Abram M Detofsky

Person

Tigard, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Stackable photonics die with direct optical interconnect
- Patent number 12,135,460
- Issue date Nov 5, 2024
- Intel Corporation
- Todd R. Coons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active optical plug to optically or electrically test a photonics p...
- Patent number 12,061,230
- Issue date Aug 13, 2024
- Intel Corporation
- Todd R. Coons
- G01 - MEASURING TESTING
Information Patent Grant
Converged test platforms and processes for class and system testing...
- Patent number 10,677,845
- Issue date Jun 9, 2020
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Grant
Package testing system and method with contact alignment
- Patent number 10,324,112
- Issue date Jun 18, 2019
- Intel Corporation
- Mohanraj Prabhugoud
- G01 - MEASURING TESTING
Information Patent Grant
Increased processing efficiency for optical spectral analyzers
- Patent number 10,295,406
- Issue date May 21, 2019
- Intel Corporation
- Abram M Detofsky
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wireless device testing
- Patent number 10,247,773
- Issue date Apr 2, 2019
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test temperature control mechanism
- Patent number 9,869,714
- Issue date Jan 16, 2018
- Intel Corporation
- John C. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing architecture
- Patent number 9,506,980
- Issue date Nov 29, 2016
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test temperature control mechanism
- Patent number 9,400,291
- Issue date Jul 26, 2016
- Intel Corporation
- John C. Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Micro positioning test socket and methods for active precision alig...
- Patent number 9,255,945
- Issue date Feb 9, 2016
- Intel Corporation
- Abram M Detofsky
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mechanism for facilitating an optical instrumentation testing syste...
- Patent number 9,059,803
- Issue date Jun 16, 2015
- Intel Corporation
- Abram M. Detofsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for an optical interconnect system
- Patent number 8,926,196
- Issue date Jan 6, 2015
- Intel Corporation
- Abram M. Detofsky
- G02 - OPTICS
Information Patent Grant
Micro positioning test socket and methods for active precision alig...
- Patent number 8,710,858
- Issue date Apr 29, 2014
- Intel Corporation
- Abram M Detofsky
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Mapping variations in local temperature and local power supply volt...
- Patent number 7,233,163
- Issue date Jun 19, 2007
- Intel Corporation
- Arun Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mapping variations in local temperature and local power supply volt...
- Patent number 7,071,723
- Issue date Jul 4, 2006
- Intel Corporation
- Arun Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
STACKABLE PHOTONICS DIE WITH DIRECT OPTICAL INTERCONNECT
- Publication number 20250020874
- Publication date Jan 16, 2025
- Intel Corporation
- Todd R. COONS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE OPTICAL PLUG TO OPTICALLY OR ELECTRICALLY TEST A PHOTONICS P...
- Publication number 20220196732
- Publication date Jun 23, 2022
- Intel Corporation
- Todd R. COONS
- G02 - OPTICS
Information Patent Application
PIERCEABLE PROTECTIVE COVER FOR PHOTONIC CONNECTORS
- Publication number 20220196924
- Publication date Jun 23, 2022
- Intel Corporation
- Joe F. WALCZYK
- G02 - OPTICS
Information Patent Application
STACKABLE PHOTONICS DIE WITH DIRECT OPTICAL INTERCONNECT
- Publication number 20220196915
- Publication date Jun 23, 2022
- Intel Corporation
- Todd R. COONS
- G02 - OPTICS
Information Patent Application
STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...
- Publication number 20190293707
- Publication date Sep 26, 2019
- Intel Corporation
- Erkan ACAR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTRAL ANALYZER
- Publication number 20190003888
- Publication date Jan 3, 2019
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Application
CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...
- Publication number 20180252772
- Publication date Sep 6, 2018
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Application
STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...
- Publication number 20180188288
- Publication date Jul 5, 2018
- Intel Corporation
- Erkan Acar
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE TESTING SYSTEM AND METHOD WITH CONTACT ALIGNMENT
- Publication number 20180045759
- Publication date Feb 15, 2018
- Intel Corporation
- Mohanraj Prabhugoud
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR WIRELESS DEVICE TESTING
- Publication number 20180003764
- Publication date Jan 4, 2018
- Intel Corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST TEMPERATURE CONTROL MECHANISM
- Publication number 20160291083
- Publication date Oct 6, 2016
- Intel Corporation
- John C. Johnson
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TESTING ARCHITECTURE
- Publication number 20140266285
- Publication date Sep 18, 2014
- Abram M. DETOFSKY
- G01 - MEASURING TESTING
Information Patent Application
MICRO POSITIONING TEST SOCKET AND METHODS FOR ACTIVE PRECISION ALIG...
- Publication number 20140218061
- Publication date Aug 7, 2014
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR AN OPTICAL INTERCONNECT SYSTEM
- Publication number 20140093214
- Publication date Apr 3, 2014
- Abram M. DETOFSKY
- G02 - OPTICS
Information Patent Application
MECHANISM FOR FACIILTATING AN OPTICAL INSTRUMENTATION TESTING SYSTE...
- Publication number 20140092394
- Publication date Apr 3, 2014
- ABRAM M. DETOFSKY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Integrated Circuit Test Temperature Control Mechanism
- Publication number 20140062513
- Publication date Mar 6, 2014
- John C. Johnson
- G01 - MEASURING TESTING
Information Patent Application
MICRO POSITIONING TEST SOCKET AND METHODS FOR ACTIVE PRECISION ALIG...
- Publication number 20120074975
- Publication date Mar 29, 2012
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Application
Mapping variations in local temperature and local power supply volt...
- Publication number 20060186910
- Publication date Aug 24, 2006
- Arun Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mapping variations in local temperature and local power supply volt...
- Publication number 20050258838
- Publication date Nov 24, 2005
- Arun Krishnamoorthy
- G06 - COMPUTING CALCULATING COUNTING

