Akihiko Ariga

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Connection device and test system
- Patent number 7,541,202
- Issue date Jun 2, 2009
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 7,285,430
- Issue date Oct 23, 2007
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 7,198,962
- Issue date Apr 3, 2007
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor apparatus
- Patent number 7,119,362
- Issue date Oct 10, 2006
- Renesas Technology Corp.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 6,759,258
- Issue date Jul 6, 2004
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,573,112
- Issue date Jun 3, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing substrate for inspecting semiconductor device
- Patent number 6,566,149
- Issue date May 20, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,566,150
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device utilizing semiconduct...
- Patent number 6,531,327
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing semiconductor device
- Patent number 6,511,857
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing equipment with probe formed on a cantilever o...
- Patent number 6,507,204
- Issue date Jan 14, 2003
- Hitachi, Ltd.
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 6,479,305
- Issue date Nov 12, 2002
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,455,335
- Issue date Sep 24, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Connector and probing system
- Patent number 6,305,230
- Issue date Oct 23, 2001
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,197,603
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20090209053
- Publication date Aug 20, 2009
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20080009082
- Publication date Jan 10, 2008
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Connection device and test system
- Publication number 20040235207
- Publication date Nov 25, 2004
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20030203521
- Publication date Oct 30, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing semiconductor apparatus
- Publication number 20030092206
- Publication date May 15, 2003
- Ryuji Kono
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device manufacturing method
- Publication number 20030027365
- Publication date Feb 6, 2003
- Hitachi, Ltd.
- Ryuji Kono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20020182796
- Publication date Dec 5, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Connection device and test system
- Publication number 20020129323
- Publication date Sep 12, 2002
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing semiconductor device utilizing semiconduct...
- Publication number 20020072136
- Publication date Jun 13, 2002
- Masatoshi Kanamaru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20020064893
- Publication date May 30, 2002
- RYUJI KONO
- H01 - BASIC ELECTRIC ELEMENTS

Akihiko Ariga

Person

Patents Grantslast 30 patents

Connection device and test system

Connection device and test system

Semiconductor device and manufacturing method thereof including a p...

Method of manufacturing semiconductor apparatus

Connection device and test system

Semiconductor device manufacturing method

Method for manufacturing substrate for inspecting semiconductor device

Semiconductor device and manufacturing method thereof including a p...

Method for manufacturing semiconductor device utilizing semiconduct...

Process for manufacturing semiconductor device

Semiconductor testing equipment with probe formed on a cantilever o...

Semiconductor device manufacturing method

Semiconductor device and manufacturing method thereof including a p...

Connector and probing system

Semiconductor device and manufacturing method thereof including a p...

Patents Applicationslast 30 patents

CONNECTION DEVICE AND TEST SYSTEM

CONNECTION DEVICE AND TEST SYSTEM

Connection device and test system

Semiconductor device and manufacturing method thereof including a p...

Method of manufacturing semiconductor apparatus

Semiconductor device manufacturing method

Semiconductor device and manufacturing method thereof including a p...

Connection device and test system

Method for manufacturing semiconductor device utilizing semiconduct...

SEMICONDUCTOR DEVICE MANUFACTURING METHOD