Akira Eguchi

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Utsunomiya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Aberration estimating method, aberration estimating apparatus, and...
- Patent number 12,031,879
- Issue date Jul 9, 2024
- Canon Kabushiki Kaisha
- Akira Eguchi
- G01 - MEASURING TESTING
Information Patent Grant
Aberration estimating method, aberration estimating apparatus, and...
- Patent number 11,408,800
- Issue date Aug 9, 2022
- Canon Kabushiki Kaisha
- Akira Eguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ABERRATION ESTIMATING METHOD, ABERRATION ESTIMATING APPARATUS, AND...
- Publication number 20220349777
- Publication date Nov 3, 2022
- Canon Kabushiki Kaisha
- Akira Eguchi
- G01 - MEASURING TESTING
Information Patent Application
ABERRATION ESTIMATING METHOD, ABERRATION ESTIMATING APPARATUS, AND...
- Publication number 20200116589
- Publication date Apr 16, 2020
- Canon Kabushiki Kaisha
- Akira Eguchi
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING METHOD, IMAGE PROCESSING APPARATUS, IMAGING APPARA...
- Publication number 20200104981
- Publication date Apr 2, 2020
- Canon Kabushiki Kaisha
- Akira Eguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL IMAGE CAPTURING APPARATUS AND IMAGE CAPTURING MET...
- Publication number 20170199495
- Publication date Jul 13, 2017
- Canon Kabushiki Kaisha
- Isao Matsubara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFOCUS AMOUNT ESTIMATION METHOD, IMAGING APPARATUS, AND TRANSPAREN...
- Publication number 20130329034
- Publication date Dec 12, 2013
- Akira Eguchi
- G02 - OPTICS