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Akiko Kagatsume
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Tsuchiura, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement system and method for setting observation conditions of...
Patent number
11,380,518
Issue date
Jul 5, 2022
Hitachi, Ltd.
Takafumi Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device, manufacturing method thereof, and display app...
Patent number
8,344,382
Issue date
Jan 1, 2013
Hitachi, Ltd.
Junichi Hanna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for producing semiconductor and apparatus for production
Patent number
6,656,838
Issue date
Dec 2, 2003
Hitachi, Ltd.
Tomoji Watanabe
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Process for producing semiconductor and apparatus for production
Patent number
6,403,479
Issue date
Jun 11, 2002
Hitachi, Ltd.
Tomoji Watanabe
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
Measurement System and Method for Setting Observation Conditions of...
Publication number
20210407763
Publication date
Dec 30, 2021
Hitachi, Ltd
Takafumi MIWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYZING SYSTEM
Publication number
20200225175
Publication date
Jul 16, 2020
Hitachi, Ltd
Akiko KAGATSUME
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND DISPLAY APP...
Publication number
20110108841
Publication date
May 12, 2011
Junichi Hanna
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for producing semiconductor and apparatus for production
Publication number
20020137334
Publication date
Sep 26, 2002
Tomoji Watanabe
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...