Abram M Detofsky

Person

Patents Grantslast 30 patents

Stackable photonics die with direct optical interconnect

Active optical plug to optically or electrically test a photonics p...

Converged test platforms and processes for class and system testing...

Package testing system and method with contact alignment

Increased processing efficiency for optical spectral analyzers

Systems and methods for wireless device testing

Integrated circuit test temperature control mechanism

Integrated circuit testing architecture

Integrated circuit test temperature control mechanism

Micro positioning test socket and methods for active precision alig...

Mechanism for facilitating an optical instrumentation testing syste...

Method and apparatus for an optical interconnect system

Micro positioning test socket and methods for active precision alig...

Mapping variations in local temperature and local power supply volt...

Mapping variations in local temperature and local power supply volt...

Patents Applicationslast 30 patents

STACKABLE PHOTONICS DIE WITH DIRECT OPTICAL INTERCONNECT

ACTIVE OPTICAL PLUG TO OPTICALLY OR ELECTRICALLY TEST A PHOTONICS P...

PIERCEABLE PROTECTIVE COVER FOR PHOTONIC CONNECTORS

STACKABLE PHOTONICS DIE WITH DIRECT OPTICAL INTERCONNECT

STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...

OPTICAL SPECTRAL ANALYZER

CONVERGED TEST PLATFORMS AND PROCESSES FOR CLASS AND SYSTEM TESTING...

STACKED INSTRUMENT ARCHITECTURE FOR TESTING AND VALIDATION OF ELECT...

PACKAGE TESTING SYSTEM AND METHOD WITH CONTACT ALIGNMENT

SYSTEMS AND METHODS FOR WIRELESS DEVICE TESTING

INTEGRATED CIRCUIT TEST TEMPERATURE CONTROL MECHANISM

INTEGRATED CIRCUIT TESTING ARCHITECTURE

MICRO POSITIONING TEST SOCKET AND METHODS FOR ACTIVE PRECISION ALIG...

METHOD AND APPARATUS FOR AN OPTICAL INTERCONNECT SYSTEM

MECHANISM FOR FACIILTATING AN OPTICAL INSTRUMENTATION TESTING SYSTE...

Integrated Circuit Test Temperature Control Mechanism

MICRO POSITIONING TEST SOCKET AND METHODS FOR ACTIVE PRECISION ALIG...

Mapping variations in local temperature and local power supply volt...

Mapping variations in local temperature and local power supply volt...