Akihiro HIMEDA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus, analysis method and analysis program
- Patent number 11,300,529
- Issue date Apr 12, 2022
- Rigaku Corporation
- Atsushi Ohbuchi
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase analysis device, quantitative phase analysis met...
- Patent number 10,962,489
- Issue date Mar 30, 2021
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Processing method, processing apparatus and processing program conf...
- Patent number 10,876,979
- Issue date Dec 29, 2020
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for displaying measurement results from x-ray diffraction me...
- Patent number 10,801,976
- Issue date Oct 13, 2020
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Operation guide system for X-ray analysis,operation guide method th...
- Patent number 10,393,679
- Issue date Aug 27, 2019
- Rigaku Corporation
- Akihiro Himeda
- G01 - MEASURING TESTING
Information Patent Grant
Crystalline phase identification method, crystalline phase identifi...
- Patent number 10,161,888
- Issue date Dec 25, 2018
- Rigaku Corporation
- Yukiko Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for X-ray diffraction measurement data
- Patent number 8,971,492
- Issue date Mar 3, 2015
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for film thickness measurement
- Patent number 7,130,373
- Issue date Oct 31, 2006
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...
- Publication number 20240133829
- Publication date Apr 25, 2024
- Rigaku Corporation
- Takumi OTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...
- Publication number 20230194443
- Publication date Jun 22, 2023
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...
- Publication number 20230184699
- Publication date Jun 15, 2023
- Rigaku Corporation
- Akihiro HIMEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...
- Publication number 20220390394
- Publication date Dec 8, 2022
- Rigaku Corporation
- Takahiro KUZUMAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DISPLAYING MEASUREMENT RESULTS FROM X-RAY DIFFRACTION ME...
- Publication number 20190064083
- Publication date Feb 28, 2019
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD AND ANALYSIS PROGRAM
- Publication number 20190041342
- Publication date Feb 7, 2019
- Rigaku Corporation
- Atsushi Ohbuchi
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTIT...
- Publication number 20180364183
- Publication date Dec 20, 2018
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAM
- Publication number 20170370860
- Publication date Dec 28, 2017
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
Crystalline Phase Identification Method, Crystalline Phase Identifi...
- Publication number 20170343492
- Publication date Nov 30, 2017
- Rigaku Corporation
- Yukiko Ikeda
- G01 - MEASURING TESTING
Information Patent Application
OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS,OPERATION GUIDE METHOD TH...
- Publication number 20170336333
- Publication date Nov 23, 2017
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFI...
- Publication number 20140278147
- Publication date Sep 18, 2014
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA
- Publication number 20130077754
- Publication date Mar 28, 2013
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for film thickness measurement
- Publication number 20050220267
- Publication date Oct 6, 2005
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING

Akihiro HIMEDA

Person

Patents Grantslast 30 patents

Quantitative analysis apparatus, method and program and manufacturi...

Analysis apparatus, analysis method and analysis program

Quantitative phase analysis device, quantitative phase analysis met...

Processing method, processing apparatus and processing program conf...

Method for displaying measurement results from x-ray diffraction me...

Operation guide system for X-ray analysis,operation guide method th...

Crystalline phase identification method, crystalline phase identifi...

Analysis method for X-ray diffraction measurement data

Method and apparatus for film thickness measurement

Patents Applicationslast 30 patents

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...

QUANTITATIVE ANALYSIS APPARATUS, METHOD AND PROGRAM AND MANUFACTURI...

METHOD FOR DISPLAYING MEASUREMENT RESULTS FROM X-RAY DIFFRACTION ME...

ANALYSIS APPARATUS, ANALYSIS METHOD AND ANALYSIS PROGRAM

CRYSTALLINE QUANTITATIVE PHASE ANALYSIS DEVICE, CRYSTALLINE QUANTIT...

PROCESSING METHOD, PROCESSING APPARATUS AND PROCESSING PROGRAM

Crystalline Phase Identification Method, Crystalline Phase Identifi...

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS,OPERATION GUIDE METHOD TH...

CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFI...

ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA

Method and apparatus for film thickness measurement