UNITEST INCORPORATION

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Yongin-city, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring round-trip time of test signal u...
- Patent number 11,031,091
- Issue date Jun 8, 2021
- UniTest Inc.
- Ho Sang You
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sealed plasma melting furnace for treating low- and intermediate-le...
- Patent number 10,871,288
- Issue date Dec 22, 2020
- Tripl Co., Ltd.
- Jong Kill Park
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Grant
Test board unit and apparatus for testing a semiconductor chip incl...
- Patent number 10,060,969
- Issue date Aug 28, 2018
- SK hynix Inc.
- Woo Sik Jung
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in test system and method
- Patent number 9,714,977
- Issue date Jul 25, 2017
- SK hynix Inc.
- Woo Sik Jung
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for detecting fail block using logic block address...
- Patent number 9,613,718
- Issue date Apr 4, 2017
- Unitest Inc.
- Young Myoun Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Device under test tester using redriver
- Patent number 9,459,302
- Issue date Oct 4, 2016
- Unitest Inc.
- Jin An Oh
- G01 - MEASURING TESTING
Information Patent Grant
Storage tester capable of individual control for a plurality of sto...
- Patent number 9,411,700
- Issue date Aug 9, 2016
- Unitest Inc.
- Eui Won Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for simultaneously determining memory test result
- Patent number 9,378,845
- Issue date Jun 28, 2016
- Unitest Inc.
- Ho Sang You
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-mounted storage test device based on FPGA
- Patent number 9,378,846
- Issue date Jun 28, 2016
- Unitest Inc.
- Young Myoun Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for acquiring data of fast fail memory
- Patent number 9,312,030
- Issue date Apr 12, 2016
- Unitest Inc.
- Ho Sang You
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage interface apparatus for solid state drive tester
- Patent number 9,245,613
- Issue date Jan 26, 2016
- Unitest Inc.
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for correcting output signal of FPGA-based mem...
- Patent number 9,197,212
- Issue date Nov 24, 2015
- UniTest Inc.
- Ho Sang You
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Solid state drive tester
- Patent number 9,171,643
- Issue date Oct 27, 2015
- UNITEST INC
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure detection apparatus for solid state drive tester
- Patent number 9,159,454
- Issue date Oct 13, 2015
- Unitest Inc.
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Error generating apparatus for solid state drive tester
- Patent number 9,153,345
- Issue date Oct 6, 2015
- Unitest Inc.
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Lighting device for street lamp
- Patent number 9,062,842
- Issue date Jun 23, 2015
- UniTest Inc.
- Jae-Suk Huh
- F21 - LIGHTING
Information Patent Grant
Solid state drive tester
- Patent number 9,015,545
- Issue date Apr 21, 2015
- Unitest Inc.
- Eui Won Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for manufacturing probe structure of probe card
- Patent number 7,875,193
- Issue date Jan 25, 2011
- UniTest Inc.
- Bong Hwan Kim
- G01 - MEASURING TESTING
Information Patent Grant
Tester for testing semiconductor device
- Patent number 7,872,488
- Issue date Jan 18, 2011
- UniTest Inc.
- Jong Koo Kang
- G01 - MEASURING TESTING
Information Patent Grant
Tester for testing semiconductor device
- Patent number 7,739,572
- Issue date Jun 15, 2010
- UniTest Inc.
- Jong Koo Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Sequential semiconductor device tester
- Patent number 7,688,099
- Issue date Mar 30, 2010
- Unitest Inc.
- Sun Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for calibrating semiconductor device tester
- Patent number 7,656,178
- Issue date Feb 2, 2010
- UniTest Inc.
- Jong Koo Kang
- G01 - MEASURING TESTING
Information Patent Grant
Sequential semiconductor device tester
- Patent number 7,652,497
- Issue date Jan 26, 2010
- Unitest Inc.
- Sun Whan Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test apparatus for simultaneously testing plurality o...
- Patent number 7,607,056
- Issue date Oct 20, 2009
- UniTest Inc.
- Jong Koo Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing probe structure of probe card
- Patent number 7,459,399
- Issue date Dec 2, 2008
- Unitest. Inc.,
- Bong Hwan Kim
- G01 - MEASURING TESTING
Information Patent Grant
Memory application tester having vertically-mounted motherboard
- Patent number 7,327,151
- Issue date Feb 5, 2008
- UniTest Incorporation
- Jong Koo Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Algorithm pattern generator for testing a memory device and memory...
- Patent number 7,302,623
- Issue date Nov 27, 2007
- Unitest, Inc.
- Jong Koo Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test interface
- Patent number 7,288,949
- Issue date Oct 30, 2007
- UniTest Inc.
- Dae Kyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having deeply recessed trench and method for manufacturi...
- Patent number 7,285,967
- Issue date Oct 23, 2007
- UniTest Inc.
- Bong Hwan Kim
- G01 - MEASURING TESTING
Information Patent Grant
PC and ATE integrated chip test equipment
- Patent number 6,883,128
- Issue date Apr 19, 2005
- UniTest Incorporation
- Jong-Gu Kang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PEROVSKITE SOLAR CELL MODULE AND MANUFACTURING METHOD FOR SAME
