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Akihiro Nojima
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test method and dispensing device
Patent number
11,879,902
Issue date
Jan 23, 2024
HITACHI HIGH-TECH CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Grant
Test kit, test method, dispensing device
Patent number
11,788,971
Issue date
Oct 17, 2023
HITACHI HIGH-TECH CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Grant
System providing an ultrasonic pretreatment for separating particle...
Patent number
11,566,978
Issue date
Jan 31, 2023
Hitachi, Ltd.
Toshimitsu Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Analysis cell with wall surfaces having different acoustic impedanc...
Patent number
11,428,621
Issue date
Aug 30, 2022
Hitachi, Ltd.
Takuya Kambayashi
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic cleaner and automatic analyzer using the same
Patent number
11,389,838
Issue date
Jul 19, 2022
HITACHI HIGH-TECH CORPORATION
Yosuke Horie
B08 - CLEANING
Information
Patent Grant
Automatic analyzer and probe washing method
Patent number
11,366,132
Issue date
Jun 21, 2022
HITACHI HIGH-TECH CORPORATION
Takamichi Mori
B08 - CLEANING
Information
Patent Grant
Optical analysis device, optical analysis method, and optical analysis
Patent number
11,099,128
Issue date
Aug 24, 2021
Hitachi, Ltd.
Shunsuke Kono
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic cleaner and automatic analyzer using the same
Patent number
10,786,835
Issue date
Sep 29, 2020
HITACHI HIGH-TECH CORPORATION
Yosuke Horie
B08 - CLEANING
Information
Patent Grant
Optical analysis apparatus, optical analysis system, and optical an...
Patent number
10,663,399
Issue date
May 26, 2020
Hitachi, Ltd.
Takuya Kanbayashi
G01 - MEASURING TESTING
Information
Patent Grant
Optical analysis apparatus, optical analysis system, and optical an...
Patent number
10,627,348
Issue date
Apr 21, 2020
Hitachi, Ltd.
Takuya Kanbayashi
G01 - MEASURING TESTING
Information
Patent Grant
Optical analysis system and optical analysis method
Patent number
10,234,387
Issue date
Mar 19, 2019
Hitachi, Ltd.
Takuya Kanbayashi
G01 - MEASURING TESTING
Information
Patent Grant
Dispensing nozzle for automatic analyzer, and automatic analyzer in...
Patent number
8,802,008
Issue date
Aug 12, 2014
Hitachi High-Technologies Corporation
Shinichi Taniguchi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Autoanalyzer and pipetting nozzle for autoanalyzer
Patent number
8,444,936
Issue date
May 21, 2013
Hitachi High-Technologies Corporation
Shinichi Taniguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR WASHING DISPENSING PROBE INCLUDED IN AUTOMATED ANALYZER,...
Publication number
20240230700
Publication date
Jul 11, 2024
HITACHI HIGH-TECH CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS SYSTEM AND SPECTROSCOPIC ANALYSIS METHOD
Publication number
20240011833
Publication date
Jan 11, 2024
HITACHI HIGH-TECH SCIENCE CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC TRANSDUCER HOLDER, CONTAINER, AND ANALYSIS SYSTEM USING...
Publication number
20230324280
Publication date
Oct 12, 2023
Hitachi High-Tech Corporation
Toshimitsu NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analysis Device
Publication number
20230009785
Publication date
Jan 12, 2023
Hitachi High-Tech Corporation
Yosuke HORIE
G01 - MEASURING TESTING
Information
Patent Application
Optical Measurement Instrument, Server Device, and Optical Measurem...
Publication number
20220317023
Publication date
Oct 6, 2022
Hitachi, Ltd
Takuya KAMBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Optical Analysis Method and Optical Analysis System
Publication number
20220178817
Publication date
Jun 9, 2022
Hitachi, Ltd
Toshimitsu NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
TEST METHOD AND DISPENSING DEVICE
Publication number
20210318344
Publication date
Oct 14, 2021
Hitachi High-Tech Corporation
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
Test Kit, Test Method, Dispensing Device
Publication number
20210140894
Publication date
May 13, 2021
Hitachi High-Technologies Corporation
Akihiro NOJIMA
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
Publication number
20210053094
Publication date
Feb 25, 2021
HITACHI HIGH-TECH CORPORATION
Yosuke HORIE
B08 - CLEANING
Information
Patent Application
AUTOMATIC ANALYZER AND PROBE WASHING METHOD
Publication number
20200348325
Publication date
Nov 5, 2020
Hitachi High-Technologies Corporation
Takamichi MORI
B08 - CLEANING
Information
Patent Application
PSEUDO SAMPLE CREATION METHOD AND APPARATUS, AND NUMERICAL MODEL CR...
Publication number
20200291341
Publication date
Sep 17, 2020
Hitachi, Ltd
Shunsuke KONO
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Analysis Sample Pretreatment Apparatus, Analysis Sample Pretreatmen...
Publication number
20200182751
Publication date
Jun 11, 2020
Hitachi, Ltd
Toshimitsu NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND OPTICAL ANALYSIS
Publication number
20200124526
Publication date
Apr 23, 2020
Hitachi, Ltd
Shunsuke KONO
G01 - MEASURING TESTING
Information
Patent Application
Analysis Cell and Analysis Unit
Publication number
20190368999
Publication date
Dec 5, 2019
Hitachi, Ltd
Takuya KAMBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANALYSIS APPARATUS, OPTICAL ANALYSIS SYSTEM, AND OPTICAL AN...
Publication number
20180224374
Publication date
Aug 9, 2018
Hitachi, Ltd.
Takuya KANBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Optical Analysis System and Optical Analysis Method
Publication number
20180172584
Publication date
Jun 21, 2018
Hitachi, Ltd
Takuya KANBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
Publication number
20180161829
Publication date
Jun 14, 2018
Hitachi High-Technologies Corporation
Yosuke HORIE
B08 - CLEANING
Information
Patent Application
Dispensing Nozzle for Autoanalyzer, Autoanalyzer Equipped with the...
Publication number
20130171025
Publication date
Jul 4, 2013
Hitachi High-Technologies Corporation
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Application
DISPENSING NOZZLE FOR AUTOMATIC ANALYZER, AND AUTOMATIC ANALYZER IN...
Publication number
20120251393
Publication date
Oct 4, 2012
Shinichi Taniguchi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
PIPETTING NOZZLE FOR AUTOANALYZER, METHOD FOR PRODUCING SAME AND AU...
Publication number
20120020836
Publication date
Jan 26, 2012
Akihiro Nojima
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AUTOANALYZER AND PIPETTING NOZZLE FOR AUTOANALYZER
Publication number
20110300035
Publication date
Dec 8, 2011
Shinichi Taniguchi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL