Adrianus Johannes Mierop

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Pixel for correlated double sampling with global shutter
- Patent number 8,605,181
- Issue date Dec 10, 2013
- Teledyne Dalsa B.V.
- Willem Hendrik Maes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device with a CMOS image sensor, apparatus comprising...
- Patent number 7,663,115
- Issue date Feb 16, 2010
- Dalsa Corporation
- Alouisius Wilhelmus Marinus Korthout
- G01 - MEASURING TESTING
Information Patent Grant
C-MOS sensor readout from multiple cells across the array to genera...
- Patent number 7,659,516
- Issue date Feb 9, 2010
- Dalsa Corporation
- Alouisius Wilhelmus Marinus Korthout
- G01 - MEASURING TESTING
Information Patent Grant
METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT, INTEGRATED CIRCUIT O...
- Patent number 6,930,499
- Issue date Aug 16, 2005
- Koninklijke Philip Electronics N.V.
- Anton Petrus Maria Van Arendonk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Pixel for correlated double sampling with global shutter
- Publication number 20120133811
- Publication date May 31, 2012
- Teledyne Dalsa, B.V.
- Willem Hendrik Maes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor device with a CMOS image sensor, apparatus comprising...
- Publication number 20090283683
- Publication date Nov 19, 2009
- DALSA CORPORATION
- Alouisius Wilhelmus Marinus Korthout
- G01 - MEASURING TESTING
Information Patent Application
Method for multiphase charge transfer in a lamel shutter and appara...
- Publication number 20080062293
- Publication date Mar 13, 2008
- DALSA CORPORATION
- Adrianus Johannes Mierop
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
C-MOS sensor readout from multiple cells across the array to genera...
- Publication number 20080001094
- Publication date Jan 3, 2008
- DALSA CORPORATION
- Alouisius Wilhelmus Marinus Korthout
- G01 - MEASURING TESTING
Information Patent Application
Image sensor, camera system comprising the image sensor and method...
- Publication number 20050230681
- Publication date Oct 20, 2005
- Koninklijke Philips Electronics N.V.
- Hein Otto Folkerts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing an integrated circuit, integrated circuit o...
- Publication number 20030075741
- Publication date Apr 24, 2003
- Anton Petrus Maria Van Arendonk
- G01 - MEASURING TESTING

Adrianus Johannes Mierop

Person

Patents Grantslast 30 patents

Pixel for correlated double sampling with global shutter

Semiconductor device with a CMOS image sensor, apparatus comprising...

C-MOS sensor readout from multiple cells across the array to genera...

METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT, INTEGRATED CIRCUIT O...

Patents Applicationslast 30 patents

Pixel for correlated double sampling with global shutter

Semiconductor device with a CMOS image sensor, apparatus comprising...

Method for multiphase charge transfer in a lamel shutter and appara...

C-MOS sensor readout from multiple cells across the array to genera...

Image sensor, camera system comprising the image sensor and method...

Method of manufacturing an integrated circuit, integrated circuit o...