- Publication number 20240023351
- Publication date Jan 18, 2024
- UNITEST INC
- Jong Su YU
Information Patent Application
SEALED PLASMA MELTING FURNACE FOR TREATING LOW- AND INTERMEDIATE-LE...
- Publication number 20190162406
- Publication date May 30, 2019
- TRIPLE CO., LTD.
- Jong Kill Park
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ROUND-TRIP TIME OF TEST SIGNAL U...
- Publication number 20180261304
- Publication date Sep 13, 2018
- Unitest Inc.
- Ho Sang YOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BURN-IN TEST SYSTEM AND METHOD
- Publication number 20160334462
- Publication date Nov 17, 2016
- SK HYNIX INC.
- Woo Sik JUNG
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD UNIT AND APPARATUS FOR TESTING A SEMICONDUCTOR CHIP INCL...
- Publication number 20160262255
- Publication date Sep 8, 2016
- SK HYNIX INC.
- Woo Sik JUNG
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETECTION SYSTEM FOR DETECTING FAIL BLOCK USING LOGIC BLOCK ADDRESS...
- Publication number 20150095723
- Publication date Apr 2, 2015
- UNITEST INC.
- Young Myoun HAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-MOUNTED STORAGE TEST DEVICE BASED ON FPGA
- Publication number 20150095712
- Publication date Apr 2, 2015
- UNITEST INC.
- Young Myoun HAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE TESTER CAPABLE OF INDIVIDUAL CONTROL FOR A PLURALITY OF STO...
- Publication number 20150067418
- Publication date Mar 5, 2015
- UNITEST INC.
- Eui Won LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR ACQUIRING DATA OF FAST FAIL MEMORY
- Publication number 20150039951
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR CORRECTING OUTPUT SIGNAL OF FPGA-BASED MEM...
- Publication number 20150035561
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM FOR SIMULTANEOUSLY DETERMINING MEMORY TEST RESULT
- Publication number 20150039953
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAM...
- Publication number 20150039264
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING DEVICE FOR STREET LAMP
- Publication number 20140111989
- Publication date Apr 24, 2014
- Unitest Inc.
- Jae-Suk Huh
- F21 - LIGHTING
Information Patent Application
Method for calibrating semiconductor device tester
- Publication number 20080231297
- Publication date Sep 25, 2008
- Unitest Inc.
- Jong Koo Kang
- G01 - MEASURING TESTING
Information Patent Application
Sequential semiconductor device tester
- Publication number 20080197871
- Publication date Aug 21, 2008
- Unitest Inc.
- Sun Whan Kim
- G01 - MEASURING TESTING
Information Patent Application
Sequential semiconductor device tester
- Publication number 20080201624
- Publication date Aug 21, 2008
- Unitest Inc.
- Sun Whan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method For Manufacturing Cantilever Structure of Probe Card
- Publication number 20080190885
- Publication date Aug 14, 2008
- Unitest Inc.
- Bong Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
Method For Manufacturing Probe Structure Of Probe Card
- Publication number 20080190891
- Publication date Aug 14, 2008
- UniTest, Inc.
- Bong Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
Method For Manufacturing Bump Of Probe Card
- Publication number 20080189942
- Publication date Aug 14, 2008
- UniTest, Inc.
- Bong Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
Method For Forming Bump Of Probe Card
- Publication number 20080047927
- Publication date Feb 28, 2008
- Unitest Inc.
- Bong Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method For Generating Test Pattern Data For Testing S...
- Publication number 20080040639
- Publication date Feb 14, 2008
- Unitest Inc.
- Jong Koo KANG
- G01 - MEASURING TESTING
Information Patent Application
Tester For Testing Semiconductor Device
- Publication number 20080034265
- Publication date Feb 7, 2008
- Unitest Inc.
- Jong Koo KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Tester For Testing Semiconductor Device
- Publication number 20080034266
- Publication date Feb 7, 2008
- Unitest Inc.
- Jong Koo KANG
- G11 - INFORMATION STORAGE
Information Patent Application
Tester For Testing Semiconductor Device
- Publication number 20080030218
- Publication date Feb 7, 2008
- Unitest Inc.
- Jong Koo KANG
- G01 - MEASURING TESTING
Information Patent Application
Method For Manufacturing Probe Structure
- Publication number 20080029479
- Publication date Feb 7, 2008
- Unitest Inc.
- Bong Hwan Kim
- G01 - MEASURING TESTING
Information Patent Application
Method For Manufacturing Probe Structure of Probe Card
- Publication number 20070293053
- Publication date Dec 20, 2007
- Unitest Inc.
- Bong Hwan KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST INTERFACE
- Publication number 20060279305
- Publication date Dec 14, 2006
- UNITEST INCORPORATION
- Dae Kyoung KIM
- G01 - MEASURING TESTING
Information Patent Application
Memory application tester having vertically-mounted motherboard
- Publication number 20060242468
- Publication date Oct 26, 2006
- UniTest Incorporation
- Jong Koo Kang
- G11 - INFORMATION STORAGE
Information Patent Application
Probe card having deeply recessed trench and method for manufacturi...
- Publication number 20060109017
- Publication date May 25, 2006
- UniTest Incorporation
- Bong Hwan Kim
- G01 - MEASURING TESTING
Information Patent Application
Algorithm pattern generator for testing a memory device and memory...
- Publication number 20060031725
- Publication date Feb 9, 2006
- UniTest Inc.
- Jong Koo Kang
- G01 - MEASURING TESTING

