,491
- Issue date May 7, 2019
- Translarity, Inc.
- Francis T. McQuade
- G01 - MEASURING TESTING
Information Patent Grant
Designed asperity contactors, including nanospikes, for semiconduct...
- Patent number 9,733,272
- Issue date Aug 15, 2017
- Translarity, Inc.
- Douglas A. Preston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer prober integrated with full-wafer contacter
- Patent number 9,612,278
- Issue date Apr 4, 2017
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 9,612,259
- Issue date Apr 4, 2017
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Designed asperity contactors, including nanospikes, for semiconduct...
- Patent number 9,494,618
- Issue date Nov 15, 2016
- Translarity, Inc.
- Douglas A. Preston
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full-water test and burn-in mechanism
- Patent number RE46075
- Issue date Jul 19, 2016
- Translarity, Inc.
- Morgan T. Johnson
- 001 -
Information Patent Grant
Translators coupleable to opposing surfaces of microelectronic subs...
- Patent number 9,222,965
- Issue date Dec 29, 2015
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,176,186
- Issue date Nov 3, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Maintaining a wafer/wafer translator pair in an attached state free...
- Patent number 9,146,269
- Issue date Sep 29, 2015
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober integrated with full-wafer contactor
- Patent number 9,052,355
- Issue date Jun 9, 2015
- Translarity, Inc.
- Morgan T. Johnson
- G01 - MEASURING TESTING

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Patents Applicationslast 30 patents

Information Patent Application
Socketed Probes
- Publication number 20240125815
- Publication date Apr 18, 2024
- TRANSLARITY, INC.
- Raul Molina
- G01 - MEASURING TESTING
Information Patent Application
REDUCING POSITION REPEATABILITY ERROR IN LINEAR MOTION SYSTEMS
- Publication number 20230243405
- Publication date Aug 3, 2023
- TRANSLARITY, INC.
- Ray Sundby
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
REDISTRIBUTION PLATE
- Publication number 20230054628
- Publication date Feb 23, 2023
- Translarity, Inc.
- Dominik Schmidt
- G01 - MEASURING TESTING
Information Patent Application
REDISTRIBUTION PLATE
- Publication number 20210243896
- Publication date Aug 5, 2021
- TRANSLARITY, INC.
- Dominik Schmidt
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20180003737
- Publication date Jan 4, 2018
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTS USING INTERPOSERS, AND ASSOCIATED SYSTEMS AND M...
- Publication number 20170292992
- Publication date Oct 12, 2017
- TRANSLARITY, INC.
- Christopher T. Lane
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20170219629
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTOR
- Publication number 20170219627
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...
- Publication number 20170074904
- Publication date Mar 16, 2017
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
INTERDIGITIZED POLYSYMMETRIC FANOUTS, AND ASSOCIATED SYSTEMS AND ME...
- Publication number 20170023616
- Publication date Jan 26, 2017
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING
Information Patent Application
SHAPING OF CONTACT STRUCTURES FOR SEMICONDUCTOR TEST, AND ASSOCIATE...
- Publication number 20170023617
- Publication date Jan 26, 2017
- TRANSLARITY, INC.
- Jens Ruffler
- G01 - MEASURING TESTING
Information Patent Application
LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS A...
- Publication number 20170023642
- Publication date Jan 26, 2017
- TRANSLARITY, INC.
- Douglas A. Preston
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR GENERATING AND PRESERVING VACUUM BETWEEN SE...
- Publication number 20170016954
- Publication date Jan 19, 2017
- TRANSLARITY, INC.
- Nikolai Kalnin
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTER
- Publication number 20160033569
- Publication date Feb 4, 2016
- TRANSLARITY, INC.
- Morgan T. Johnson
- G01 - MEASURING TESTING

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Trademarklast 30 trademarks

Information Trademark
97934800 - TRANSLARITY
- Serial number 97934800
- Registration number 7406356
- Filing date May 12, 2023
- Translarity, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87612948 - INNOVATIONS IN PROBE STACKS
- Serial number 87612948
- Filing date Sep 18, 2017
- Translarity, inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87455902 - WAFER TRANSLATOR
- Serial number 87455902
- Filing date May 18, 2017
- Translarity, inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87455913 - SPACE TRANSLATOR
- Serial number 87455913
- Filing date May 18, 2017
- Translarity, Inc.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86477720
- Serial number 86477720
- Registration number 5069270
- Filing date Dec 11, 2014
- Advanced Inquiry Systems Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
86372909 - TRANSLARITY
- Serial number 86372909
- Registration number 5032432
- Filing date Aug 21, 2014
- Advanced Inquiry Systems Inc
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Translarity, Inc.

Organization

Patents Grantslast 30 patents

Probe card for testing semiconductor wafers

Designed asperity contactors, including nanospikes, for semiconduct...

Wafer prober integrated with full-wafer contacter

Wafer testing system and associated methods of use and manufacture

Designed asperity contactors, including nanospikes, for semiconduct...

Full-water test and burn-in mechanism

Translators coupleable to opposing surfaces of microelectronic subs...

Maintaining a wafer/wafer translator pair in an attached state free...

Maintaining a wafer/wafer translator pair in an attached state free...

Wafer prober integrated with full-wafer contactor

Patents Applicationslast 30 patents

Socketed Probes

REDUCING POSITION REPEATABILITY ERROR IN LINEAR MOTION SYSTEMS

REDISTRIBUTION PLATE

REDISTRIBUTION PLATE

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

SEMICONDUCTOR TESTS USING INTERPOSERS, AND ASSOCIATED SYSTEMS AND M...

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTOR

DESIGNED ASPERITY CONTACTORS, INCLUDING NANOSPIKES, FOR SEMICONDUCT...

INTERDIGITIZED POLYSYMMETRIC FANOUTS, AND ASSOCIATED SYSTEMS AND ME...

SHAPING OF CONTACT STRUCTURES FOR SEMICONDUCTOR TEST, AND ASSOCIATE...

LOST MOTION GASKET FOR SEMICONDUCTOR TEST, AND ASSOCIATED SYSTEMS A...

SYSTEMS AND METHODS FOR GENERATING AND PRESERVING VACUUM BETWEEN SE...

WAFER PROBER INTEGRATED WITH FULL-WAFER CONTACTER

Trademarklast 30 trademarks

97934800 - TRANSLARITY

87612948 - INNOVATIONS IN PROBE STACKS

87455902 - WAFER TRANSLATOR

87455913 - SPACE TRANSLATOR

86477720

86372909 - TRANSLARITY