Aaron Cook

Person

Deerfield, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for sensor having fault trip level setting
- Patent number 10,914,797
- Issue date Feb 9, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor and associated methods including differential...
- Patent number 10,866,289
- Issue date Dec 15, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Aaron Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Supply voltage disturbance immunity for digital circuits
- Patent number 10,635,539
- Issue date Apr 28, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Aaron Cook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient signal path diagnostics for safety devices
- Patent number 10,613,158
- Issue date Apr 7, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Aaron Cook
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with shared path amplifier and analog-to-digi...
- Patent number 10,466,298
- Issue date Nov 5, 2019
- ALLEGRO MICROSYSTEMS, LLC
- Virag V. Chaware
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap reference circuit with tunable current source
- Patent number 10,209,732
- Issue date Feb 19, 2019
- ALLEGRO MICROSYSTEMS, LLC
- Aaron Cook
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for sensor having fault trip level setting
- Patent number 10,101,410
- Issue date Oct 16, 2018
- ALLEGRO MICROSYSTEMS, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit for driving a hall effect element with a current...
- Patent number 9,638,764
- Issue date May 2, 2017
- Allegro Microsystems, LLC
- Juan Manuel Cesaretti
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for fault testing
- Patent number 9,513,337
- Issue date Dec 6, 2016
- Allegro Microsystems, LLC
- Glenn A. Forrest
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Power Transmission Gate Using Charge Pump
- Publication number 20240235547
- Publication date Jul 11, 2024
- MURATA MANUFACTURING CO., LTD.
- Aaron COOK
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Power Transmission Gate Using Charge Pump
- Publication number 20240137018
- Publication date Apr 25, 2024
- MURATA MANUFACTURING CO., LTD.
- Aaron COOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUPPLY GENERATOR / SUPPLY MODULATOR WITH SWITCHED-CAPACITOR DRIVE S...
- Publication number 20230057037
- Publication date Feb 23, 2023
- MURATA MANUFACTURING CO., LTD.
- John R. HOVERSTEN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
VARIABLE CONTROLLER AND ASSOCIATED CONTROL METHODS
- Publication number 20230056740
- Publication date Feb 23, 2023
- MURATA MANUFACTURING CO., LTD.
- David J. PERREAULT
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SUPPLY VOLTAGE DISTURBANCE IMMUNITY FOR DIGITAL CIRCUITS
- Publication number 20190339985
- Publication date Nov 7, 2019
- ALLEGRO MICROSYSTEMS, LLC
- Aaron Cook
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETIC FIELD SENSOR AND ASSOCIATED METHODS INCLUDING DIFFERENTIAL...
- Publication number 20190302196
- Publication date Oct 3, 2019
- Allegro Microsystems, LLC
- Aaron Cook
- G01 - MEASURING TESTING
Information Patent Application
Efficient Signal Path Diagnostics For Safety Devices
- Publication number 20190113584
- Publication date Apr 18, 2019
- Allegro Microsystems, LLC
- Aaron Cook
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR SENSOR HAVING FAULT TRIP LEVEL SETTING
- Publication number 20190018079
- Publication date Jan 17, 2019
- ALLEGRO MICROSYSTEMS, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Sensor With Shared Path Amplifier And Analog-To-Digi...
- Publication number 20180011140
- Publication date Jan 11, 2018
- Allegro Microsystems, LLC
- Virag V. Chaware
- G01 - MEASURING TESTING
Information Patent Application
BANDGAP REFERENCE CIRCUIT
- Publication number 20170269627
- Publication date Sep 21, 2017
- Allegro Microsystems, LLC
- Aaron Cook
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and Apparatus for Sensor Having Fault Trip Level Setting
- Publication number 20170115362
- Publication date Apr 27, 2017
- Allegro Microsystems, LLC
- Alexander Latham
- G01 - MEASURING TESTING
Information Patent Application
Electronic Circuit For Driving A Hall Effect Element With A Current...
- Publication number 20160299199
- Publication date Oct 13, 2016
- Allegro Microsystems, LLC
- Juan Manuel Cesaretti
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS FOR FAULT TESTING
- Publication number 20130116945
- Publication date May 9, 2013
- ALLEGRO MICROSYSTEMS, INC.
- Glenn A. Forrest
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Methods and apparatus for sensor having fault trip level setting

Magnetic field sensor and associated methods including differential...

Supply voltage disturbance immunity for digital circuits

Efficient signal path diagnostics for safety devices

Magnetic field sensor with shared path amplifier and analog-to-digi...

Bandgap reference circuit with tunable current source

Methods and apparatus for sensor having fault trip level setting

Electronic circuit for driving a hall effect element with a current...

Circuits and methods for fault testing

Patents Applicationslast 30 patents

Power Transmission Gate Using Charge Pump

Power Transmission Gate Using Charge Pump

SUPPLY GENERATOR / SUPPLY MODULATOR WITH SWITCHED-CAPACITOR DRIVE S...

VARIABLE CONTROLLER AND ASSOCIATED CONTROL METHODS

SUPPLY VOLTAGE DISTURBANCE IMMUNITY FOR DIGITAL CIRCUITS

MAGNETIC FIELD SENSOR AND ASSOCIATED METHODS INCLUDING DIFFERENTIAL...

Efficient Signal Path Diagnostics For Safety Devices

METHODS AND APPARATUS FOR SENSOR HAVING FAULT TRIP LEVEL SETTING

Magnetic Field Sensor With Shared Path Amplifier And Analog-To-Digi...

BANDGAP REFERENCE CIRCUIT

Methods and Apparatus for Sensor Having Fault Trip Level Setting

Electronic Circuit For Driving A Hall Effect Element With A Current...

CIRCUITS AND METHODS FOR FAULT TESTING