UNITEST INCORPORATION

Organization

Patents Grantslast 30 patents

Apparatus and method for measuring round-trip time of test signal u...

Sealed plasma melting furnace for treating low- and intermediate-le...

Test board unit and apparatus for testing a semiconductor chip incl...

Burn-in test system and method

Detection system for detecting fail block using logic block address...

Device under test tester using redriver

Storage tester capable of individual control for a plurality of sto...

System for simultaneously determining memory test result

Non-mounted storage test device based on FPGA

Apparatus and method for acquiring data of fast fail memory

Storage interface apparatus for solid state drive tester

Apparatus and method for correcting output signal of FPGA-based mem...

Solid state drive tester

Failure detection apparatus for solid state drive tester

Error generating apparatus for solid state drive tester

Lighting device for street lamp

Solid state drive tester

Method for manufacturing probe structure of probe card

Tester for testing semiconductor device

Tester for testing semiconductor device

Sequential semiconductor device tester

Method for calibrating semiconductor device tester

Sequential semiconductor device tester

Semiconductor test apparatus for simultaneously testing plurality o...

Method for manufacturing probe structure of probe card

Memory application tester having vertically-mounted motherboard

Algorithm pattern generator for testing a memory device and memory...

Semiconductor test interface

Probe card having deeply recessed trench and method for manufacturi...

PC and ATE integrated chip test equipment

Patents Applicationslast 30 patents

PEROVSKITE SOLAR CELL MODULE AND MANUFACTURING METHOD FOR SAME

SEALED PLASMA MELTING FURNACE FOR TREATING LOW- AND INTERMEDIATE-LE...

APPARATUS AND METHOD FOR MEASURING ROUND-TRIP TIME OF TEST SIGNAL U...

BURN-IN TEST SYSTEM AND METHOD

TEST BOARD UNIT AND APPARATUS FOR TESTING A SEMICONDUCTOR CHIP INCL...

DETECTION SYSTEM FOR DETECTING FAIL BLOCK USING LOGIC BLOCK ADDRESS...

NON-MOUNTED STORAGE TEST DEVICE BASED ON FPGA

STORAGE TESTER CAPABLE OF INDIVIDUAL CONTROL FOR A PLURALITY OF STO...

APPARATUS AND METHOD FOR ACQUIRING DATA OF FAST FAIL MEMORY

APPARATUS AND METHOD FOR CORRECTING OUTPUT SIGNAL OF FPGA-BASED MEM...

SYSTEM FOR SIMULTANEOUSLY DETERMINING MEMORY TEST RESULT

DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAM...

LIGHTING DEVICE FOR STREET LAMP

Method for calibrating semiconductor device tester

Sequential semiconductor device tester

Sequential semiconductor device tester

Method For Manufacturing Cantilever Structure of Probe Card

Method For Manufacturing Probe Structure Of Probe Card

Method For Manufacturing Bump Of Probe Card

Method For Forming Bump Of Probe Card

Apparatus and Method For Generating Test Pattern Data For Testing S...

Tester For Testing Semiconductor Device

Tester For Testing Semiconductor Device

Tester For Testing Semiconductor Device

Method For Manufacturing Probe Structure

Method For Manufacturing Probe Structure of Probe Card

SEMICONDUCTOR TEST INTERFACE

Memory application tester having vertically-mounted motherboard

Probe card having deeply recessed trench and method for manufacturi...

Algorithm pattern generator for testing a memory device and memory...

Trademarklast 30 trademarks