Akira Kakizawa

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Alternating current coupled electronic component test system and me...
- Patent number 9,658,288
- Issue date May 23, 2017
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Alternating current coupled electronic component test system and me...
- Patent number 9,389,274
- Issue date Jul 12, 2016
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Method and an apparatus for testing transmitter and receiver
- Patent number 7,154,288
- Issue date Dec 26, 2006
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for delay lock loops
- Patent number 7,061,224
- Issue date Jun 13, 2006
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and an apparatus for testing transmitter and receiver
- Patent number 7,002,365
- Issue date Feb 21, 2006
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing an I/O buffer
- Patent number 6,889,350
- Issue date May 3, 2005
- Intel Corporation
- Eric T. Fought
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for failure detection utilizing functional tes...
- Patent number 6,725,406
- Issue date Apr 20, 2004
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Grant
Viewing stereoscopic image pairs
- Patent number 6,580,556
- Issue date Jun 17, 2003
- Intel Corporation
- Akira Kakizawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Testing of digital-to-analog converters
- Patent number 6,566,857
- Issue date May 20, 2003
- Intel Corporation
- Akira Kakizawa
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Reduced leakage trench isolation
- Patent number 6,410,359
- Issue date Jun 25, 2002
- Intel Corporation
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced leakage trench isolation
- Patent number 6,403,394
- Issue date Jun 11, 2002
- Intel Corporation
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced leakage trench isolation
- Patent number 6,259,145
- Issue date Jul 10, 2001
- Intel Corporation
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced leakage trench isolation
- Patent number 6,215,165
- Issue date Apr 10, 2001
- Intel Corporation
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...
- Publication number 20160320447
- Publication date Nov 3, 2016
- Intel Corporation
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...
- Publication number 20150084642
- Publication date Mar 26, 2015
- Bharani Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
Internal analog loopback for a high-speed interface test
- Publication number 20070104111
- Publication date May 10, 2007
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Application
Method and an apparatus for testing transmitter and receiver
- Publication number 20060103407
- Publication date May 18, 2006
- Intel Corporation
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Application
Test circuit for delay lock loops
- Publication number 20060066291
- Publication date Mar 30, 2006
- Intel Corporation
- Akira Kakizawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and an apparatus for testing transmitter and receiver
- Publication number 20050146346
- Publication date Jul 7, 2005
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing an I/O buffer
- Publication number 20030005374
- Publication date Jan 2, 2003
- Eric T. Fought
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for failure detection utilizing functional tes...
- Publication number 20020112208
- Publication date Aug 15, 2002
- Akira Kakizawa
- G01 - MEASURING TESTING
Information Patent Application
VIEWING STEREOSCOPIC IMAGE PAIRS
- Publication number 20020063957
- Publication date May 30, 2002
- Akira Kakizawa
- G02 - OPTICS
Information Patent Application
Reduced leakage trench isolation
- Publication number 20010019850
- Publication date Sep 6, 2001
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduced leakage trench isolation
- Publication number 20010019851
- Publication date Sep 6, 2001
- Kevin M. Connolly
- H01 - BASIC ELECTRIC ELEMENTS

Akira Kakizawa

Person

Patents Grantslast 30 patents

Alternating current coupled electronic component test system and me...

Alternating current coupled electronic component test system and me...

Method and an apparatus for testing transmitter and receiver

Test circuit for delay lock loops

Method and an apparatus for testing transmitter and receiver

Method and apparatus for testing an I/O buffer

Method and apparatus for failure detection utilizing functional tes...

Viewing stereoscopic image pairs

Testing of digital-to-analog converters

Reduced leakage trench isolation

Reduced leakage trench isolation

Reduced leakage trench isolation

Reduced leakage trench isolation

Patents Applicationslast 30 patents

ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...

ALTERNATING CURRENT COUPLED ELECTRONIC COMPONENT TEST SYSTEM AND ME...

Internal analog loopback for a high-speed interface test

Method and an apparatus for testing transmitter and receiver

Test circuit for delay lock loops

Method and an apparatus for testing transmitter and receiver

Method and apparatus for testing an I/O buffer

Method and apparatus for failure detection utilizing functional tes...

VIEWING STEREOSCOPIC IMAGE PAIRS

Reduced leakage trench isolation

Reduced leakage trench isolation