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Adam J. Wright
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Saratoga, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuits with in-field diagnostic and repair capabilities
Patent number
11,281,195
Issue date
Mar 22, 2022
Intel Corporation
Kenneth T. Daxer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
8,786,301
Issue date
Jul 22, 2014
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for minimizing skew between signals
Patent number
8,779,754
Issue date
Jul 15, 2014
Altera Corporation
Yan Chong
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for serial scan test data delivery
Patent number
8,543,876
Issue date
Sep 24, 2013
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and method for bypassing a static configuration in a progr...
Patent number
7,940,082
Issue date
May 10, 2011
Altera Corporation
Adam J. Wright
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for minimizing skew between signals
Patent number
7,884,619
Issue date
Feb 8, 2011
Altera Corporation
Yan Chong
G01 - MEASURING TESTING
Information
Patent Grant
High speed programming of programmable logic devices
Patent number
7,795,909
Issue date
Sep 14, 2010
Altera Corporation
Kenneth T. Daxer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Apparatus for a low-cost semiconductor test interface system
Patent number
7,768,280
Issue date
Aug 3, 2010
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Functional failure analysis techniques for programmable integrated...
Patent number
7,685,485
Issue date
Mar 23, 2010
Altera Corporation
Binh Vo
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for quantifying and minimizing skew between si...
Patent number
7,671,579
Issue date
Mar 2, 2010
Altera Corporation
Yan Chong
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for debugging semiconductor devices
Patent number
7,546,507
Issue date
Jun 9, 2009
Altera Corporation
Adam J. Wright
G01 - MEASURING TESTING
Information
Patent Grant
Automatic test configuration generation facilitating repair of prog...
Patent number
7,409,669
Issue date
Aug 5, 2008
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Methods and structures for protecting programming data for a progra...
Patent number
7,265,573
Issue date
Sep 4, 2007
Altera Corporation
Adam Wright
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for loading configuration data into a configuration word reg...
Patent number
7,237,106
Issue date
Jun 26, 2007
Altera Corporation
Paul Tracy
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for testing interconnect bridging faults in an...
Patent number
7,103,813
Issue date
Sep 5, 2006
Altera Corporation
Paul Tracy
G01 - MEASURING TESTING
Information
Patent Grant
Techniques for automatically generating tests for programmable circ...
Patent number
7,024,327
Issue date
Apr 4, 2006
Altera Corporation
Jayabrata Ghosh Dastidar
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for laser marking of integrated circuit faults
Patent number
7,020,582
Issue date
Mar 28, 2006
Altera Corporation
John M. Dicosola
G01 - MEASURING TESTING
Information
Patent Grant
Method of creating a mask-programmed logic device from a pre-existi...
Patent number
6,938,236
Issue date
Aug 30, 2005
Altera Corporation
Jonathan Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tool to reconfigure pin connections between a DUT and a tester
Patent number
6,625,771
Issue date
Sep 23, 2003
Altera Corporation
Adam Wright
G01 - MEASURING TESTING
Information
Patent Grant
Tool to reconfigure pin connections between a DUT and a tester
Patent number
6,247,155
Issue date
Jun 12, 2001
Altera Corporation
Adam Wright
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for generating configuration and test files fo...
Patent number
6,112,020
Issue date
Aug 29, 2000
Altera Corporation
Adam Wright
G01 - MEASURING TESTING
Information
Patent Grant
Tool to reconfigure pin connections between a dut and a tester
Patent number
5,909,450
Issue date
Jun 1, 1999
Altera Corporation
Adam Wright
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUITS WITH IN-FIELD DIAGNOSTIC AND REPAIR CAPABILITES
Publication number
20190101906
Publication date
Apr 4, 2019
Intel Corporation
Kenneth T. Daxer
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND APPARATUS FOR MINIMIZING SKEW BETWEEN SIGNALS
Publication number
20110221497
Publication date
Sep 15, 2011
Yan Chong
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Functional failure analysis techniques for programmable integrated...
Publication number
20050022085
Publication date
Jan 27, 2005
Altera Corporation
Binh Vo
G01 - MEASURING TESTING
Information
Patent Application
Tool to reconfigure pin connections between a DUT and a tester
Publication number
20020019963
Publication date
Feb 14, 2002
Adam Wright
G01 - MEASURING TESTING