ZETETIC, INC

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HITCHCOCK, TX, US

Organizations

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for in situ and ex situ measurement of spatial...
- Patent number 7,646,490
- Issue date Jan 12, 2010
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of in situ and ex situ measurement of spatial...
- Patent number 7,508,527
- Issue date Mar 24, 2009
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for joint measurements of conjugated quadratur...
- Patent number 7,495,769
- Issue date Feb 24, 2009
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement and compensation of atmospheri...
- Patent number 7,460,245
- Issue date Dec 2, 2008
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for in situ and ex situ measurements of optica...
- Patent number 7,428,058
- Issue date Sep 23, 2008
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for reduction and compensation of effects of...
- Patent number 7,405,832
- Issue date Jul 29, 2008
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Catoptric and catadioptric imaging systems with adaptive catoptric...
- Patent number 7,355,722
- Issue date Apr 8, 2008
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement of critical dimensions of feat...
- Patent number 7,345,771
- Issue date Mar 18, 2008
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for ellipsometric measurements with high spati...
- Patent number 7,324,209
- Issue date Jan 29, 2008
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Sub-nanometer overlay, critical dimension, and lithography tool pro...
- Patent number 7,324,216
- Issue date Jan 29, 2008
- Zetetic Institute
- Henry Allen Hill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for enhanced resolution of high spatial freque...
- Patent number 7,312,877
- Issue date Dec 25, 2007
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for overlay, alignment mark, and critical dim...
- Patent number 7,298,496
- Issue date Nov 20, 2007
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-source arrays fed by guided-wave structures and resonant g...
- Patent number 7,263,259
- Issue date Aug 28, 2007
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Grant
Catoptric and catadioptric imaging systems with pellicle and apertu...
- Patent number 7,180,604
- Issue date Feb 20, 2007
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Compensation for effects of mismatch in indices of refraction at a...
- Patent number 7,164,480
- Issue date Jan 16, 2007
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Grant
Apparatus and method for joint and time delayed measurements of com...
- Patent number 7,161,680
- Issue date Jan 9, 2007
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Catoptric imaging systems comprising pellicle and/or aperture-array...
- Patent number 7,145,663
- Issue date Dec 5, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Longitudinal differential interferometric confocal microscopy
- Patent number 7,133,139
- Issue date Nov 7, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for joint measurement of fields of scattered/r...
- Patent number 7,099,014
- Issue date Aug 29, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric confocal microscopy incorporating a pinhole array b...
- Patent number 7,084,983
- Issue date Aug 1, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for high speed scan for detection and measurem...
- Patent number 7,084,984
- Issue date Aug 1, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measurement of fields of backscattered and...
- Patent number 7,064,838
- Issue date Jun 20, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Method for constructing a catadioptric lens system
- Patent number 7,054,077
- Issue date May 30, 2006
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Grant
Transverse differential interferometric confocal microscopy
- Patent number 7,046,372
- Issue date May 16, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dark field interferometric confocal micros...
- Patent number 7,023,560
- Issue date Apr 4, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Leaky guided wave modes used in interferometric confocal microscopy...
- Patent number 7,009,712
- Issue date Mar 7, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-source arrays with optical transmission enhanced by resona...
- Patent number 6,847,029
- Issue date Jan 25, 2005
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Differential interferometric scanning near-field confocal microscopy
- Patent number 6,775,009
- Issue date Aug 10, 2004
- Zetetic Institute
- Henry A. Hill
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical storage system based on scanning interferometric near-field...
- Patent number 6,753,968
- Issue date Jun 22, 2004
- Zetetic Institute
- Henry Allen Hill
- G11 - INFORMATION STORAGE
Information Patent Grant
Catoptric and catadioptric imaging systems
- Patent number 6,717,736
- Issue date Apr 6, 2004
- Zetetic Institute
- Henry A. Hill
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR JOINT MEASUREMENTS OF CONJUGATED QUADRATUR...
- Publication number 20080180682
- Publication date Jul 31, 2008
- Zetetic Institute
- Henry Allen HILL
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
Apparatus and method for in situ and ex situ measurement of spatial...
- Publication number 20080030742
- Publication date Feb 7, 2008
