Albany, NY, US
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X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Grant
X-Ray Optical Systems, Inc.
Zewu Chen
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
X-Ray Optical Systems, Inc.
John H. Burdett, Jr.
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Thermo Electron Corporation
James Domenick Piccinini
G01 - MEASURING TESTING
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Rupprecht & Patashnick Company, Inc.
William E. Rogers
G01 - MEASURING TESTING
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Patent Grant
Rupprecht & Patashnick Company, Inc.
William E. Rogers
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu CHEN
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
Zewu Chen
G01 - MEASURING TESTING
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Patent Application
X-Ray Optical Systems, Inc.
John H. BURDETT, JR.
B82 - NANO-TECHNOLOGY
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Patent Application
Thermo Electron Corporation
James Domenick Piccinini
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Rupprecht and Patashnick Company, Inc.
William E. Rogers
G01 - MEASURING TESTING
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Patent Application
Rupprecht and Patashnick Company, Inc.
William E. Rogers
G01 - MEASURING TESTING
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Patent Application
Rupprecht & Patashnick Company, Inc.
William E. Rogers
G01 - MEASURING TESTING