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for reducing effects of coherent artifacts and...
- Publication number 20070121115
- Publication date May 31, 2007
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods for Reduction and Compensation of Effects of...
- Publication number 20070058174
- Publication date Mar 15, 2007
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Measurement and Compensation of Atmospheri...
- Publication number 20070046951
- Publication date Mar 1, 2007
- Zetetic Institute
- Henry A. Hill
- G02 - OPTICS
Information Patent Application
Continuously Tunable External Cavity Diode Laser Sources With High...
- Publication number 20070014319
- Publication date Jan 18, 2007
- Zetetic Institute
- Henry A. Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for in situ and ex situ measurements of optica...
- Publication number 20060285124
- Publication date Dec 21, 2006
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method of in situ and ex situ measurement of spatial...
- Publication number 20060250620
- Publication date Nov 9, 2006
- Zetetic Institute
- Henry A. Hill
- G01 - MEASURING TESTING
Information Patent Application
CATOPTRIC AND CATADIOPTRIC IMAGING SYSTEMS WITH PELLICLE AND APERTU...
- Publication number 20060092429
- Publication date May 4, 2006
- Zetetic Institute
- Henry A. Hill
- G02 - OPTICS
Information Patent Application
Catoptric and catadioptric imaging systems with pellicle and apertu...
- Publication number 20060072204
- Publication date Apr 6, 2006
- Zetetic Institute
- Henry A. Hill
- G02 - OPTICS
Information Patent Application
Catoptric imaging systems comprising pellicle and/or aperture-array...
- Publication number 20060066873
- Publication date Mar 30, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Sub-nanometer overlay, critical dimension, and lithography tool pro...
- Publication number 20060050283
- Publication date Mar 9, 2006
- Zetetic Institute
- Henry Allen Hill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method for joint and time delayed measurements of com...
- Publication number 20060033924
- Publication date Feb 16, 2006
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for overlay, alignment mark, and critical dim...
- Publication number 20050275848
- Publication date Dec 15, 2005
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measurement of critical dimensions of feat...
- Publication number 20050254063
- Publication date Nov 17, 2005
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for enhanced resolution of high spatial freque...
- Publication number 20050206909
- Publication date Sep 22, 2005
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Catoptric and catadioptric imaging systems with adaptive catoptric...
- Publication number 20050195500
- Publication date Sep 8, 2005
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Leaky guided wave modes used in interferometric confocal microscopy...
- Publication number 20050128487
- Publication date Jun 16, 2005
- Zetetic Institute
- Henry Allen Hill
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
Catoptric and catadioptric imaging system with pellicle and apertur...
- Publication number 20050111007
- Publication date May 26, 2005
- Zetetic Institute
- Henry A. Hill
- G02 - OPTICS
Information Patent Application
Apparatus and method for ellipsometric measurements with high spati...
- Publication number 20050111006
- Publication date May 26, 2005
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for high speed scan for detection and measurem...
- Publication number 20050036149
- Publication date Feb 17, 2005
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for joint measurements of conjugated quadratur...
- Publication number 20040257577
- Publication date Dec 23, 2004
- Zetetic Institute
- Henry Allen Hill
- A45 - HAND OR TRAVELLING ARTICLES
Information Patent Application
Interferometric confocal microscopy incorporating a pinhole array b...
- Publication number 20040246486
- Publication date Dec 9, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Method for constructing a catadioptric lens system
- Publication number 20040228008
- Publication date Nov 18, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Apparatus and method for measurement of fields of backscattered and...
- Publication number 20040227950
- Publication date Nov 18, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Apparatus and method for joint measurement of fields of scattered/r...
- Publication number 20040227951
- Publication date Nov 18, 2004
- Zetetic Institute
- Henry Allen Hill
- G01 - MEASURING TESTING
Information Patent Application
Multiple-source arrays fed by guided-wave structures and resonant g...
- Publication number 20040202426
- Publication date Oct 14, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Compensation for effects of mismatch in indices of refraction at a...
- Publication number 20040201852
- Publication date Oct 14, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Method and apparatus for dark field interferometric confocal micros...
- Publication number 20040201855
- Publication date Oct 14, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS
Information Patent Application
Transverse differential interferometric confocal microscopy
- Publication number 20040201853
- Publication date Oct 14, 2004
- Zetetic Institute
- Henry Allen Hill
- G02 - OPTICS

Trademarklast 30 trademarks

Information Trademark
78394825 - ACAG
- Serial number 78394825
- Filing date Apr 1, 2004
- Zetetic, Inc.
- 41 - Education
Information Trademark
76428679 - ZETETIC INSTITUTE
- Serial number 76428679
- Registration number 2793955
- Filing date Jul 9, 2002
- Zetetic Institute
- 41 - Education
Information Trademark
75422553 - ZETETIC CATTLE CO.
- Serial number 75422553
- Registration number 2224268
- Filing date Jan 23, 1998
- Zetetic, Inc.
- 35 - Advertising
Information Trademark
75332263 - ZETETIC
- Serial number 75332263
- Registration number 2142917
- Filing date Jul 29, 1997
- Zetetic, Inc.
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
75297095 - ZETETIC
- Serial number 75297095
- Registration number 2142896
- Filing date May 23, 1997
- Zetetic, Inc.
- 42 - Scientific and technological services and research and design relating thereto

ZETETIC, INC

Organization

Patents Grantslast 30 patents

Apparatus and method for in situ and ex situ measurement of spatial...

Apparatus and method of in situ and ex situ measurement of spatial...

Apparatus and method for joint measurements of conjugated quadratur...

Apparatus and method for measurement and compensation of atmospheri...

Apparatus and method for in situ and ex situ measurements of optica...

Apparatus and methods for reduction and compensation of effects of...

Catoptric and catadioptric imaging systems with adaptive catoptric...

Apparatus and method for measurement of critical dimensions of feat...

Apparatus and method for ellipsometric measurements with high spati...

Sub-nanometer overlay, critical dimension, and lithography tool pro...

Method and apparatus for enhanced resolution of high spatial freque...

Apparatus and methods for overlay, alignment mark, and critical dim...

Multiple-source arrays fed by guided-wave structures and resonant g...

Catoptric and catadioptric imaging systems with pellicle and apertu...

Compensation for effects of mismatch in indices of refraction at a...

Apparatus and method for joint and time delayed measurements of com...

Catoptric imaging systems comprising pellicle and/or aperture-array...

Longitudinal differential interferometric confocal microscopy

Apparatus and method for joint measurement of fields of scattered/r...

Interferometric confocal microscopy incorporating a pinhole array b...

Apparatus and method for high speed scan for detection and measurem...

Apparatus and method for measurement of fields of backscattered and...

Method for constructing a catadioptric lens system

Transverse differential interferometric confocal microscopy

Method and apparatus for dark field interferometric confocal micros...

Leaky guided wave modes used in interferometric confocal microscopy...

Multiple-source arrays with optical transmission enhanced by resona...

Differential interferometric scanning near-field confocal microscopy

Optical storage system based on scanning interferometric near-field...

Catoptric and catadioptric imaging systems

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR JOINT MEASUREMENTS OF CONJUGATED QUADRATUR...

Apparatus and method for in situ and ex situ measurement of spatial...

Apparatus and method for reducing effects of coherent artifacts and...

Apparatus and Methods for Reduction and Compensation of Effects of...

Apparatus and Method for Measurement and Compensation of Atmospheri...

Continuously Tunable External Cavity Diode Laser Sources With High...

Apparatus and method for in situ and ex situ measurements of optica...

Apparatus and method of in situ and ex situ measurement of spatial...

CATOPTRIC AND CATADIOPTRIC IMAGING SYSTEMS WITH PELLICLE AND APERTU...

Catoptric and catadioptric imaging systems with pellicle and apertu...

Catoptric imaging systems comprising pellicle and/or aperture-array...

Sub-nanometer overlay, critical dimension, and lithography tool pro...

Apparatus and method for joint and time delayed measurements of com...

Apparatus and methods for overlay, alignment mark, and critical dim...

Apparatus and method for measurement of critical dimensions of feat...

Method and apparatus for enhanced resolution of high spatial freque...

Catoptric and catadioptric imaging systems with adaptive catoptric...

Leaky guided wave modes used in interferometric confocal microscopy...

Catoptric and catadioptric imaging system with pellicle and apertur...

Apparatus and method for ellipsometric measurements with high spati...

Apparatus and method for high speed scan for detection and measurem...

Apparatus and method for joint measurements of conjugated quadratur...

Interferometric confocal microscopy incorporating a pinhole array b...

Method for constructing a catadioptric lens system

Apparatus and method for measurement of fields of backscattered and...

Apparatus and method for joint measurement of fields of scattered/r...

Multiple-source arrays fed by guided-wave structures and resonant g...

Compensation for effects of mismatch in indices of refraction at a...

Method and apparatus for dark field interferometric confocal micros...

Transverse differential interferometric confocal microscopy

Trademarklast 30 trademarks

78394825 - ACAG

76428679 - ZETETIC INSTITUTE

75422553 - ZETETIC CATTLE CO.

75332263 - ZETETIC

75297095 - ZETETIC